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New Updates
Optical
Property Based
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 | Ceramics |
| Polymers |
| Hamaker Constants & London Dispersion Forces |
| Optical Materials |
| Non Linear Optics |
| Materials For Semiconductor Lithography |
| Photonics & Light Scattering by Microstructures |
| Vacuum Ultraviolet (VUV) Spectroscopy |
| Valence Electron Energy Loss Spectroscopy |
| Electronic Structure Tools Software |
| VUV & DUV Spectroscopic Ellipsometry |
| Computational Optics |
| Interfacial and Surficial Films |
| Silicon Nitride, Silicon Carbide, Silicon and Strontium Titanate |
| London Dispersion Forces |
| VUV Spectroscopy and Transmission and Reflection EELS |
Materials screening allows us to rapidly survey the optical properties and electronic structure, along with the additional physical properties which are required for a particular application. Once a broad database of materials and properties has been established in the materials screening phase then we embark on the materials development phase in which the material is optimized to meet the multiple, and sometimes contradictory, property requirements.
Optical property based electronic structure studies emphasize the interatomic bonding and interband transitions of materials, elucidating their physical properties and opening the opportunity for materials optimization.
These studies form the basis for our materials and microstructure design work, developing novel ceramic and polymeric materials for optical applications which span from semiconductor photolithography to pigmented paints and coatings.
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Ceramics |
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Polymers |
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Hamaker Constants & London Dispersion Forces |
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Optical Materials |
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Non Linear Optics |
Optical properties, such as the interband transition strength (Jcv), or the dielectric
constant (epsilon), serve as the quantitative electronic
structure basis for comparisons of experimental vacuum ultraviolet (VUV) reflectance results, spatially resolved (< 1 nm) valence electron energy loss
(SR-VEEL) results and theoretical LDA band structure results. This is accomplished
using Kramers Kronig dispersion analysis. Once the optical properties and
electronic structure tools have been developed we are ready for the next step.
| Vacuum Ultraviolet (VUV) Spectroscopy
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| Valence Electron Energy Loss Spectroscopy
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Electronic Structure Tools Software | ||||||||
| VUV & DUV Spectroscopic Ellipsometry
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| Computational Optics
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| Adobe Acrobat Reader Used For PDF Files Get It Here  |
| Macromedia Schockwave Used For Movies Get it Here  |
There have been
visitors to the
Optical Properties and Electronic Structure Site.
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Comment: (c) 2003 Roger H. French ,
frenchrh@lrsm.upenn.edu |
