Electron Microscopy Facility
  Penn Regional Nanotechnology Facility (SEAS)

 
This center is a full-service electron microscopy facility equipped with a wide range of state-of-the-art instrumentation for materials analysis. Structural, chemical and microstructural characterization of polymers, ceramics, composites, metals and alloys, electronic materials and devices, thin films and superlattices, and coatings are conducted using scanning electron microscopes (SEM), transmission electron microscopes (TEM), and scanning transmission electron microscopes (STEM). A wide range of specimen preparation equipment is used including cryo-ultramicrotomy, jet electrolytic polishing, mechanical dimpling, ion beam thinning, tripod polishing, vacuum evaporation, sputter-coating and replication. Both analog and digital output are produced and in-house hardware and software are available for a wide range of image and spectrum processing tasks and for the calculation/simulation of electron-beam specimen interactions and microscope performance. All instrumentation in this facility can be used by any operator approved by the facility supervisor after appropriate training.

• Field-Emission Scanning Electron Microscope JEOL 6300-FV HRSEM
• Analytical Scanning Electron Microscope JEOL 6400 SEM
• High Resolution Transmission Electron Microscope JEOL 4000EX
• Transmission Electron Microscope Phillips 420T TEM/STEM
• JEOL 2010 F 200 kV Field-emission Gun TEM/STEM/EFTEM

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