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Eighth Annual Workshop on
Advanced Techniques for
Materials Characterization

Friday & Saturday   April 13 & 14, 2001

This two-day workshop has been designed to introduce the research scientist and engineer both in industry and academia to a broad range of sophisticated characterization techniques that have become available in recent years. Emphasis will be placed on characterization of surfaces, interfaces and thin films of metals, semiconductors, polymers, macromolecules and ceramics.

Techniques to be covered include:

  • High and Medium Energy Ion Scattering (HEIS & MEIS)
  • Scanning Tunneling Microscopy (STM)/Atomic Force Microscopy (AFM)
  • Electron Spectrometry (ES)
  • Modern Electron Microscopy
  • Scanning Auger Spectroscopy/Secondary Ion Mass Spectrometry (SIMS)
  • X-Ray Difraction (WAXS / SAXS)
  • Laser-based techniques

Faculty:

Prof. Russell Composto,
Materials Science and Engineering		 Prof. N. John Dinardo,
Physics, Drexel University
Prof. David Luzzi,
Materials Science and Engineering		 Prof. John Vohs,
Chemical Engineering
Prof. Karen Winey,
MSE		 Prof. Arjun Yodh,
Physics

Registration Fee $200 (regular) $50 (student)
* includes course materials, continental breakfasts, lunches and refreshments on both days.

    Workshop Schedule
    Location:
      Reading Room, LRSM Building, 3231 Walnut St. Phila. PA 19104
     
    Friday, April 13, 2001
    8.15-8.50 amRegistration, Continental Breakfast
    8:50-9:00Welcome and Introductory Remarks
    Prof. Michael Klein, Director, LRSM
    9:00-10:45Ion Scattering
    Prof. Russell Composto, MSE
    10:45-11:00Break
    11:00-12:15Laser-based Techniques
    Prof. Arjun Yodh, Physics
    12:15-1:00 pmLunch- LRSM Reading Room (Discussions with Faculty)
    1:00-3:00Electron Microscopy and Microanalysis
    Prof. David Luzzi, M.S.E.
    3:00-4:00Break, Demonstrations of Electron Microscopy (EM) and Ion Scattering (IS)
    4:00-5:15Electron Spectrometry
    Prof. John Vohs, Chemical Engineering
    Saturday, April 14, 2001
    8:30-9:00 amContinental Breakfast (LRSM Reading Room)
    9:00-10:45Scanning Probe Microscopies
    Prof. John DiNardo, Physics, Drexel U.
    10:45-11:00Break
    11:00-12:15X-Ray Diffraction (WAXS & SAXS)
    Prof. Karen Winey, M.S.E.
    12:15-1:00 pmLunch - LRSM Reading Room (Discussions with Faculty)
    1:00-2:00Demonstrations: STM, AFM, XRD and Lasers


If you would like to attend the Advanced Techniques for Materials Characterization Workshop on April 13 & 14, 2001, please complete the on-line REGISTRATION FORM before March 30, 2001.

Please make checks payable to The Trustees of the University of Pennsylvania,
and remit to the address below before April 6, 2001.

send to:

Kathy Kramer
LRSM, Univ. of PA
3231 Walnut Street
Philadelphia, PA 19104-6202

Further details will be mailed prior to the workshop.

For general information contact:

For technical information contact:

 
 
last modified:
February, 2001
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For more information about the LRSM, please contact: kramer@lrsm.upenn.edu