Roger H. French

 

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New Out Of Print Optics Books and Papers Republished Here

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Frederick Wooten, Optical Properties of Solids
Academic Press, New York, 49, (1972).  
Download a PDF By Clicking Here

Optical Property Based 
            Electronic Structure Studies

bullet Ceramics
bullet Polymers
bullet Hamaker Constants & London Dispersion Forces
bullet Optical Materials
bullet Non Linear Optics

Materials and Microstructure Design

bullet Materials For Semiconductor Lithography
bullet Photonics & Light Scattering by Microstructures

Electronic Structure Tools

bullet Vacuum Ultraviolet (VUV) Spectroscopy
bullet Valence Electron Energy Loss Spectroscopy
bullet Electronic Structure Tools Software
bullet VUV & DUV Spectroscopic Ellipsometry
bullet Computational Optics

Nanostructured Amorphous Films

bullet Interfacial and Surficial Films
bullet Silicon Nitride, Silicon Carbide, Silicon and Strontium Titanate
bullet London Dispersion Forces
bullet VUV Spectroscopy and Transmission and Reflection EELS

Materials and Microstructure Design

       

Materials screening allows us to rapidly survey the optical properties and electronic structure, along with the additional physical properties which are required for a particular application.  Once a broad database of materials and properties has been established in the materials screening phase then we embark on the materials development phase in which the material is optimized to meet the multiple, and sometimes contradictory, property requirements.  

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Materials For Semiconductor Lithography

bullet Attenuating Phase Shift Photomasks
bullet Pellicles
bullet Photoresists
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Photonics & Light Scattering by Microstructures

bullet Rutile Titania Pigments
bullet Particle Crowding
bullet Particle Agglomeration
bullet Photonic Crystals

  

Optical Property Based 
            Electronic Structure Studies

Optical property based electronic structure studies emphasize the interatomic bonding and interband transitions of materials, elucidating their physical properties and opening the opportunity for materials optimization.

These studies form the basis for our materials and microstructure design work, developing novel ceramic and polymeric materials for optical applications which span from semiconductor photolithography to pigmented paints and coatings.  

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Ceramics

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Polymers

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Hamaker Constants & London Dispersion Forces

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Optical Materials

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Non Linear Optics

       

Electronic Structure Tools

Optical properties, such as the interband transition strength (Jcv), or the dielectric constant (epsilon), serve as the quantitative electronic
structure basis for comparisons of experimental vacuum ultraviolet (VUV) reflectance results, spatially resolved (< 1 nm) valence electron energy loss
(SR-VEEL) results and theoretical LDA band structure results. This is accomplished using Kramers Kronig dispersion analysis.  Once the optical properties and electronic structure tools have been developed we are ready for the next step.

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Vacuum Ultraviolet (VUV) Spectroscopy

bullet Using a Laser Plasma Light Source
bullet 1.5 to 44 eV, 800 nm to 28 nm
bullet Bulk Electronic Structure Determination
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Valence Electron Energy Loss Spectroscopy

bullet Using Scanning Transmission Electron Microscope
bullet 1 nm Spatial Resolution
bullet 2 to 1000 eV
bullet For Interfacial Electronic Structure Determination
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Electronic Structure Tools Software

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VUV & DUV Spectroscopic Ellipsometry

bullet Using Deuterium and Hg/Xe Light Sources
bullet Magnesium Fluoride Optics and Polarizers
bullet Optical Properties of Bulk and Thin Film Materials
bullet Thin Film Microstructure Determination
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Computational Optics

bullet Full Field Solutions To Maxwell's Equations
bullet Three Dimensional Finite Element Models
bullet Time Domain Solutions
bullet Optics of Complex Microstructures 

bullet Adobe Acrobat Reader Used For PDF Files
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bullet Macromedia Schockwave Used For Movies
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Optical Properties and Electronic Structure Site. 

Contact Information

Roger H. French
Adjunct Professor of Materials Science
University of Pennsylvania
3231 Walnut St.
Philadelphia PA 19104
 
 

Comment: (c) 2009 Roger H. French , frenchrh@lrsm.upenn.edu
All Rights Reserved, See Appropriate Use Page