Electronic Structure of Polymers

Figure.  Interband transitions of polysilanes.  

Figure 15. Interband transition strengths, J_cv, of polyester (PEST), polycarbonate (PCRB), polystyrene (PSTY), poly(methyl methacrylate) (PMMA), and poly(ethylene-co-methacrylic acid) (PEMA) determined from VUV reflectivity.

See The Polysilane Page

Publications

	M. K. Crawford, A. E. Feiring, J. Feldman, R. H. French, M. Periyasamy, F. L. Schadt III, R. J. Smalley, F. C. Zumsteg, R. R. Kunz, V. Rao, L. Liao, S. M. Holl, "New Materials for 157 nm Photoresists: Characterization and Properties", Advances in Resist Technology and Processing XVII, SPIE Vol. 3999, Edited by F. M. Houlihan, (2000).
	R. H. French, R. C. Wheland, D. J. Jones, J. N. Hilfiker, R. A. Synowicki, F. C. Zumsteg, J. Feldman, A. E. Feiring, "Fluoropolymers for 157nm Lithography: Optical Properties from VUV Absorbance and Ellipsometry Measurements", SPIE Proceedings: Microlithography 2000, to be published. Download a PDF of This Paper
	W. Y. Ching, Y.-N. Xu, R. H. French, "First-Principles Investigation of the Optical Properties of Poly(di-n-hexylsilane)", Physical Review B, 54, 19, 13546-50, (1996)..

R. H. French, J. S. Meth, J. R. G. Thorne, R. M. Hochstrasser, R. D. Miller, "Vacuum Ultraviolet Spectroscopy of the Optical Properties and Electronic Structure of Seven Poly(di-alkylsilanes)" Synthetic Metals, 50, 1-3, 499-508, (1992).

F. M. Schellenberg, R. L. Byer, R. H. French, R. D. Miller, "Vacuum-ultraviolet Spectroscopy of Dialkyl Polysilanes", Phys. Rev. B Rapid Communications, 43, 12, 10008-11, (1991).

J. R. G. Thorne, R. M. Hochstrasser, J. M. Zeigler, A. Tilgner, H. P. Trommsdorff, R. H. French, P. J. Fagan, R. D. Miller, "Optical Studies of Polysilanes", Frontiers of Polymer Research, Ed. by P. N. Prasad, J. K. Nigam, Plenum Press, 143-8, (1991).