Publications
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Roger Harquail French

    As of 12/15/2009

Table of Contents
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Awards
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Patents
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Refereed Publications
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Other Publications
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Invited Presentations and Seminars
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Conference Presentations
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Student Supervision
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Professional Activities

Award and Honors

  1. R&D 100 Award, 1989, received for Dispersive Vacuum Ultraviolet Spectrophotometer using a Samarium Laser Plasma Light Source for energy, temperature and time resolved studies of the electronic structure of ceramic and optical materials.

  2. Associate Editor, Journal of the American Ceramic Society, since 1989. 

  3. 1995/96 Nominated as Associate of the DuPont Fellows Forum. 

  4. 1998/99 International Fulrath Awardee of the American and Japanese Ceramic's Societies, to recognize outstanding academic and industrial ceramic engineers/scientists, for research on Dispersion Forces and Electronic Structure of Materials.

  5. 1999 Fellow of the American Ceramic Society.  

  6. 2002 Nominated to Attend National Academy of Engineering’s Frontiers of Engineering Symposium. 

  7. 2002 Samuel Giejsbeek Award of the American Ceramics Society, Pacific Coast Region, for a development of attenuated phase shift photomasks, recognized to have major significance to the ceramic industry based upon established and current usefulness importance uniqueness and economic significance. 

  8. 2004-2010, U. S. Department of Energy, Council on Materials Science And Engineering. 

  9. 2009 Best Concentrating Photovoltaics Poster Award, 34th IEEE Photovoltaic Specialists Conference (PVSC), Philadelphia, PA June 7–12. 

  10. 2009 Nominated For U. S. Department of Energy, Basic Energy Sciences, Basic Energy Sciences Advisory Committee. 

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Patents

  1.  L. Drozdyk, R. H. French, K. W. Hang, A. Halliyal, "Light Absorbing Dielectric Compositions", U. S. Patent 5,393,465, Issued Feb. 28, 1995. 
  2. U. Alpay, R. H. French, F. Kalk,  “Photomask Blanks”,  U. S. Patent 5,459,002, Issued October 17, 1995. 8 claims.
  3. U. Alpay, R. H. French, F. Kalk, “Photomask Blanks Comprising Transmissive Embedded Phase Shifter”,  U. S Patent 5,415,953, Issued May 16, 1995. 15 claims.
  4. P. Carcia, R. H. French, “Attenuating Embedded Phase Shift Photomask Blanks”, U. S. Patent 5,897,976, Issued April 27, 1999. 16 claims.
  5. P. Carcia, R. H. French, “Attenuating Embedded Phase Shift Photomask Blanks”, U. S. Patent 5,897,977, Issued April 27, 1999. 18 claims.
  6. R. H. French, K. G. Sharp, “Attenuating Phase Shift Photomasks”, U. S. Patent 6,096,460, Issued August 1, 2000. 5 claims.  
  7. R. H. French, K. G. Sharp, “Attenuating Phase Shift Photomasks”, U. S. Patent 6,174,631, Issued Jan 16, 2001, 8 claims. 
  8. R. H. French, R. C. Wheland, F. C. Zumsteg, “Ultraviolet and Vacuum Ultraviolet Transparent Polymer Compositions and Their Uses”, U. S. Patent 6,770,404, Issued August 3, 2004, 28 claims. 
  9. R. H. French, R. C. Wheland, F. C. Zumsteg, “Ultraviolet and Vacuum Ultraviolet Transparent Polymer Compositions and Their Uses”, U. S. Patent 6,824,930, Issued November 30, 2004, 44 Claims. 
  10. R. H. French, F. L. Schadt, R. C. Wheland, F. C. Zumsteg, “Copolymers for Photoresists and Processes Therefor”, U. S. Patent 6,872,503, Issued March 29, 2005, 14 claims. 
  11. R. H. French, T. D. Gierke, M. A. Harmer, A. Jagota, S. R. Lustig, R. H. Mehta, P. B. Hietpas, B. Onoa, “Method for Providing Nano-structures of Uniform Length”, U. S. Patent 6,946,410, Issued September 20, 2005, 41 claims.  
  12. R. H. French, T. D. Gierke, M. A. Harmer, A. Jagota, S. R. Lustig, R. H. Mehta, P. B. Hietpas, B. Onoa, “Method For Providing Nano-structures of Uniform Length”, U. S. Patent 6,998,358, Issued February 14, 2006, 9 claims.  
  13. R. H. French, S. Peng, W. Qiu, “Polycyclic Fluoroalkanes”, U. S. Patent 7,084,314, Issued August 1, 2006, 14 claims. 
  14. R. H. French, R. C. Wheland, “Polymer-liquid Compositions Useful in Ultraviolet and Vacuum Ultraviolet Uses”, Filed 4/02, U. S. Patent 7,129,009, Issued October 31, 2006, 32 Claims. 
  15. R. H. French, D. J. Jones, R. C. Wheland, “Radiation durable organic compounds with high transparency in the vacuum ultraviolet, and method for preparing”, U. S. Patent 7,300,743, Issued November 27, 2007, 36 Claims. 
  16. R. H. French, R. C. Wheland, “Use of Perfluoro-n-alkanes in Vacuum Ultraviolet Applications”, U. S. Patent 7,402,377, Issued July 22, 2008, 12 Claims. 
  17. R. H. French, S. Peng, W. Qiu, " Processes and Devices Using Polycyclic Fluoroalkanes in Vacuum and Deep Ultraviolet Applications" , U. S. Patent 7,435,528, Issued October 14, 2008, 5 Claims. 
  18. R. H. French, R. C. Wheland, W. Qiu, “Use of Partially Fluorinated Polymers in Applications Requiring Transparency in the Ultraviolet and Vacuum Ultraviolet”, U. S. Patent 7,438,995, Issued October 21, 2008 
  19. R. H. French, R. C. Wheland, “Highly Purified Liquid Perfluoroalkanes and Method for Preparing”, Filed 3/04, CL2586, U. S. Patent 7,465, 667 B2, Issued Dec. 16, 2008. 
  20. R. C. Wheland, C. R. Fincher, R. H. French, S. Peng, W. Qiu, “Packages for Alkanes Having Ultra-High Transparency at 193 nm”, U. S. Patent 7,493,743, Issued Feb. 24, 2009. 
  21. R. H. French, S. Peng, R. C. Wheland, “Use of Highly Purified Hydrocarbons in Vacuum Ultraviolet Applications”, U. S. Patent 7,589,242, Issued Sept. 15, 2009. 
  22. R. H. French, R. Getty, S. Percec, “Aromatic and Aromatic/Heteroaromatic Molecular Structures with Controllable Electron Conducting Properties”, Filed 11/02, published July 15th 2004, US20040138467, granted 11/09. 

Refereed Publications
  1. R. H. French, R. Raj, "Use of the Double Torsion Method to Study Crack Propagation in an Adhesive Layer", Journal of Testing and Evaluation, 7, 3, 160-7 (1979).
  2. F. A. Modine, C. Y. Allison, R. H. French, "Optical and Electrical Properties of Niobium Carbide", Phys. Rev. B, 35, 6, 2573-82 (1987). 
  3. F. S. Ohuchi, R. H. French, R. V. Kasowski, "A Study of Room Temperature Cu-Al2O3 and Cu-AlN Interfacial Interactions", J. Vac. Sci. Technol. A, 5, 4, 1175-7 (1987). 
  4. F. S. Ohuchi, R. H. French, R. V. Kasowski, "Cu Deposition on Alumina and Aluminum Nitride Surfaces: Electronic Structure and Bonding", Journal of Applied Physics, 62, 6, 2286-89 (1987). 
  5. F. N. Tebbe, P. A. Morris, R. H. French, U. Chowdhry, R. L. Coble, "Purity of Aluminum Hydroxide Derived From Triethylaluminum", Journal of The American Ceramic Society, 71, 4, C204-6 (1988). 
  6. R. V. Kasowski, F. S. Ohuchi and R. H. French, "Theoretical and Experimental Studies of Cu Metallization of Al2O3", Physica B, 150, 1-2, 44-46 (1988). 
  7. R. H. French, R. L. Coble, R. V. Kasowski and F. S. Ohuchi, "Vacuum Ultraviolet, Photoemission and Theoretical Studies of the Electronic Structure of Al2O3 up to 1000°C", Physica B, 150, 1-2, 47-49 (1988). 
  8. H. Song, R. H. French, R. L. Coble, "Effect of Residual Strain on the Electronic Structure of Alumina and Magnesia", Journal of The American Ceramic Society, 72, 6, 990-94 (1989). 
  9. F. S. Ohuchi, R. H. French, "Effect of Oxygen Incorporation in AlN Thin Films", J. Vac. Sci. Technol. A, 6, 3, 1695-6 (1988). 
  10. M. L. Bortz, R. H. French, "Optical Reflectivity Measurements Using a Laser Plasma Light Source" Applied Physics Letters, 55, 19, 1955-7 (Nov. 8, 1989). 
  11. M. L. Bortz, R. H. French, "Quantitative, FFT-Based, Kramers Kronig Analysis for Reflectance Data", Applied Spectroscopy, 43, 8, 1498-1501 (1989). 
  12. R. H. French, "Electronic Structure of a-Al2O3, with Comparison to AlON and AlN", Journal of the American Ceramic Society, 73, 3, 477-89 (1990). 
  13. R. H. French, "Laser-Plasma Sourced, Temperature Dependent VUV Spectrophotometer Using Dispersive Analysis", Physica Scripta, 41, 4, 404-8 (1990). 
  14. M. L. Bortz, R. H. French, D. J. Jones, R. V. Kasowski, F. S. Ohuchi, "Temperature Dependence of the Electronic Structure of Al2O3, MgAl2O4 and MgO", Physica Scripta, 41, 4, 537-41 (1990). 
  15. R. H. French, R. V. Kasowski, F. S. Ohuchi, D. J. Jones, H. Song, R. L. Coble, "Band Structure Calculations of the High-Temperature Electronic Structure of Magnesium Oxide", Journal of the American Ceramic Society, 73, 11, 3195-99 (1990). 
  16. M. E. Innocenzi, R. T. Swimm, M. Bass, R. H. French, A. B. Villaverde, M. R. Kokta, "Room Temperature Optical Absorption in Undoped a-Al2O3",  Journal of Applied Physics, 67, 12,7542-46 (1990). 
  17. R. H. French, J. W. Lin, F. S. Ohuchi, C. T. Chen, "Electronic Structure of b-BaB2O4 and LiB3O5  Nonlinear Optical Crystals”, Physical Review B., 44, 16, 8496-502 (1991). 
  18. M. E. Innocenzi, R. T. Swimm, M. Bass, R. H. French, M. R. Kokta, "Optical Absorption in Undoped Yttrium Aluminum Garnet", Journal of Applied Physics, 68, 3, 1200-4 (1990). 
  19. D. J. Kraus, R. H. French, "Automatic Spectral Data Base and Archive System for Optical Spectroscopy", Applied Spectroscopy, 44, (7), 1221-26 (1990). 
  20. G. Rohrer, D. A. Bonnell, R. H. French, "Detection of Optically Excited States in Wide Band Gap Semiconductors with Scanning Tunneling Microscopy", Journal of the American Ceramic Society, 73, 11, 3257-63 (1990). 
  21. Y. N. Xu, W. Y. Ching, R. H. French, "Self-consistent Band Structures and Optical Calculations in Cubic Ferroelectric Perovskites", Ferroelectrics, 111, 23-32 (1990). 
  22. F. M. Schellenberg, R. L. Byer, R. H. French, R. D. Miller,  "Vacuum-ultraviolet Spectroscopy of Dialkyl Polysilanes", Physical Review B Rapid Communications, 43, 12, 10008-11 (1991). 
  23. D. A. Bonnell, G. S. Rohrer, R. H. French, "Tunneling Spectroscopic Analysis of Optically Active Wide Band-gap Semiconductors" , Journal of Vacuum Science Technology, 9, 551-6 (1991). 
  24. L. E. McNeil, M. Grimsditch, R. H. French, "Vibrational Spectroscopy of Aluminum Nitride", Journal American Ceramic Society., 76, 1132-36 (1993). 
  25. R. H. French, J. S. Meth, J. R. G. Thorne, R. M. Hochstrasser, R. D. Miller, "Vacuum Ultraviolet Spectroscopy of the Optical Properties and Electronic Structure of Seven Poly(di-alkylsilanes)", Synthetic Metals, 50, 1-3, 499-508 (1992). 
  26. J. R. G. Thorne, R. M. Hochstrasser, J. M. Zeigler, A. Tilgner, H. P. Trommsdorff, R. H. French, P. J. Fagan, R. D. Miller, "Optical Studies of Polysilanes", Frontiers of Polymer Research, edited by P. N. Prasad, J. K. Nigam, Plenum Press, 143-8 (1991). 
  27. J. R. G. Thorne, R. M. Hochstrasser, J. M. Zeigler, A. Tilgner, H. P. Trommsdorff, R. H. French, P. J. Fagan, R. D. Miller, "Electronic and Vibrational Excitations in Polysilanes and Oligomers", Molecular Crystals and Liquid Crystals, 216, 13-9 (1992). 
  28. S. Loughin, R. H. French, W. Y. Ching, Y. N. Xu, G. A. Slack, "Electronic Structure of Aluminum Nitride: Theory and Experiment", Applied Physics Letters, 63, 9, 1182-4 (1993). 
  29. R. H. French, D. J. Jones, S. Loughin, "Interband Electronic Structure of a-Al2O3 up to 2167 K", Journal of the American Ceramic Society, 77, 412-22 (1994). 
  30. C. A. Handwerker, R. M. Cannon, R. H. French, "R. L. Coble: A Retrospective", Journal of the American Ceramic Society, 77, 293-7 (1994). 
  31. R. H. French, S. J. Glass, F. S. Ohuchi, Y.-N Xu, W. Y. Ching, "Experimental and Theoretical Studies on the Electronic Structure and Optical Properties of Three Phases of ZrO2", Physical Review B, 49, 8, 5133-42 (1994). 
  32. Y. N. Xu, W. Y. Ching, R. H. French, "Electronic Structure and Interatomic Bonding of b-BaB2O4 Crystal with Comparison to LiB3O5", Physical Review B., 48, 24, 17695-702 (1993). 
  33. Y. M. Chiang, L. E. Silverman, R. H. French, R. M. Cannon, "The Thin Glass Film between Ultrafine Conductor Particles in Thick Film Resistors", Journal of the American Ceramic Society, 77, 1143-52 (1994). 
  34. R. H. French, R. M. Cannon, L. K. DeNoyer, Y.-M. Chiang, "Full Spectral Calculation of Non-Retarded Hamaker Constants for Ceramic Systems from Interband Transition Strengths", Solid State Ionics, 75, 13-33 (1995). 
  35. Y. Chen, F. W. Clinard, B. D. Evans, R. H. French, R. Gonzalez, J. J. O'Dwyer, F. W. Wiffen, X. F. Zong, "Electrical Breakdown Of Insulating Ceramics In A High-Radiation Field", Journal of Nuclear Materials, 217, 32-47 (1994). 
  36. H. D. Ackler, R. H. French, Y. M. Chiang, “Comparison of Hamaker Constants for Ceramic Systems with Intervening Vacuum or Water: From Force Laws and Physical Properties”, Journal of Colloid and Interface Science, 179, 460-69 (1996). 
  37. S. -D. Mo, W. Y. Ching, R. H. French, “Electronic Structure of a Near S11 a-axis Tilt Grain Boundary in a-Al2O3” Journal of the American Ceramic Society, 79, 627-33 (1996). 
  38. S. -D. Mo, W. Y. Ching, R. H. French, “Optical Properties of a Near S11 a-axis Tilt Grain Boundary in a-Al2O3 ” Journal of Physics D, 29, 1761-66 (1996). 
  39. H. Müllejans, R. H. French, "Interband Electronic Structure of a Near S11 Grain Boundary in µ Alumina Determined by Spatially Resolved Valence Electron Energy-Loss Spectroscopy”, Journal of Physics D, 29, 1751-60 (1996). 
  40. S. Loughin, R. H. French, L. K. DeNoyer, W. -Y. Ching, Y. -N. Xu, "Critical Point Analysis of the Interband Transition Strength of Electrons", Journal of Physics D, 29 1740-50 (1996). 
  41. W. Y. Ching, Y.-N. Xu, R. H. French, “First-Principles Investigation of the Optical Properties of Poly(di-n-hexylsilane)”, Physical Review B, 54, 19, 13546-50 (1996). 
  42. C. Argento, R. H. French, “Parametric Tip Model and Force-Distance Relation for Hamaker Constant Determination from AFM”, Journal of Applied Physics, 80, 6081-90 (1996). 
  43. R. W. Johnson, E. S. Thiele, R. H. French, “”, TAPPI Journal, 80, 11, 233-39 (1997). 
  44. P. F. Carcia, R. H. French, M. H. Reilly, M. F. Lemon, D. J. Jones, “Optical Superlattices --- A Strategy for Designing Phase-shift Masks for Photolithography at 248 nm and 193 nm: Application to AlN/CrN”, Applied Physics Letters, 70, 2371-3 (1997). 
  45. R. H. French, H. Müllejans, D. J. Jones, “Optical Properties of Aluminum Oxide: Determined from Vacuum Ultraviolet and Electron Energy Loss Spectroscopies”, Journal of the American Ceramic Society, 81, 10, 2549-57 (1998).
  46. R. H. French, H. Müllejans, D. J. Jones, G. Duscher, R. M. Cannon, M. Rühle, “Dispersion Forces and Hamaker Constants for Intergranular Film in Silicon Nitride from Spatially Resolved-Valence Electron Energy Loss Spectrum Imaging”, Acta Materialia, 46, 7, 2271-87 (1998). 
  47. A. D. Dorneich, R. H. French, H. Müllejans, S. Loughin, M. Rühle, “Quantitative Analysis of Valence Electron Energy-Loss Spectra of Aluminum Nitride”, Journal of Microscopy, 191, 3, 286-96 (1998). 
  48. E. S. Thiele, R. H. French, “Light-Scattering Properties of Representative, Morphological Rutile Titania Particles Using a Finite-Element Method”, Journal of the American Ceramic Society, 81, 3, 469-79 (1998). 
  49. E. S. Thiele, R. H. French, “Computation of Light Scattering by Anisotropic Spheres of Rutile Titania”, Advanced Materials, 10, 1271-76 (1998). 
  50. R. H. French, D. J. Jones, H. Müllejans, S. Loughin, A. D. Dorneich, P. F. Carcia, “Optical Properties of Aluminum Nitride: Determined from Vacuum Ultraviolet Spectroscopy and Spectroscopic Ellipsometry”, Journal of Materials Research, 14, 4337-44 (1999). 
  51. H. Müllejans, R. H. French, “Insights Into the Electronic Structure of Ceramics Through Quantitative Analysis of Valence Electron Energy-loss Spectroscopy (VEELS)”, Microscopy and Microanalysis, 6 (4), 297-306, (2000). 
  52. L. E. McNeil, R. H. French, “Multiple scattering from Rutile TiO2 Particles”, Acta Materialia, 48, 4571-6, (2000). 
  53. R. H. French, “Origins and Applications of London Dispersion Forces and Hamaker Constants in Ceramics”, Centennial Feature Article, Journal of the American Ceramic Society, 83, 9, 2117-46 (2000).  
  54. L.E. McNeil, A.R. Hanuska, R. H. French, “Near-field scattering from red pigment particles:  absorption and spectral dependence”, Journal of Applied Physics, 89, 3, 1898-1906, (2001). 
  55. L.E. McNeil, R.H. French, “Light Scattering From Red Pigment Particles:  Multiple Scattering in a Strongly Absorbing System”, Journal of Applied Physics, 89, 1, 283-93, (2001). 
  56. K. van Benthem, R. H. French, W. Sigle C. Elsässer, M. Rühle, “Valence Electron Energy Loss Study of Fe Doped SrTiO3 and a S13 Boundary: Electronic Structure and Dispersion Forces”, Ultramicroscopy, 86, 3-4, 303-18, (2001). 
  57. L. E. McNeil, A.R. Hanuska and R.H. French, “Orientation dependence in near-field scattering from TiO2 particles”, Applied Optics, 40, 22, 3726-36, (2001). 
  58. K. van Benthem, C. Elsässer, R. H. French, “Bulk Electronic Structure of SrTiO3: Experiment and Theory”, Journal of Applied Physics, 90, 12, 6156-64, (2001). 
  59. J. R. Smith, R. H. French, G. Duscher, D. A. Bonnell, “Consequence of Composition/Property Variations at Multiple Length Scales to Macroscopic Properties of CrOCN Thin Films”, Journal of the American Ceramic Society, 84, 12, 2873-81, (2001). 
  60. M. K. Crawford, W. Farnham, A. E. Feiring, J. Feldman, R. H. French, K. Leffew, S. Nassirpour, V. A. Petrov, F. L. Schadt III, R. J. Smalley, and F. C. Zumsteg, “Fluoropolymers for 157 nm Lithography: Performance of Single Layer Resists”, Journal of Photopolymer Science and Technology, 15, 4, 677-89, (2002). 
  61. A. Frye, R. H. French, D. A. Bonnell “Optical Properties and Electronic Structure of Oxidized and Reduced Single Crystal Strontium Titanate”, Zeitschrift für Metallkunde.  94, 3, (2003). 
  62. R. H. French, R. C. Wheland, W. Qiu, M. F. Lemon, E. Zhang, J. Gordon, V. A. Petrov, V. F. Cherstkov, N. I. Delaygina, “Novel Hydrofluorocarbon Polymers for use as Pellicles in 157 nm Semiconductor Photolithography”, Journal of Fluorine Chemistry, 122, 63-80, (2003). 
  63. A. E. Feiring, J. Feldman, F. L. Schadt III, K. W. Leffew, F. C. Zumsteg, M. K. Crawford, R. H. French. R. C. Wheland, V. A. Petrov, W. B. Farnham, “Design of Very Transparent Fluoropolymer Resists for Semiconductor Manufacture at 157 nm” Journal of Fluorine Chemistry, 122, 11-16, (2003). 
  64. G. L. Tan, M. F. Lemon, R. H. French, “Optical Properties and London Dispersion Forces of Amorphous Silica Determined by Vacuum Ultraviolet Spectroscopy and Spectroscopic Ellipsometry”, Journal of the American Ceramic Society, 86, 11, 1885-92, (2003). 
  65. S. R. Lustig, E. D. Boyes, R. H. French, T. D. Gierke, M. A. Harmer, P. B. Hietpas, A. Jagota, R. S. McLean, G. P. Mitchell, G. B. Onoa, K. D. Sams, “Lithographically Cut Single-Walled Carbon Nanotubes with Controlled Length Distribution and End-Group Functionality”, Nano Letters, 3, 8, 1007-12, (2003). 
  66. R. R, Kunz., M. Switkes, R. Sinta, J. E. Curtin, R. H. French, R. C. Wheland, C. C. Kao, M. P. Mawn, L. Lin, P. Wetmore, V. Krukonis, K. Willams, “Transparent Fluids for 157 nm Immersion Lithography”,  Journal of Microlithography, Microfabrication, and Microsystems, 3, 1, 73-83, (2004). 
  67. S. Percec , R. Getty, W. Marshall, G. Skidd, R. H. French, “Synthesis, Structural Analysis, and Self-assembly of Phenylene Ethynylene Oligomers and Their -F, -CF3, and -CH3 Substituted Derivatives”, Journal of Polymer Science Part A: Polymer Chemistry, 42, 3 , 541-50, (2004). 
  68. R. A. Synowicki, G. K. Pribil, G. Cooney, C. M. Herzinger, S. E. Green, R. H. French, M. K. Yang, J. H. Burnett, S. Kaplan, “Fluid Refractive Index Measurements Using Roughened Surface and Prism Minimum Deviation Techniques” Journal of Vacuum Science And Technology B, 22, 6, 3450-3, (2004). 
  69. G. L. Tan, L. K. DeNoyer, R. H. French, M. J. Guittet , M. Gautier-Soyer, “Kramers Kronig Transform for the Surface Energy Loss Function”, Journal of Electron Spectroscopy and Related Phenomena, 142, 97–103, (2004). 
  70. K. van Benthem, G. L. Tan, L. K. Denoyer, R. H. French, M. Rühle, “Local Optical Properties, Electron Densities and London Dispersion Energies of Atomically Structured Grain Boundaries”  Physical Review Letters, 93, 227201, p. 1-4, (2004). 
  71. R. H. French, H. Sewell, M. K. Yang , S. Peng, D. McCafferty, W. Qiu, R. C. Wheland, M. F. Lemon, L. Markoya, M. K. Crawford, “Imaging Of 32-nm 1:1 Lines And Spaces Using 193-nm Immersion Interference Lithography With Second-Generation Immersion Fluids To Achieve A Numerical Aperture Of 1.5 And A k1 Of 0.25”, Journal of Microlithography, Microfabrication and Microsystems, Topical Issue on Hyper-NA Imaging, 4(3), 031103-1-14, (2005). 
  72. G. L. Tan, M. F. Lemon, R. H. French, D. J. Jones, “Optical properties and London Dispersion Forces of Amorphous and Crystalline Silica Determined by Vacuum Ultraviolet Spectroscopy and Spectroscopy Ellipsometry”, Physical Review B, 72, 205117, p. 1-10, (2005). 
  73. G. L. Tan, R. H. French, “Optical Properties, Electronic Structure and London Dispersion Interactions For Nanostructured Interfacial and Surficial Films”, Materials Science and Engineering: A, 422, 136-46, (2006). 
  74. F. Paumier, V. Fouquet, M. Guittet, M. Gautier-Soyer, R. H. French, G. Tan, Y.M. Chiang, M. Tang, A. Ramos, S.-Y. Chung, “Reflection Electron Energy Loss Spectroscopy of Nanometric Oxide Layers And Of Their Interfaces with a substrate”, Materials Sc ience and Engineering: A, 422, 29-40, (2006). 
  75. S. C. Fain, Jr, C. A. Polwarth, S. L. Tait, C. T. Campbell, R. H. French, “Simulated Measurement of Small Metal Clusters by Frequency-Modulation Non-Contact Atomic Force Microscopy (ncAFM)”, Nanotechnology,  17, S121–S127, (2006). 
  76. A. E. Feiring, M. K. Crawford, W. B. Farnham, R. H. French, K. W. Leffew, V. A. Petrov, F. L. Schadt III, H. V. Tran, F. C. Zumsteg, “Bis(fluoroalcohol) Monomers and Polymers: Improved Transparency Fluoropolymer Photoresists for Semiconductor Manufacture at 157 nm”, Macromolecules.  39 (4), 1443 -1448, (2006). 
  77. R. Podgornik, R. H. French, V.A. Parsegian, “Non-additivity in Van der Waals Interactions Within Multilayers”, Journal of Chemical Physics, 124, 044709, p. 1-9, (2006). 
  78. A. E. Feiring, M. K. Crawford, W. B. Farnham,  J. Feldman,  R. H. French,  C. P. Junk, K. W. Leffew, V. A. Petrov, W. Qiu, F. L. Schadt III, H. V. Tran, F. C. Zumsteg, “New Amorphous Fluoropolymers of Tetrafluoroethylene with Fluorinated and Non-Fluorinated Tricyclononenes.  Semiconductor Photoresists for Imaging at 157 and 193 nm”, Macromolecules, 39, 3252-61, (2006). 
  79. K. van Benthem , G. Tan, R. H. French, L. K. Denoyer, R. Podgornik, V. A. Parsegian, “Graded Interface Models For More Accurate Determination of van der-Waals – London Dispersion Interactions Across Grain Boundaries”, Physical Review B, 74, 205110, p. 1-12, (2006). 
  80. R. F. Rajter, R. H. French, W. Y. Ching, W. C. Carter, Y. M. Chiang, “Calculating van der Waals - London Dispersion Spectra and Hamaker Coefficients of Carbon Nanotubes in Water from ab initio Optical Properties”, Journal of Applied Physics, 101, 054303, p. 1-5, (2007). 
  81. R. H. French, K. I. Winey, M. K. Yang, W. Qiu, “Optical Properties, Electronic Structure and Dispersion Interactions of Polystyrene”, Australian Journal of Chemistry,60, 251-63, (2007).
  82. H. V. Tran, R. H. French, D. J. Adelman, J. Feldman, W. Qiu, R. C. Wheland, L. W. Brubaker, B. E. Fischel, B. B. Fones, M. F.  Lemon, M. K.  Yang, O. Nagao, M. Kaku, M. Mocella, and J. J.  Schmieg, “Evaluation of Next Generation Fluids for ArF Immersion Lithography Beyond Water", Journal of Photopolymer Science and Technology, 20, 5, 729-38, (2007). 
  83. R. Rajter, R. Podgornik, V. A Parsegian, R. H. French, W. Y. Ching, “van der Waals - London Dispersion Interactions for Optically Anisotropic Cylinders: Metallic and Semiconducting Single Wall Carbon Nanotubes”, Physical Review B., 76, 045417 (2007). 
  84. H. V. Tran, E. Hendrickx, R. H. French, D. J. Adelman, N. S. Rogado, M. Kaku, M. Mocella, J. J.  Schmieg, C. Y. Chen, F. Van Roey, A. S. Bernfeld, R. A. Derryberry, “High Refractive Index Fluid Evaluations at 193 nm: Fluid Lifetime and Fluid/Resist Interaction Studies”, Journal of Photopolymer Science and Technology, 21 (5), 631-9 (2008).
  85. M. K. Yang, R. H. French, E. W. Tokarsky, “Optical Properties of Teflon® AF Amorphous Fluoropolymers”, Journal of Micro/Nanolithography, MEMS and MOEMS, 7, 3, 033010, 1-9, (2008). 
  86. R. Rajter, R. H. French, R. Podgornik, W. Y. Ching, V. A. Parsegian, “Spectral Mixing Formulations for van der Waals – London Dispersion Interactions Between Multi-Component Carbon Nanotubes”, Journal Of Applied Physics, 104, 053513-1-13, (2008).
  87. M. K. Yang, S. G. Kaplan, R. H. French, J. H. Burnett, “Index of Refraction of High Index Lithographic Immersion Fluids and its Variability”, Journal of Micro/Nanolithography, MEMS and MOEMS, 8(2), 023005, (2009).
  88. R. H. French, H. V. Tran, “Immersion Lithography: Photomask and Wafer-Level Materials”, Vol. on “Materials Advances for Next-Generation Microelectronics”, Annual Reviews Of Materials Research,  39,  93-126 (2009). or full text html link
  89. H. V. Tran, E. Hendrickx, F. Van Roey, G. Vandenberghe, R. H. French, “Fluid - Photoresist Interactions And Imaging In High Index Immersion Lithography”, Journal of Micro/Nanolithography, MEMS and MOEMS, 8(3), 033006 (2009). 
  90. A. Siber, R. Rajter, R. H. French, W. Y. Ching, A. Parsegian R. Podgornik, “Dispersion interactions between Optically Anisotropic Cylinders at all Separations: Retardation Effects for Insulating and Semiconducting Single Wall Carbon Nanotubes”, Physical Review B, 80, 165414 (2009).  
  91. R. H. French, V. A. Parsegian, et al., “Long Range Interactions In Nanoscale Science”, Reviews Of Modern Physics, 82, 2, 1887-1944, (2010).
  92. R. Rajter, R. H. French, “van der Waals-London Dispersion Interaction Framework for Experimentally Realistic Carbon Nanotube Systems”, Int. J. Mat. Res., 10,1, 27-42, (2010). 
  93. R. Rajter, R. H. French, W. Ching, R. Podgornik, V. A. Parsegian, “Analyzing Chirality-Dependent Property Trends in Carbon Nanotube Systems Part 1: Electronic Structure and Optical Properties”, submitted to Physical Review B.  
  94. R. Rajter, R. H. French, W. Ching, R. Podgornik, V. A. Parsegian, “Analyzing Chirality-Dependent Property Trends in Carbon Nanotube Systems Part 2: Hamaker Coefficients and van der Waals – London dispersion interactions, submitted to Physical Review B. 

Book Chapters

  1. S. Loughin, R. H. French, "Optical Functions of Aluminum Nitride", Properties of Group III Nitrides, edited by J. H. Edgar, Electronic Materials Information Service, INSPEC, the Institution of Electrical Engineers, London, 175-89 (1994). 
  2. S. Loughin, R. H. French, “Aluminum Nitride (AlN)”, Handbook of Optical Constants of Solids, Vol. III, edited by E. Palik, Academic Press, 373-401 (1998). 

Other Publications

  1. R. C. Koeller, R. H. French, R. Raj, "Use of Holographic Interferometry to Study Crack Propagation in Metal-Plastic Composites", Proc. of the Conf. on Failure Modes in Composites IV, TMS-AIME, 164-75 (1979). 
  2. R. H. French, H. P. Jenssen, and R. L. Coble, "High Temperature VUV Spectrophotometer", Proc. of the 7th Int. Conf. on Vacuum Ultraviolet Radiation Physics, Annals of the Israeli Physical Society, 6, 1, 51-3 (1983). 
  3. R. H. French, R. L. Coble, "High Temperature Electronic Structure of Single Crystal Sapphire", Proc. of the 7th Int. Conf. on Vacuum Ultraviolet Radiation Physics, Annals of the Israeli Physical Society, 6, 1, 261-63 (1983).
  4. R. H. French, R. L. Coble, "Temperature Dependence of the VUV Optical Spectra and Band Structure of Al2O3", Proceedings of the Topical Conference on Basic Properties of Optical Materials, National Bureau of Standards Special Publication 697, 126-29 (1985). 
  5. P. A. Morris, R. H. French, R. L. Coble, F. N. Tebbe, U. Chowdhry, "Clean-room and CO2-Laser Processing of Ultra High-Purity Al2O3", Defect Properties and Processing of High-Technology Nonmetallic Materials, Materials Research Society Proceedings, 60, Pittsburgh, PA, 79-86 (1986). 
  6. D. P. Button, B. A. Yost, R. H. French, W. Y. Hsu, J. D. Bolt, M. A. Subramanian, H. M. Zhang, R. E. Geidd, A. G. Whittaker, D. G. Onn, "Ceramic-Fiber / Polymer Laminates : Thermally Conductive Composites With Low Dielectric Constants", Ceramic Substrates and Packages for Electronic Applications,  Advances in Ceramics, published by the American Ceramic Society, Westerville OH, 26, 353 - 73 (1989). 
  7. R. H. French, J. D. Bolt, "Polymer Ceramic Composites for Electronic Packaging Applications", Advanced Materials and Processes, 134, 1, 32-5 (1988). 
  8. R. H. French, J. B. Blum, "Electronic Structure and Conductivity of Al2O3", Sintering of Advanced Ceramics, edited by C. A. Handwerker, J. E. Blendell, W. Kaysser, Ceramic Transactions , published by the American Ceramic Society, Westerville OH, 7. 111 -34 (1990). 
  9. R. H. French, "Vacuum Ultraviolet Spectroscopy of Ceramics", Advanced Characterization Techniques for Ceramics, Ceramic Transactions, 5, 406-19 (1989). 
  10. P. A. Morris, M. K. Crawford, A. Ferretti, R. H. French, M. G. Roelofs, J. D. Bierlein, J. B. Brown, "Defects in KTiOPO4", Optical Materials, Materials Research Society Symposium Proceedings, 152, 95-101 (1989). 
  11. S. Loughin, R. H. French, G. A. Slack, J. B. Blum, "A Vacuum Ultraviolet Investigation of the Electronic Structure of Single- and Polycrystalline Aluminum Nitride", Extended Abstract for Symposium of the Materials Research Society Fall 1990 Meeting on Covalent Ceramics. 
  12. F. M. Schellenberg, R. L. Byer, R. D. Miller, R. H. French, S. S. Kano, Y. Takahashi, Y. Shiraki, R. Ito, "Linear and Nonlinear Optics of Substituted Polysilanes",  Inorganic and Organometallic Oligomers and Polymers, Proc. IUPAC Symp. Macromol., edited by J. F. Harrod, R. M. Laine, Kluwer Academic Publishers, Dordrecht and Boston,  73-95 (1991). 
  13. R. H. French, R. Abou-Rahme, D. J. Jones, L. E. McNeil, "Absorption Edge and Band Gap of SiO2 Fused Silica Glass", Ceramic Transactions, Vol. 28, "Solid State Optical Materials”, edited by Allan J. Bruce and Basavaraj V. Hiremath, American Ceramic Society, Westerville OH, 63-80 (1992). 
  14. H. Muellejans, J. Bruley, R. H. French, P. A. Morris, "Quantitative Electronic Structure Analysis of a-Al2O3 Using Spatially Resolved Valence Energy-loss Spectra", Electron Microscopy and Analysis Group (EMAG)  of Royal Microscopical Society Proceedings, edited by A. J. Craven, IOP Publishing, Bristol UK, 59-62 (1993). 
  15. H. Mullejans, J. Bruley, R. H. French, P. A. Morris, "Quantitative Electronic Structure Analysis of a-Al2O3 Using Spatially Resolved Valence Electron Energy-Loss Spectra", Mat. Res. Soc. Symp. Proc., 332, edited by M. Sarikaya, K. Wickramasighe, M. Isaacson, 169-176 (1994).  
  16. F. D. Kalk, R. H. French, H. U. Alpay, G. Hughes, "Attenuated Phase Shifting Photomasks Fabricated from Cr-Based Embedded Shifter Blanks", Photomask and X-Ray Mask Technology, SPIE Vol. 2254, edited by H. Yoshihara, 64-70 (1994).  
  17. B. Johs, R. H. French, F. D. Kalk, W. A. McGahan, J. A. Woollam, "Optical Analysis of Complex Multilayer Structures Using Multiple Data Types", Optical Interference Coatings, SPIE Vol. 2253, edited by F. Abeles, 1098-1106 (1994).  
  18. F. D. Kalk, R. H. French, H. U. Alpay, G. Hughes, "Chromium-Based Attenuated Embedded Shifter Preproduction", 14th Annual BACUS Symposium on Photomask Technology and Management, SPIE Vol. 2322, edited by W. L. Brodsky, G. V. Shelden, 299-304 (1994). 
  19. R. H. French, C. Scheu, G. Duscher, H. Müllejans, M. J. Hoffmann, R. M. Cannon, “Interfacial Electronic Structure and Full Spectral Hamaker Constants of Si3N4  Intergranular Films from VUV and SR-VEEL Spectroscopy”, Proceedings of the Symposium on Structure and Properties of Interfaces in Ceramics, edited by D. Bonnell, U. Chowdhry, M. Rühle, Materials Research Society, 243-258 (1995). 
  20. S. M. Gaspar Wilson, S. S. H. Naqvi, J. R. McNeil, H. M. Marchman, B. Johs, R. H. French, F. D. Kalk, “Metrology of Etched Quartz and Chrome Embedded Shift Gratings Using Scatterometry”, Integrated Circuit Metrology, Inspection, and Process Control IX,  SPIE Vol. 2439, edited by M. H. Bennett, 479-94 (1995). 
  21. P. F. Carcia, R. H. French, K. Sharp, J. S. Meth, B. W. Smith, “Materials Screening for Attenuating Embedded Phase-Shift Photoblanks for DUV and 193 nm Photolithography”, 16th Annual BACUS Symposium on Photomask Technology and Management, SPIE Vol. 2884, edited by G. V. Shelden, J. A. Reynolds, 255-63 (1996).  
  22. E. S. Thiele, R. H. French, “Computational Modeling of TiO2 Particle Optics Using a Finite Element Method”, Proceedings of the Paint Research Association, Germany (April 1997). 
  23. H. Müllejans, R. H. French, G. Duscher, M. Rühle, “Improved Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and the Local Electronic Structure”, Proceedings of the Microscopy Society of America (August 1997). 
  24. G. A. M. Reynolds, R. H. French, P. F. Carcia, C. C. Torardi, G. Hughes, D. J. Jones, M. F. Lemon, M. Reilly, L. Wilson, C. R. Miao, “TiSi-nitride attenuating phase-shift photomask for 193 nm lithography”, 18th Annual BACUS Symposium on Photomask Technology and Management,  SPIE Vol. 3546, edited by B. J. Grenon, F. E. Abboud, 514-23 (1998).  
  25. P. F. Carcia, R. H. French, G. Reynolds, G. Hughes, C. C. Torardi, M. H. Reilly, M. Lemon, C. R. Miao, D. J. Jones, L. Wilson, L. Dieu, “Optical Superlattices as Phase-Shift Masks for Microlithography”, Engineered Nanostructural Films and Materials, SPIE Vol. 3790, edited by A. Lakhtakia, R. F. Messier, 23-35 (1999). 
  26. P. F. Carcia, G. Hughes, R. H. French, C. Torardi, G. Reynolds, L. Dieu, “Thin Films for Phase-shift Masks”, Vacuum and Thin Film, IHS Publishing Group, 14-21, September (1999). 
  27. M. K. Crawford, A. E. Feiring, J. Feldman, R. H. French, M. Periyasamy, F. L. Schadt III, R. J. Smalley, F. C. Zumsteg, R. R. Kunz, V. Rao, L. Liao, S. M. Holl, “New Materials for 157 nm Photoresists: Characterization and Properties”, Advances in Resist Technology and Processing XVII, SPIE Vol. 3999, edited by F. M. Houlihan (2000).  
  28. R. H. French, R. C. Wheland, D. J. Jones, J. N. Hilfiker, R. A. Synowicki, F. C. Zumsteg, J. Feldman, A. E. Feiring, “Fluoropolymers for 157nm Lithography: Optical Properties from VUV Absorbance and Ellipsometry Measurements”, Optical Microlithography XIII, SPIE Vol. 4000, edited by C. J. Progler, 1491-1502 (2000). 
  29. R. M. Cannon, M. Rühle, M. J. Hoffmann, R. H. French, H. Gu, A. P. Tomsia and E. Saiz, “Adsorption and Wetting Mechanisms at Ceramic Grain Boundaries”, Grain Boundary Engineering in Ceramics, ed T. Sakuma, L. Sheppard, Y. Ikuhara, Ceramic Transactions, American Ceramics Society, Westerville Ohio 118, 427-44, (2000). 
  30. Michael K. Crawford, Andrew E. Feiring, Jerald Feldman, Roger H. French, Viacheslav A. Petrov, Frank L. Schadt III, Robert J. Smalley, Fredrick C. Zumsteg, “157 nm Imaging Using Thick Single Layer Resists”, Advances in Resist Technology and Processing XVIII , SPIE Vol. 4345, (2001).  
  31. Roger H. French, Joseph Gordon, David J. Jones, M. F. Lemon, Robert C. Wheland, Edward Zhang, Fredrick C. Zumsteg, Kenneth G. Sharp, Weiming Qiu, “Materials Design and Development of Fluoropolymers for Use as Pellicles in 157nm Photolithography”, Optical Microlithography XIV, SPIE Vol. 4346, (2001). 
  32. J. R. Smith, P. Graat, D. A. Bonnell, R. H. French, “Relation between Local Composition, Chemical Environment and Phase Shift Behavior in Cr-Based Oxycarbonitride Thin Films”, MRS Proceedings, January 2001. 
  33. Roger H. French, Robert C. Wheland, Joseph Gordon, Edward Zhang, “Optimizing Polymers to Increase Pellicle Lifetime and Transmission for 157-nm Lithography”, MICRO, Canon Communication LLC, Los Angeles CA, 79-93, (June, 2001). 
  34. Roger H. French, Jerald Feldman, Fredrick C. Zumsteg, Michael K. Crawford, Andrew E. Feiring, Joseph Gordon, Viacheslav A. Petrov, Frank L. Schadt III, Robert C. Wheland, Edward Zhang, “Progress in Materials Development for 157nm Photolithography: Photoresists and Pellicles”, Semiconductor Fabtech,  ICG Publishing Ltd., London, Edition 14, 167-75, July 2001. 
  35. A Grenville, V.. Liberman, M. Rothschild, J. H. C. Sedlacek, A. Grenville, R. H. French, “Behavior of Candidate Organic Pellicle Materials Under 157-nm Laser Irradiation”, Optical Microlithography XV, SPIE 4691, 56, (2002). 
  36.  Roger H. French, Robert C. Wheland, Weiming Qiu, M. F. Lemon, Edward Zhang, Joseph Gordon, Vlad Liberman, Andrew Grenville, Rod Kunz, Mordechai Rothschild, “157nm Pellicles: Polymer Design for Transparency and Lifetime”, Optical Microlithography XV, SPIE 4691, 57, (2002).  
  37. Steven R. Lustig, Edward D. Boyes, Roger H. French, Timothy D. Gierke, Mark A. Harmer, Paula B. Hietpas, Anand Jagota, Greg P. Mitchell and Kerry D. Sams, “A Novel Process Methodology for Cutting Uniform Nanostructures”, AICHE 2002 Proceedings: Materials Processing in Nanoelectronics, (2002). 
  38. M. K. Crawford, W. B. Farnham, A. E. Feiring, J. Feldman, R. H. French, K. W. Leffew, V. A. Petrov, W. Qiu, F. L. Schadt III, H.V. Tran, R. C. Wheland, F. C. Zumsteg, “Single Layer Fluoropolymer Resists for 157 nm Lithography”, Advances in Resist Technology and Processing XVIII , SPIE Vol. 5039, (2003).  
  39. S. R. Lustig, E. D. Boyes, R. H. French, T. D. Gierke, M. A. Harmer, P. B. Hietpas, A. Jagota, G. P. Mitchell, G. B. Onoa, K. D. Sams, “Novel Process Methodology for Uniformly Cutting Nanotubes”, MRS Proceedings, Spring 2003 Meeting, (2003). 
  40. R. H. French, M. K. Yang, M. F. Lemon, R. A. Synowicki, G. K. Pribil, G. T. Cooney, C. M. Herzinger, S. E. Green, J. H. Burnett, S. Kaplan, “Immersion Fluid Refractive Indices Using Prism Minimum Deviation Techniques”, Optical Microlithography XVII, SPIE Vol. 5377, 1689-94 (2004). 
  41. R. A. Synowkicki, G. K. Pribil, G. Cooney, C. M. Herzinger, S. E. Green, R. H. French, M. K. Yang, M. F. Lemon, J. H. Burnett, S. Kaplan, “Immersion Fluids For Lithography: Refractive Index Measurements Using Prism Minimum Deviation Techniques”, Semiconductor FabTech, 22nd Edition, 55-58, (2004).
  42. G. L. Tan, L. K. Denoyer, R. H. French, A. Ramos, M. Gautier-Soyer, Y. M. Chiang, “Characterization of the Electronic Structure and Optical Properties of Al2O3, ZrO2 and SrTiO3 from Analysis of Reflection Electron Energy Loss Spectroscopy in the Valence Region”  Fundamentals of Novel Oxide/Semiconductor Interfaces, Materials Research Society Proceedings Vol 786, E1.9.1, (2004). 
  43. K. Lee, S. Jockusch, N. J. Turro, R. H. French, R. C. Wheland, M. F. Lemon, A. M. Braun, T. Widerschpan, P. Zimmerman, “157 nm Pellicles for Photolithography: Mechanistic Investigation of the Deep UV Photolysis of Fluorocarbons”, Optical Microlithography XVII Proceedings of SPIE Vol. 5377, 1598-1605, (2004). 
  44. S. Peng, R. H. French, W. Qiu, R. C. Wheland, M. K. Yang, M. F. Lemon, M. K. Crawford, “Second Generation Fluids for 193 nm Immersion Lithography”, Optical Microlithography XVIII, SPIE Vol. ML5754-76, (2005). 
  45. R. H. French, K. I. Winey, “Origins and Applications of London Dispersion Interactions in Polymers and Other Materials: Electronic Structure, Optical Properties and Chemistry”, Proceedings of the  28th Australasian Polymer Society Meeting, Ed. By Greg Russell, Martina Stenzel, published by Polymer Division, Royal Australian Chemical Institute,. ISBN: 0-9756825-4-7, (2006). 
  46. R. H. French, W. Qiu, M. K. Yang, R. C. Wheland, M. F. Lemon, A. L. Shoe, D. J. Adelman, M. K. Crawford, H. V. Tran, J. Feldman, S. J. McLain, S. Peng, “Second Generation Fluids for 193nm Immersion Lithography”, Optical Microlithography XIX, SPIE Vol. ML6154-42, (2006). 
  47. R. H. French, V. Liberman, H. V. Tran, J. Feldman, D. J. Adelman, R. C. Wheland, W. Qiu, S. J. McLain, M. K. Yang, M. F. Lemon, L. Brubaker, A. L. Shoe, B. Fones, K. Krohn, D. Hardy, C. Y. Chen, “High Index Immersion Lithography With Second Generation Immersion Fluids To Enable Numerical Apertures of 1.55 For Cost Effective 32 nm Half Pitches”, Optical Microlithography XX, SPIE Vol. ML6520-59, (2007). 
  48. R. F. Rajter, R. H. French, “New Perspectives on van der Waals – London Interactions of Materials. From Planar Interfaces to Carbon Nanotubes”,  Journal of Physics: Conference Series, 94, 012001, (2008). 
  49. R. H. French, H. V. Tran, D. J. Adelman, N. S. Rogado, M. Kaku, M. Mocella, C. Y. Chen, E. Hendrickx, F. Van Roey, A. S. Bernfeld, R. A. Derryberry, “High Index Immersion Fluids Enabling Cost-Effective Single-Exposure Lithography For 32 nm Half Pitches”, Optical Microlithography XXI, SPIE Vol. AL6924-44, (2008). 
  50. R. H. French, J. M. Rodríguez-Parada, M. K. Yang, R. A. Derryberry, M. F. Lemon, M. J. Brown, C. R. Haeger, S. L. Samuels, E. C. Romano, R. E. Richardson, “Optical Properties Of Materials For Concentrator Photovoltaic Systems”, Proceedings of 34th IEEE Photovoltaic Specialists Conference (PVSC), Philadelphia, PA June 7–12, 2009. 

Invited Presentations and Seminars
  1. R. H. French, "Application of Vacuum Ultraviolet Absorption Spectroscopy to Optical Materials", Crystal Physics and Opto-Electronics Seminar Series, Massachusetts Institute of Technology, May 1986.
  2. R. H. French, "Temperature Dependence of the Electronic Structure of Al2O3 ", Solid State Division Seminar, Oak Ridge National Labs, June 1986. 
  3. R. H. French, "Vacuum Ultraviolet Spectroscopy of Ceramics and Optical Materials", Institute for Physical Science and Technology Seminar, University of Maryland, December 1986.
  4. R. H. French, "VUV Spectroscopy of the Electronic Structure of Ceramics", Department of Materials Science, University of Pennsylvania, March 1988.
  5. R. H. French, D. J. Jones, W. Y. Hsu, B. A. Yost, M. A. Subramanian, "Percolation Effects in the Dielectric Properties of Polymer Ceramic Composites", American Ceramic Society Annual Meeting, Cincinnati, OH, May 1988. 
  6. R. H. French, "Electronic Structure and Conductivity of Al2O3 ", International Forum on Sintering of Advanced Ceramics, American Ceramic Society, Cincinnati, OH, May 1988. 
  7. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure of Ceramics", University of Southern California, Center for Laser Studies, October 1988.
  8. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure of Ceramics", University of California at Berkeley, Materials Science Dept., October 1988.
  9. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure of Ceramics", University of California at Santa Barbara, Materials Dept., October 1988.
  10. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure of Ceramics", Arizona State University, Dept. of Chemistry, October 1988.
  11. R. H. French, "Optical Properties and Electronic Structure of Ceramics".  Two seminars, part of University of Pennsylvania graduate course on "Introduction to Ceramics”, November 1988.
  12. R. H. French, "Band Structure of Alumina", Case Western Reserve/NASA/DuPont Workshop on Alumina, Case Western Reserve University, January 1989.
  13. R. H. French, "Optical Properties and Electronic Structure of Ceramics".  Two seminars, part of Massachusetts Institute of Technology graduate course on "Poly-Phase Ceramics", March 1989.
  14. R. H. French, "Electronic Structure and Optical Properties of Ceramics and Optical Materials", University of Missouri, Kansas City, April 1990.
  15. R. H. French, "Temperature Dependent Electronic Structure and Optical Properties of Ceramics", Naval Research Laboratory, Complex Systems Theory Branch, Washington D. C., June 1990. 
  16. R. H. French, "Solid State Physics, Materials Science and Ceramics", Wilmington Christian High School as part of Science Alliance Summer Fellowship Program, October 1990. 
  17. R. H. French, "High Temperature Electronic Structure of Ceramics", American Ceramic Society, Basic Science Division Fall Meeting on Atomic Bonding and Properties of Ceramics, Marco Is., Florida, October 1991.   
  18. R. H. French, "Solid State Physics, Materials Science and Ceramics", Wilmington Christian High School as part of Science Alliance Summer Fellowship Program, October 1991. 
  19. R. H. French, "High Temperature Electronic Structure of Insulating Oxides",  University of North Carolina, Chapel Hill, Physics and Astronomy Dept.,  February 1992. 
  20. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure and Interband Transitions of Ceramics: AlN, Al2O3, and ZrO2", Max Planck Institut fur Metallforschung, Stuttgart, Germany, July 1992.
  21. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure and Interband Transitions of Ceramics: AlN, Al2O3, and ZrO2", Royal Institution, London, England, July 1992. 
  22. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure and Interband Transitions of Ceramics: AlN, Al2O3, and ZrO2", Cavendish Laboratory, University of Cambridge, Cambridge, England, July 1992. 
  23. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure and Interband Transitions of Ceramics: AlN, Al2O3, and ZrO2", Commissariat a L'Energie Atomique, Saclay, France, August 1992. 
  24. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure and Interband Transitions of Ceramics: AlN, Al2O3, and ZrO2", University of Virginia, Physics Department, September 1992. 
  25. R. H. French, "Solid State Physics, Materials Science and Ceramics", Wilmington Christian High School as part of Science Alliance Summer Fellowship Program, December 1992. 
  26. R. H. French, "Optical Spectroscopy and Electronic Structure of a-Al2O3", International Symposium on the Science of a-Al2O3, Max Planck Institut fur Metallforschung, held at Schloss Ringberg, Germany, April 15 to 19, 1993.   
  27. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure and Interband Transitions of Ceramics: AlN, Al2O3, and ZrO2", Cornell University, Materials Science Dept., October 1993. 
  28. R. H. French, "Electronic Structure and Interband Transitions of Ceramics: Critical Point Analysis of AlN and Al2O3 , Hamaker Constants and Spatially-Resolved EELS",  Materials Science Department, Massachusetts Institute of Technology, January 1994. 
  29. R. H. French, "Interband Electronic Structure and Interfaces: Bonding and Hamaker Constants", International Symposium on "Interfaces in Ionic Materials", Max Planck Institut fur Metallforschung, held at Schloss Ringberg, Germany, March 6 to 11, 1994.   
  30. R. H. French, "Embedded Phase Shifter Photomask Blanks: Materials Development", International Symposium on "Interfaces in Ionic Materials", Max Planck Institut fur Metallforschung, held at Schloss Ringberg, Germany, March 6 to 11, 1994.   
  31. R. H. French, "Optical Properties and Electronic Structure of Polysilanes and Other Materials", University of Connecticut, Polymer Science Program, Institute of Materials Science, April 1994. 
  32. R. H. French, "Electronic Structure and Optical Properties of Ceramics: Interatomic Bonding of AlN and a-Al2O3 and Design of Cr-OCN Compounds for Phase Shift Lithography", Two seminars in Frontiers of Materials Science Course at University of New Mexico and Sandia Advanced Materials Lab, September 1994. 
  33. R. H. French, "Spectroscopic Determination of Interfacial Electronic Structure for Interatomic Bonding and Hamaker Constants", Symposium on Structure and Properties of Interfaces in Ceramics, Materials Research Society 1994 Annual Fall Meeting, Boston, MA, December 1994.   
  34. R. H. French, “Quantitative Analysis of Spatially Resolved Valence Electron Energy Loss Spectra for Electronic Structure and Bonding Studies of Grain Boundaries and Thin Glass Films”, Materials Science Department, University of California at Berkeley, January 1995. 
  35. R. H. French, “Quantitative Analysis of Spatially Resolved Valence Electron Energy Loss Spectra for Electronic Structure and Bonding Studies of Grain Boundaries and Thin Glass Films”, Physics Department, University of Missouri-Kansas City, February 1995. 
  36. R. H. French, “Interfacial Electronic Structure and Bonding Studies of Grain Boundaries and Thin Glass Films”, Materials Science Seminar Series, Harvard University, March 1995. 
  37. R. H. French, “Quantitative Analysis of Spatially Resolved Valence Electron Energy Loss Spectra for Electronic Structure and Bonding Studies of Grain Boundaries and Thin Glass Films”, Symposium on Analytical Microscopy of Ceramics, Microscopy Society of America, Kansas City, August 1995.   
  38. R. H. French, “Electronic Structure and van der Waals Dispersion Forces for Intergranular Films in Ceramics”, Gordon Conference on Solid State Studies in Ceramics, New Hampshire,  July 23, 1995.   
  39. R. H. French, “Design and Development of Cr-OxCyNz Embedded Phase Shifter Photomask Blanks for I-Line Phase Shift Lithography”, Materials Department, University of California at Santa Barbara, February 1996. 
  40. R. H. French, “Interfacial Electronic Structure and Interband Transitions: for Grain Boundary Bonding and Hamaker Constants of Intergranular Films”,  Materials Department, University of California at Santa Barbara, February 1996. 
  41. R. H. French, “Optical Property Based Electronic Structure Probes: Vacuum Ultra Violet  and Spatially Resolved-Valence Electron Energy Loss Spectroscopies”, American Ceramic Society, Annual Meeting, Indianapolis, April 1996.   
  42. R. H. French, “Design and Development of Cr-OxCyNx, Embedded Phase Shifter Photomask Blanks for I-line Phase Shift Lithography, American Ceramic Society, Annual Meeting, Indianapolis, April 1996. 
  43. R. H. French, “Design and Development of Cr-OxCyNz Embedded Phase Shifter Photomask Blanks for I-Line Phase Shift Lithography”  Metallurgy Division, National Institute for Standards and Technology, April 1996. 
  44. R. H. French, “Design and Development of Cr-OxCyNz Embedded Phase Shifter Photomask Blanks for I-Line Phase Shift Lithography”,  Physics Department, Johns Hopkins University, May 1996. 
  45. R. H. French,  “Intergranular Film Chemistry, Hamaker Constants and Dispersion Forces in Silicon Nitride”, Third International Workshop on Interfaces: Wetting, Fracture and Chemistry of Interfaces, University of Santiago, Santiago, Galicia, Spain, September 1996.   
  46. R. H. French, “Dispersion Forces, Hamaker Constants and Intergranular Film Chemistry in Silicon Nitride”, Max Planck Institut fur Metallforschung, Stuttgart, Germany, September 1996. 
  47. R. H. French, “Optical Property Based Electronic Structure Probes: Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss Spectroscopies”, Material Science Department, Northwestern University, November 1996. 
  48. R. H. French, “Design and Development of Cr-OxCyNz Embedded Phase Shifter Photomask Blanks for I-Line Phase Shift Lithography”, Material Science Department, Northwestern University, November 1996. 
  49. R. H. French, “Optical Property Based Electronic Structure Probes: Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss Spectroscopies”, Material Science Department, University of Washington, February 1997. 
  50. R. H. French, “Optical Property Based Electronic Structure Probes: Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss Spectroscopies”, Material Science Department, University of Toronto, February 1997. 
  51. R. H. French, “Optical Property Based Electronic Structure Probes: Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss Spectroscopies”, Material Science Department, University of Pennsylvania, February 1997. 
  52. R. H. French, “Optical Property Based Electronic Structure Probes: Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss Spectroscopies”, Material Science Department, Stevens Institute of Technology, April 1997. 
  53. R. H. French, “VdW Dispersion Forces: An Electronic Structure and Chemistry Perspective”, International Workshop on Interfaces in Alumina, Max Planck Institut fur Metallforschung , Schloss Ringberg, Germany, March 1998.   
  54. R. H. French, “Optical Property Based Electronic Structure Probes Applied to Intergranular Films and Wetting in Silicon Nitride”, University of Michigan, March 1998. 
  55. R. H. French, “Resonant Scattering of Electromagnetic Radiation by Complex Particulate Microstructures”, International Workshop on Interfaces, Santa Barbara, CA, April 1998. 
  56. R. H. French, “vdW Dispersion Forces: An Electronic Structure and Chemistry Perspective”, Fulrath Award Presentation, American Ceramic Society, Annual Meeting, Cincinnati, OH, May 1998.   
  57. R. H. French, “Scattering of Electromagnetic Radiation by Complex Microstructures in the Resonant Regime”, Max Planck Institut fur Metallforschung, Stuttgart, Germany, December 1998. 
  58. R. H. French, “SiN/TiN Multilayers for 248 nm and 193 nm Phase Shift Lithography”, Max Planck Institut fur Metallforschung , Stuttgart, Germany, December 1998. 
  59. R. H. French, “vdW Dispersion Forces: an Electronic Structure and Chemistry Perspective”, Fulrath Award Seminar,  Ceramic Society of Japan, Annual Meeting, Seikei University, Kissyo-Ji, Tokyo, March 1999. 
  60. R. H. French, “vdW Dispersion Forces: an Electronic Structure and Chemistry Perspective”, Kyoto University, Kyoto, Japan, March 1999. 
  61. R. H. French, “vdW Dispersion Forces: an Electronic Structure and Chemistry Perspective”, Japan Fine Ceramics Center, Nagoya, Japan, March 1999.
  62. R. H. French, “vdW Dispersion Forces: an Electronic Structure and Chemistry Perspective”, Shonan Institute, Tokyo, Japan, March 1999.
  63. R. H. French, “SiN/TiN Multilayers for 248nm and 193nm Phase Shift Lithography”, Taiyo Yuden Research Center, Haruna, Gunma, Japan, March 1999.
  64. R. H. French, “SiN/TiN Multilayers for 248nm and 193nm Phase Shift Lithography”, Fujitsu VLSI Division, Mie, Japan, March 1999. 
  65. R. H. French, “Near Field Optics for Scattering of Electromagnetic Radiation By Complex Particulate Microstructures”, Fujitsu VLSI Division, Mie, Japan, March 1999. 
  66. R. H. French, “vdW Dispersion Forces: an Electronic Structure and Chemistry Perspective”, NEC Corporate Research Labs, Tokyo, Japan, April 1999.
  67. R. H. French, “vdW Dispersion Forces: an Electronic Structure and Chemistry Perspective”, Waseda University and Fulrath Foundation, Tokyo, Japan, April 1999.
  68. R. H. French, “vdW Dispersion Forces: an Electronic Structure and Chemistry Perspective”, University of Tokyo, Tokyo, Japan, April 1999.
  69. R. H. French, “Near Field Optics for Scattering of Electromagnetic Radiation By Complex Particulate Microstructures”, Gordon Research Conference on Solid State Studies in Ceramics, August 1999. 
  70. R. H. French, “Near Field Optics of Resonant Scattering by Particulate Systems”, Acta Materialia International Workshop on Ceramic and Bimaterial Interfaces, Seville, Spain, September 1999.   
  71. R. H. French, “Near Field Optics and Scattering By Particulate Dispersions”, Max Planck Institut fur Metallforschung, Stuttgart, Germany, September 1999. 
  72. R. H. French, “Near Field Optics and Scattering By Particulate Dispersions”, Theoretical and Applied Physics Institute, Physics Department, University of Stuttgart, Stuttgart, Germany, October 1999.
  73. R. H. French, “Near Field Optics and Scattering by Particulate Dispersions”, Ceramic and Materials Engineering Department, Rutgers University, November 1999.
  74. R. H. French, “vdW and London Dispersion Forces: an Electronic Structure and Chemistry Perspective on Wetting Films”, Condensed Matter Seminar Series, Harvard University, April 2000. 
  75. R. H. French, “Development of Novel Thin Films Materials and Microstructures for Phase Shift Photomasks and Low k1 IC Lithography, American Ceramic Society, Annual Meeting, St. Louis, May 2000.   
  76. R. H. French, “Materials and Microstructure Design for Low k1, Semiconductor Photolithography to Produce Sub-wavelength Features”, Pennsylvania State University, Materials Science Departmental Seminar, December 2000.
  77. R. H. French, “Materials and Microstructure Design for Low k1, Semiconductor Photolithography to Produce Sub-wavelength Features”, Max Planck Institut fur Metallforschung, Stuttgart, Germany, December 2000. 
  78. R. H. French, “vdW and London Dispersion Forces: an Electronic Structure and Chemistry Perspective on Wetting Films”, Laboratory of Physical and Structural Biology, National Institutes of Health, Bethesda MD, June 2001. 
  79. R. H. French, “Materials for Moore’s Law”, DuPont’s Chesapeake Farms Conference on Nanotechnology, August 2001. 
  80. R. H. French, “Challenges in Metal-Ceramic Interfaces in Semiconductors for Sub-90 nm and Sub 50nm Electronics”, CECAM Workshop on Ceramic-Metal Interfaces: Progress and Challenges, Lyon, France, October 2001. 
  81. R. H. French, “Optical Properties and Electronic Structure: London Dispersion Forces and Intergranular Films in Ceramics”, Sevice de Physique et Chimie, DSM-DRECAM-SPCSI Commissariat a L'Energie Atomique, Saclay, France, October 2001. 
  82. R. H. French, “Optical Properties and Electronic Structure: London Dispersion Forces and Intergranular Films in Ceramics”, Groupe Physique du Metal, LTPCM/ENSEEG/CNRS, Centre National de la Recherche Scientifique, Grenoble, France, October 2001. 
  83. R. H. French, “Materials For Moore’s Law: Nanostructures Galore”, University of Washington, Materials Science Department Seminar, November 2001. 
  84. R. H. French, “Optical Properties and Electronic Structure of Bulk and Interfacial Ceramics From VUV and VEELS Spectroscopy”, Lectures in MSE 590 - Characterization of Minerals and Materials by Spectroscopic Techniques, University of Washington, Materials Science Department, November 2001. 
  85. R. H. French, “Optical Properties and Electronic Structure: London Dispersion Forces and Intergranular Films in Ceramics”, University of Cambridge, Department of Materials Science and Metallurgy Seminar, January 2002. 
  86. R. H. French, “Materials For Moore’s Law”, Lecture in MSE 790 – Special Topics, University of Pennsylvania, Department of Materials Science, January 2002. 
  87. R. H. French, L. K. Denoyer, V. A. Parsegian, R. Podgornik, “London Dispersion Forces and Full Spectral Hamaker Coefficients for Nanostructured Amorphous Films with Multilayer or Graded Structures”, International Workshop on Ceramic and Metal Interfaces, Oviedo, Spain, June 2002. 
  88. R. H. French, L. K. Denoyer, V. A. Parsegian, R. Podgornik, “London Dispersion Forces and Full Spectral Hamaker Coefficients for Nanostructured Amorphous Films with Multilayer or Graded Structures”, Workshop on Nanostructured Amorphous Films, Massachusetts Institute of Technology, Boston, MA, August 2002. 
  89. R. H. French, “Materials For Moore’s Law”, Gordon Research Conference on Solid State Studies in Ceramics, New Hampshire, August 2002. 
  90. R. H. French, R. C. Wheland, W. Qiu, M. F. Lemon, E. Zhang, J. Gordon, “Novel Hydrofluorocarbon Polymers for use as Pellicles in 157 nm Semiconductor Photolithography”, American Chemical Society, Symposium on Fluorine in Microlithography and Microchip Manufacture, Boston, August 2002. 
  91. R. H. French, “Samuel Geijsbeek Award Lecture: Development of Attenuating Phase Shift Materials and Microstructures for Low k1 Semiconductor Photolithography” American Ceramic Society, Fall Meeting, Seattle, October 2002. 
  92. R. H. French, “Materials for Moore’s Law: Ceramic Opportunities”, International Nanotechnology Symposium for World Young Ceramists" Kagoshima, Japan, January 23,24 2003. 
  93. R. H. French, “Electronic Structure, Optical Properties and Dispersion Forces at Interfaces in Materials “ presented at the American Ceramic Society Annual Meeting.  Nashville TN, April 2003. 
  94. R. H. French, “Materials for Moore’s Law”, Complex Materials Seminar Series, Dept. of Chemical Engineering, Princeton University, April 2003. 
  95. R. H. French, “Structure – Composition - Property Relations For Transparency of Fluoromolecular Fluids For Nanoscale Pattering Using 157 nm Immersion Lithography”, Materials Science Seminar Series, University of Pennsylvania, March 2004. 
  96. R. H. French, M. F. Lemon, S. Peng, W. Qiu, R. C. Wheland, M. K. Yang, “Fluids For 157 nm Immersion Lithography”, Electron, Ion and Photon Beam Technology and Nanofabrication (EIPBN), San Diego, June 2004. 
  97. R. H. French, “Lithography Materials For Semiconductor Manufacture”, presented at “The Fifth Annual TC 1700 Technology Fair” of The United States Patent and Trademark Office, Patent Technology Center 1700, Alexandria, July 2003. 
  98. R. H. French, G. L. Tan, “New Perspectives on London Dispersion Interactions and Hamaker Coefficients: At Atomically Abrupt Grain Boundaries in SrTiO3 and of Compositional Gradients in Intergranular Films in Re-M-O-N:Si3N4” Symposium on Theoretical and Experimental Developments in the Understanding of Interface Stabilized Intergranular and Surficial Films: Progress from the NANOAM Project, American Ceramics Society Annual Meeting, Baltimore, April 2005.
  99. R. H. French, “New Perspectives on London Dispersion Interaction and Hamaker Coefficients”, 6th International Workshop on Interfaces: Interfaces By Design, Santiago de Compostela, Spain, June 2005. 
  100. R. H. French, K. I. Winey, “Origins and Applications of London Dispersion Interactions in Polymers and Other Materials: Electronic Structure, Optical Properties and Chemistry”, 28th Australasian Polymer Society Meeting, Rotorua, New Zealand, February 2006. 
  101. R. H. French, A. L. Shoe, R. C. Wheland, H. V. Tran, W. Qiu, J. Feldman, S. J. McLain, M. K. Yang, M. F. Lemon, D. J. Adelman, M. K. Crawford, M, Ercken, R. Gronheid, J. Versluijs, E. Hendrickx, P. Foubert, N. Vandenbroeck, P. Willems, F. Van Roey, C. Jehoul “Second Generation Fluids for 193 nm Immersion Lithography: Optics, Imaging and Fluid Lifecycle”, International Sematech Lithography Forum, Vancouver British Columbia, Canada, May 2006. 
  102. R. H. French, A. L. Shoe, R. C. Wheland, H. V. Tran, W. Qiu, J. Feldman, S. J. McLain, M. K. Yang, M. F. Lemon, D. J. Adelman, M. K. Crawford, “Second Generation Fluids for 193 nm Immersion Lithography: Optics, Imaging and Fluid Lifecycle”, IEEE Lithography Workshop, Prince Edward Island, Canada, July 2006. 
  103. R. H. French, “New Perspectives on London Dispersion Interactions and Hamaker Coefficients: At Atomically Abrupt Grain Boundaries in SrTiO3 And Of Compositional Gradients In Intergranular Films in Re-M-O-N:Si3N4”, Oak Ridge National Labs, June 2006. 
  104. R. H. French, “New Perspectives on van der Waals – London Dispersion Interactions of Materials: Wetting, Graded Interfaces and Carbon Nanotubes”, Department Seminar in Theoretical and Applied Mechanics, Cornell University, October 2006. 
  105. R. H. French, “New Perspectives on van der Waals – London Dispersion Interactions of Materials: Wetting, Graded Interfaces and Carbon Nanotubes”, E-MRS, Strasbourg, France, May / June 2007. 
  106. R. F. Rajter, R. H. French, “van der Waals - London Dispersion Interactions For Metallic and Semiconducting Carbon Nanotubes From ab initio Unixial Optical Properties”, American Ceramic Society, 32nd International Conference on Advanced Ceramics and Composites. Daytona Beach, Florida, January 2008. 
  107. H. V. Tran, E. Hendrickx, R. H. French, D. J. Adelman, N. S. Rogado, M. Kaku, M. Mocella, J. J.  Schmieg, C. Y. Chen, F. Van Roey, A. S. Bernfeld, R. A. Derryberry, “High Refractive Index Fluid Evaluations at 193 nm: Fluid Lifetime and Fluid/Resist Interaction Studies”, Chiba Conference, Chiba, Japan, June 2008. 
  108. R. F. Rajter, R. H. French, “van der Waals - London Dispersion Interactions For Metallic and Semiconducting Carbon Nanotubes”, International Symposium on Ceramic Interfaces, Santiago de Compostela, Spain, June 2008. 
  109. R. F. Rajter, R. H. French, “van der Waals - London Dispersion Interactions For Metallic and Semiconducting Carbon Nanotubes”, Kavli Institute For Theoretical Physics, University Of California at Santa Barbara, Program on “Theory and Practice Of Fluctuation-Induced Interactions”, October 2008. 
  110. R. H. French, “New Perspectives on London Dispersion Interactions and Hamaker Coefficients: At Atomically Abrupt Grain Boundaries in SrTiO3 And In Intergranular Films in Re-M-O-N:Si3N4”, Kavli Institute For Theoretical Physics, University Of California at Santa Barbara, Program on “Theory and Practice Of Fluctuation-Induced Interactions”, October 2008. 

Conference Presentations
  1. R. C. Koeller, R. H. French, R. Raj, "Use of Holographic Interferometry to Study Crack Propagation in Metal-Plastic Composites", Conference of Failure Modes in Composites IV, TMS-AIME, 1979.
  2. R. H. French, R. L. Coble, "High Temperature Electronic Structure of Single Crystal Al2O3",  7th International Conference on Vacuum Ultraviolet Radiation Physics, Jerusalem, Israel, August 1983.
  3. R. H. French, H. P. Jenssen, and R. L. Coble, "High Temperature VUV Spectrophotometer",  7th International Conference on Vacuum Ultraviolet Radiation Physics, Jerusalem, Israel, August 1983.
  4. R. H. French, R. L. Coble, "High Temperature Electronic Structure of Single Crystal Al2O3",  86th Annual Meeting, Amer. Ceram. Soc., Pittsburgh, Pennsylvania, May 3, 1984.
  5. R. H. French, R. L. Coble, "Temperature Dependence of the VUV Optical Spectra and Band Structure of Al2O3",  Topical Conference on Basic Properties of Optical Materials, National Bureau of Standards, May 1985.
  6. R. H. French, R. L. Coble, "Measurement of the High Temperature Band Gap of Al2O3 and Implications for High Temperature Conductivity",  87th Annual Meeting, Amer. Ceram. Soc., Cincinnati, Ohio, May 6, 1985.
  7. P. A. Morris, R. H. French, R. L. Coble, F. N. Tebbe, U. Chowdhry, "Clean-room and CO2-Laser Processing of Ultra High-Purity Al2O3 ",  Materials Research Society Symposium on "Defect Properties and Processing of High-Technology Nonmetallic Materials", December 1985.
  8. F. A. Modine, C. Y. Allison, T. W. Haywood, R. H. French, "Optical and Electrical Properties of Niobium Carbide",   American Physical Society, Las Vegas, Nevada, April 4, 1986.
  9. F. S. Ohuchi, R. H. French, R. V. Kasowski, "A Study of Room Temperature Cu-Al2O3 and Cu-AlN Interfacial Reactions",  American Vacuum Society, Baltimore, November 1986.
  10. F. S. Ohuchi, R. H. French, R. V. Kasowski, "Cu Deposition on Al2O3 and AlN Surfaces: Electronic Structure and Bonding",  MRS Symposium on "Thin Film Overlayers and Surfaces", December 1986.
  11. H. Song, R. L. Coble and R. H. French, "Effect of Strain on the Electronic Structure of Alumina and MgO",  American Ceramic Society Annual Meeting, April 1987.
  12. R. H. French and F. S. Ohuchi, "Oxygen Incorporation in AlN Thin Films: Optical Properties and Electronic Structure",   American Ceramic Society Annual Meeting, April 1987.
  13. F. A. Modine, C. Y. Allison, R. H. French, "Optical and Electrical Properties of Niobium and Tantalum Carbide",  Materials Research Society, April 1987.
  14. R. H. French, F. S. Ohuchi, "Use of Valence Band XPS for Electronic Structure Determination", Eastern Electron Spectroscopy Society, May 1987.
  15. R. H. French, R. L. Coble, R. V. Kasowski and F. S. Ohuchi, "Vacuum Ultraviolet, Photoemission and Theoretical Studies of the Electronic Structure of Al2O3 up to 1000°C",  International Conference on Electronic Structure and Phase Stability in Advanced Ceramics, August 1987.
  16. R. V. Kasowski, F. S. Ohuchi and R. H. French, "Metallization of AlN and Al2O3:  Theoretical and Experimental Study",  International Conference on Electronic Structure and Phase Stability in Advanced Ceramics, August 1987.
  17. D. P. Button, B. A. Yost, R. H. French, W. Y. Hsu, J. D. Bolt, M. A. Subramanian, H. M. Zhang, R. E. Geidd, A. G. Whittaker, D. G. Onn, "Thermally Conductive Composites With Low Dielectric Constants",  American Ceramic Society Meeting on Electronic Packaging, Denver, October, 1987.
  18. F. S. Ohuchi, R. H. French, "Effect of Oxygen Incorporation in AlN Thin Films",  American Vacuum Society, November 1987.
  19. R. H. French, D. J. Jones, D. P. Button, W. Y. Hsu, D. G. Onn, H. M Zhang, R. E. Geidd, O. Guerrero,  “Property Relationships in Polymer Ceramic Composites",  Engineering Foundation Meeting on Advanced Materials and Processes for High Density Packaging, Santa Barbara, CA, March 1988.
  20. D. G. Onn, H. M. Zhang, R. E. Geidd, O. Guerrero, W. Y. Hsu, R. H. French, "Percolation Effects in the Thermal Diffusivity of Polymer/Ceramic Composite Systems",  American Ceramic Society, May 1988.
  21. F. N. Tebbe, P. A. Morris, R. H. French, U. Chowdhry, R. L. Coble, "The Purity of Aluminum Hydroxide Derived From Triethylaluminum",  International Forum on Sintering of Advanced Ceramics, American Ceramic Society, Cincinnati, OH, May 1988.
  22. R. H. French, F. S. Ohuchi, C. T. Chen, J. W. Lin, "Electronic Structure of b-BaB2O4 and LiB3O5 : Experiment and Theory", American Ceramic Society Basic Science Fall Meeting, Symposium on Non-linear Optical Materials, San Francisco, October 21-23, 1988.
  23. R. H. French, "Vacuum Ultraviolet Spectroscopy of Ceramics", American Ceramic Society Electronics Division Fall Meeting, Symposium on Advanced Characterization Techniques for Ceramics, San Francisco, October 21-23, 1988.
  24. R. H. French, R. V. Kasowski, F. S. Ohuchi, D. J. Jones, H. Song, R. L. Coble, "Temperature Dependence of the Electronic Structure of MgO",  Symposium on Atomic Scale Calculations in Materials Science, Mater. Res. Soc. Fall Meeting, Boston, Nov. 29, 1988.
  25. R. H. French, D. J. Jones, H. Song, R. L. Coble, "High Temperature Electronic Structure of MgO",  Amer. Phys. Soc. Spring Meeting, St. Louis, March 20-24, 1989.
  26. J. D. Bolt, R. H. French, D. P. Button, W. Y. Hsu, D. J. Jones, B. A. Yost, "Polymer-Ceramic Composites: Optimizing Morphology, Microstructure and Materials Selection",  Mater. Res. Soc. Spring Meeting, San Diego, April 24-29, 1989.
  27. P. A. Morris, M. K. Crawford, R. H. French, M. G. Roelofs, J. D. Bierlein, J. B. Brown, "Defects in KTiOPO4",  Mater. Res. Soc. Spring Meeting, San Diego, April 24-29, 1989.
  28. V. C. Long, R. H. French, F. S. Ohuchi, R. V. Kasowski, "Electronic Structure of ZrO2 :  Phase Stabilizing Dopants", American Ceramic Society Annual Meeting, Indianapolis, Ind., April 23-27, 1989.
  29. M. L. Bortz, R. H. French, F. S. Ohuchi, "Optical Properties and Electronic Structure of MgAl2O4 ", American Ceramic Society Annual Meeting, Indianapolis, Ind., April 23-27, 1989.
  30. D. A. Bonnell, R. H. French, "Observation of Defect Mediated Photoconduction in Ceramics Through the Tunneling Response of STM", University of Pennsylvania STM Spring Workshop, May 1989.
  31. R. H. French, "Laser Plasma Sourced, Temperature Dependent, VUV Spectrophotometer using Dispersive Analysis",  Ninth International Conference on Vacuum Ultraviolet Radiation Physics, Honolulu, Hawaii, July 1989.
  32. R. H. French, M. L. Bortz, D. J. Jones, R. V. Kasowski, F. S. Ohuchi, "Temperature Dependence of the Electronic Structure of Oxides: Al2O3 , MgAl2O4  and MgO",  Ninth International Conference on Vacuum Ultraviolet Radiation Physics, Honolulu, Hawaii, July 1989.
  33. R. H. French, D. E. Ellis, F. S. Ohuchi, V. C. Long, W. Y. Ching, D. J. Lam, “Electronic Structure and Phase Stabilizing Dopants in ZrO2 : Experiment and Theory",  International Zirconia IV Symposium, Ceramic Science and Technology Congress, Anaheim, CA, Oct. 31 - Nov. 3, 1989.
  34. M. L. Bortz, R. H. French, D. J. Jones, R. V. Kasowski, F. S. Ohuchi, "Temperature Dependence of the Electronic Structure of MgO and a-Al2O3",  Symposium on Electronic Structure of Ceramics, American Ceramic Society, Dallas TX, April 1990. 
  35. R. H. French, M. K. Crawford, M. L. Bortz, R. D. Shannon, "Spectroscopic Determination of the Dielectric Constant of MgAl2O4 Spinel from 1011 to 1016 Hz",  Symposium on Electronic Structure of Ceramics, American Ceramic Society, Dallas TX, April 1990.
  36. R. H. French, F. S. Ohuchi, M. K. Crawford, P. A. Morris, "Optical Properties and Electronic Structure of KTiOPO4 Non-linear and Electro-optic Crystals",  American Physical Society, Anaheim, CA, March 1990.
  37. D. A. Bonnell, G. Rohrer, R. H. French, "Spatially Resolved Defect Analysis of Oxides by Photoconduction Scanning Tunneling Microscopy",  Symposium on Electronic Structure of Ceramics, American Ceramic Society, Dallas TX, April 1990. 
  38. B. K. Flint, R. D. Fancy, R. H. French, "Development of New VUV Optics, Instrumentation and a Laser Produced Plasma Source”,  Engineering Foundation Conference on Future Prospects and Applications of UV and VUV Lasers, Santa Barbara, CA, March 1990. 
  39. S. Loughin, R. H. French, G. A. Slack, J. B. Blum, "A Vacuum Ultraviolet Investigation of the Electronic Structure of Single- and Poly-crystalline Aluminum Nitride",   Symposium on Covalent Ceramics at the Materials Research Society Fall Meeting, December 1990.
  40. F. M. Schellenberg, R. L. Byer, R. H. French, R. D. Miller, S. Kano, Y. Takahashi, "Linear and Nonlinear Optics of Polysilanes",   33rd IUPAC International Symposium on Macromolecules, Montreal, Canada, July 1990. 
  41. D. A. Bonnell, G. S. Rohrer, R. H. French, "Tunneling Spectroscopy Analysis of Optically Active States in Wide Band Gap Semiconductors",  Fifth International STM Conference of the American Vacuum Society, Baltimore, Md., July 1990. 
  42. J. R. G. Thorne, R. M. Hochstrasser, R. H. French, J. S. Meth, R. D. Miller, "High Energy Optical Reflectivity and Electronic Structure of Polysilanes",  American Physical Society March Meeting, Cincinnati, OH, March 1991. 
  43. R. H. French, M. K. Crawford, R. D. Shannon, M. L. Bortz, "Dielectric Constant, Electronic Transitions and Photon Excitations of Magnesium Aluminate Spinel and Its Defects",  American Physical Society March Meeting, Cincinnati, OH, 1991. 
  44. R. H. French, R. Abou-Rahme, D. J. Jones, "Effect of OH on the Absorption Edge and Band Gap of SiO2 Fused Silica Glass",  American Ceramic Society Annual Meeting, Cincinnati, OH, April 1991. 
  45. S. Loughin, R. H. French, W. Y. Ching, G. A. Slack, J. B. Blum, "Experimental and Theoretical Determination of the Electronic Structure of AlN",  American Ceramic Society Annual Meeting, Cincinnati, OH, April 1991. 
  46. R. H. French, J. S. Meth, J. R. G. Thorne, R. M. Hochstrasser, R. D. Miller, "Vacuum Ultraviolet Spectroscopy of the Optical Properties and Electronic Structure of 5 Poly(di-n-alkylsilanes)",  Optical Probes of Conjugated Polymers, Snowbird, Utah, August 19-22, 1991. 
  47. R. H. French, "Role of High Temperature Electronic Structure in Radiation Enhanced Electrical Breakdown in a-Al2O3 ",  DOE Research Assistance Task Force Meeting on "Electrical Breakdown of Insulating Ceramics in a High Radiation Field", Vail, Colorado, May 28 - June 1 1991. 
  48. S. Loughin, R. H. French, W. Y. Ching, Y. N. Xu, G. A. Slack, J. B. Blum, "The Electronic Structure of Aluminum Nitride",  American Ceramic Society, Basic Science Division Fall Meeting on Atomic Bonding and Properties of Ceramics, Marco Is., Florida, October 1991. 
  49. L. E. McNeil, R. H. French, S. E. Loughin, "Raman and Photoluminescence Study of Aluminum Nitride",  American Physical Society March Meeting, Indianapolis, IN, 1992. 
  50. S. Loughin, R. H. French, L. E. McNeil, Y. N. Xu, W. Y. Ching, "Electronic Structure of Single Crystal and Polycrystalline Aluminum Nitride",  American Physical Society March Meeting, Indianapolis, IN, 1992. 
  51. R. H. French, D. J. Jones, "High Temperature Electronic Structure of a-Al2O3 to 2173 K",  American Physical Society March Meeting, Indianapolis IN, 1992. 
  52. R. H. French, S. Loughin, W. Y Ching, Y. N. Xu, G. A. Slack, J. B. Blum, "Analytical Critical Point Modeling and the Electronic Structure of AlN",  American Ceramic Society Annual Meeting, Minneapolis MN, April 1992. 
  53. R. H. French, D. J. Jones, "High Temperature Electronic Structure of a-Al2O3 to 2173 K",  American Ceramic Society Annual Meeting, Minneapolis MN, April 1992. 
  54. R. H. French, S. J. Glass, F. S. Ohuchi, Y. -N. Xu, W. Y. Ching, "Electronic Structure and Optical Properties of ZrO2 :Experiment and Theory",  10th International Conference on Vacuum Ultraviolet Radiation Physics, Paris, July 27-31, 1992. 
  55. R. H. French, D. J. Jones, "Temperature Dependence of the Electronic Structure and Interband Transitions of a-Al2O3 Up to 2173K",  10th International Conference on Vacuum Ultraviolet Radiation Physics, Paris, July 27-31, 1992. 
  56. S. Loughin, R. H. French, L. N. DeNoyer, Y. -N. Xu,. W. Y. Ching, L. E. McNeil, "Critical Point Analysis of the Optical Joint Density of States of Aluminum Nitride: Experiment and Theory",  10th International Conference on Vacuum Ultraviolet Radiation Physics, Paris, July 27-31, 1992. 
  57. P. A. Morris, M. K. Crawford, R. H. French, T. M. Baer, P. F. Bordui, "Relative Damage Susceptibilities of KTiOPO4 Crystals", CLEO, Anaheim, CA, May 11-15, 1992. 
  58. C. C. Torardi, R. H. French, M. K. Crawford, C. R. Miao, D. J. Jones, W. Liang, M. -H. Whangbo, W. J. Zegarski, "On the Excitation and Emission Mechanism in m' YTaO4  and Nb-Doped YtaO4 Phosphors",  Amer. Chemical Soc. Meeting, Denver, CO, Spring 1993. 
  59. R. H. French, S. Loughin, L. K. DeNoyer, "Analytical Critical Point Modeling of the Electronic Structure and Interband Transitions of Ceramics",  Annual Meeting, Amer. Ceram. Soc., Cincinnati, OH, April 1993. 
  60. Y. M. Chiang, L. A. Silverman, R. H. French, R. M. Cannon, "The Thin Glass Film Separating Conductive Grains in Thick-Film Resistors",  Annual Meeting, Amer. Ceram. Soc. Cincinnati, OH, April 1993. 
  61. H. Mullejans, J. Bruley, R. H. French, P. A. Morris, "Quantitative Electronic Structure Analysis of a-Al2O3 Using Spatially Resolved Valence Electron Energy-Loss Spectra", Electron Microscopy and Analysis Group (EMAG) Conference, Institute of Physics - Britain, Liverpool, England, September 1993. 
  62. H. Mullejans, J. Bruley, R. H. French, P. A. Morris, "Quantitative Electronic Structure Analysis of a-Al2O3 Using Spatially Resolved Valence Electron Energy-Loss Spectra", Materials Research Society Symposium on Determining Nanoscale Physical Properties of Materials by Microscopy and Spectroscopy, Boston, MA, Nov. 29 to Dec. 3, 1993. 
  63. Y. M. Chiang, L. A. Silverman, R. H. French, R. M. Cannon, "Microstructure and Grain Boundary Films in Thick-Film Resistors", International Symposium on Interfaces in Electronic Ceramics, PAC-RIM Meeting of American Ceramic Society, Hawaii, October 1993. 
  64. R. H. French, L. K. DeNoyer, L. E. Silverman, Y. M. Chiang, R. M. Cannon, "Calculation of Hamaker Constants for Intergranular Films from Vacuum Ultraviolet Interband Transition Strengths", Solid State Studies in Ceramics Gordon Conference, August 1993. 
  65. R. H. French, H. Mullejans, J. Bruley, S. L. Loughin, M. Walls, A. Howie, "Electronic Structure of MgO and a-Al2O3 Determined from Quantitative Analysis of Valence Energy Loss Spectra from Scanning Transmission Electron Microscopy", Solid State Studies in Ceramics Gordon Conference, August 1993.
  66. F. D. Kalk, R. H. French, H. U. Alpay, G. Hughes, “Attenuated Phase Shifting Photomasks Fabricated from Cr-Based Embedded Shifter Blanks", SPIE Conference on Photomasks, Japan, 1994. 
  67. R. H. French, S. L. Loughin, H. Muellejans, J. Bruley, P. A. Morris, “Interband Electronic Structure Determined from Quantitative Analysis of Spatially Resolved Valence Electron Energy Loss Spectra of a-Al2O3", American Ceramic Society Annual Meeting, Indianapolis, IN, April 24-28, 1994.  
  68. H. Ackler, Y.-M. Chiang, R. H. French, "Thin Intercrystalline Glass Films in Model Binary and Ternary Systems", American Ceramic Society Annual Meeting, Indianapolis, IN, April 24-28, 1994. 
  69. Y.-M. Chiang, J.-R. Lee, H. D. Ackler, L. A. Silverman, R. H. French, R. M. Cannon, "Microstructure and Properties of Glass-Crystal Composites: Examples in Thick Film Resistors and ZnO Varistors”,  American Ceramic Society, Electronics Division Fall Meeting, Symposium on Science and Technology of Hybrid Microelectronics, 1994. 
  70. B. Johs, R. H. French, F. D. Kalk, W. A. McGahan, J. A. Woollam, "Optical Analysis of Complex Multilayer Structures Using Multiple Data Types", SPIE International Symposium on Optical Interference Coatings, Grenoble, France, June 1994. 
  71. F. D. Kalk, R. H. French, H. U. Alpay, G. Hughes, "Cr-Based Attenuated Embedded Shifter Pre-Production", 14th Annual BACUS Symposium on Photomask Technology 94, Sponsored by SPIE, Santa Clara, CA, Sept. 1994. 
  72. F. D. Kalk, G. Wojcik, J. Mould, R. H. French, “Comparison of Modeling and Experiment in Attenuated Phase Shifting Mask Optical Linewidth Metrology”, Microlithography 95, Sponsored by SPIE, Santa Clara  CA, Feb. 1995.
  73. E. S. Thiele, R. H. French, T. M. Spitler, J. Mould, G. L. Wojcik, “Light Scattering from High Index Spheres using Analytical and Finite Element Methods”, American Ceramic Society Annual Meeting, Symposium on Computational Modeling of Materials, Ohio, April 1995. 
  74. R. H. French, C. Scheu, G. Duscher, H. Müllejans, M. J. Hoffman, “Full Spectral Hamaker Constants for Si3N4 Intergranular Films From Vacuum Ultraviolet and Spatially Resolved Electron Energy Loss Spectroscopy”, American Ceramic Society Annual Meeting, Symposium on Interfaces, Ohio, April 1995.
  75. H. Müllejans, R. H. French, “Electronic Structure of Grain Boundaries in Al2O3 Determined by Spatially Resolved Valence Electron Energy Loss Spectroscopy”, American Ceramic Society Annual Meeting, Symposium on Interfaces, Ohio, April 1995.
  76. Y. M. Chiang, J. R. Lee, T. D. Chen, H. L. Tuller, R. H. French, R. M. Cannon, “Controlling Solute Coverage at ZnO Grain Boundaries”, American Ceramic Society Annual Meeting, Symposium on Interfaces, Ohio, April 1995.
  77. R. Argento, R. H. French, “Force Displacement Curves for AFM Tips”, American Ceramic Society, Basic Science Fall Meeting on Controlling Complex Microstructures, New Orleans, Louisiana, November 7, 1995. 
  78. E. S. Thiele, R. H. French, B. S. Hsiao, P. K. Davies, “Computational Modeling of Small Angle X-ray Scattering by Layered Microstructures”, American Ceramic Society, Basic Science Fall Meeting on Controlling Complex Microstructures, New Orleans, Louisiana, November 7, 1995.
  79. H. D. Ackler, Y. M. Chiang, R. H. French, “Comparisons of Hamaker Constants for Ceramic Systems with Intervening Vacuum or Water: From Force Laws and Physical Properties”, American Ceramic Society, Basic Science Fall Meeting on Controlling Complex Microstructures, New Orleans, Louisiana, November 7, 1995.
  80. R. H. French, M. F. Lemon, “Design of Embedded Phase Shifter Photomask Blanks From Depthwise Grading of Optically Inhomogeneous Thin Films of Cr-OxCyNz Compounds”, American Ceramic Society, Basic Science Fall Meeting on Controlling Complex Microstructures, New Orleans, Louisiana, November 7, 1995.
  81. W. Y. Ching, Y.-N. Xu, R. H. French, “First-principles Calculation of the Optical Properties of Crystalline Poly(di-n-hexylsilane)”,  American Physical Society March Meeting, St. Louis, MO, March 1996.
  82. R. M. Cannon, R. H. French, “Single and Dual Oscillator Models for Dielectric Functions and Dispersion Forces Acting Across Interfaces”, American Ceramic Society, Annual Meeting, Indianapolis, April 1996.
  83. S. Loughin R. H. French, A. Pfleiderer, H. Mullejans, “Critical Point Modeling as a Tool for Extraction of Quantitative Electronic Structure Information From Valence Electron Energy Loss Spectra”, American Ceramic Society, Annual Meeting, Indianapolis, April 1996.
  84. C. Argento, R. H. French, “Modeling AFM Probe Interactions”, American Ceramic Society, Annual Meeting, Indianapolis, April 1996.
  85. R. H. French, P. F. Carcia, K. G. Sharp, J. S. Meth, B. W. Smith, R. M. Cannon, “New Materials Families for 193 nm and DUV Attenuating Embedded Phase Shift Photoblanks”, Second International Conference on 193 nm Lithography, Colorado Springs, Colorado, July 1996. 
  86. P. F. Carcia, R. H. French, “Optical Superlattices - A Strategy for Designing Attenuating Embedded Phaseshift Masks for 193 nm”, Second International Conference on 193 nm Lithography, Colorado Springs, Colorado, July 1996.
  87. P. F. Carcia, R. H. French, K. G. Sharp, J. S. Meth, B. W. Smith, R. M. Cannon, “Materials Screening for Attenuating Embedded Phase Shift Photoblanks for DUV and 193 nm Photolithography”, 15th Annual BACUS Symposium on Photomask Technology 96, Sponsored by SPIE, Santa Clara, CA, Sept. 1996. 
  88. E. S. Thiele, R. H. French, “Computational Modeling of TiO2 Particle Optics Using a Finite Element Method”,  Paint Research Association, Nürnberg, Germany, April 1997. 
  89. R. H. French, H. Müllejans, D. J. Jones, G. Duscher, R. M. Cannon, “Intergranular Film Chemistry, Hamaker Constants and Dispersion Forces in Silicon Nitride”, Annual Meeting, American Ceramic Society, Cincinnati, OH, May 1997.  
  90. E. S. Thiele, R. H. French, “Robust Model-Building for Finite Element Analysis of Maxwell’s Equations”, Annual Meeting, American Ceramic Society, Cincinnati, OH, May 1997.
  91. R. H. French, P. F. Carcia, K. G. Sharp, J. S. Meth, B. W. Smith, R. M. Cannon, “New Materials Families for 193 nm and DUV Attenuating Embedded Phase Shifter Photomasks”, Annual Meeting, American Ceramic Society, Cincinnati, OH, May 1997.  
  92. H. Müllejans, R. H. French, G. Duscher, M. Rühle, “Improved Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and the Local Electronic Structure”, Microscopy and Microanalysis ’97, Cleveland, Ohio, 1997. 
  93. R. H. French, J. R. Smith, D. A. Bonnell, “Control of Optical Properties Through Composition and Compositional Gradients in Quasi-Ternary Cr-Based Oxycarbonitride Thin Films”, American Ceramic Society Annual Meeting, May 1998. 
  94. P.F. Carcia, R. H. French, G. Reynolds, G. Hughes, C. C. Torardi,  M. H. Reilly, M. Lemon, C. R. Miao, D. J. Jones, and L. Wilson, “Multilayer Attenuating Phase-Shift Photomask for 193 nm Lithography”, Fourth International 193 nm Lithography Conference, Telfs, Austria, September 1998. 
  95. G. A. M. Reynolds, R. H. French, P. F. Carcia, C. C. Torardi, Greg Hughes, D. J. Jones, M. F. Lemon, M. Reilly, L. Wilson, C. R. Miao, “TiSi-nitride attenuating phase-shift photomask for 193 nm lithography”, 1998 SPIE BACUS Conference, Santa Clara, CA, September 1998. 
  96. J. R. Smith, D. A. Bonnell, R. H. French, P. F. Carcia, “Local Composition and Electronic and Optical Properties of Cr Oxide Based Thin Films”,  American Vacuum Society International Symposium, Baltimore, MD, November 1998. 
  97. R. H. French, P.F. Carcia, G. Reynolds, G. Hughes, C. C. Torardi,  M. H. Reilly, M. Lemon, C. R. Miao, D. J. Jones, L. Wilson, “SiN/TiN Multilayers for 248 nm and 193 nm Phase Shift Lithography”,  American Ceramic Society Annual Meeting, Indianapolis, IN, April 1999.
  98. A. R. Hanuska, R. H. French, “Computational Optics of Resonant Anisotropic Spheroids”,  American Ceramic Society Annual Meeting, Indianapolis, IN, April 1999. 
  99. H. Müllejans, R. H. French, “Insights into the Electronic Structure of Ceramics Through Quantitative Analysis of Valence Electron Energy-loss Spectroscopy (VEELS)”, Microscopy Society of American Annual Meeting, Portland, Oregon, August 1999.
  100.  P. F. Carcia, R. H. French, G. Reynolds, G. Hughes, C. C. Torardi, M. H. Reilly, M. Lemon, C. F. Miao, D. J. Jones, L. Wilson, “Optical Superlattices as Phase-Shift Masks for Microlithography”, Engineered Nanostructural Films and Materials, SPIE Symposium on Optical Science, Engineering and Instrumentation, Denver, Colorado, July 18-23, 1999. 
  101. L. E. McNeil, A. R. Hanuska, R. H. French, “Near-field Scattering from Red Pigment Particles:  Absorption and Spectral Dependence”,  American Physical Society March Meeting, Minneapolis, March 2000. 
  102.  R. H. French, D. J. Jones, J. N. Hilfiker, R. Synowicki, R. C. Wheland, J. Feldman, A. E. Feiring, “Fluoropolymers for 157nm Lithography: Optical Properties from VUV Absorbance and Ellipsometry Measurements”,  SPIE Microlithography Conference, Santa Clara, March 2000.
  103.  M. K. Crawford, A. E.  Feiring, J. Feldman, R. H. French, M. Periysamy, F. L. Schadt, R. J. Smalley, F. C. Zumsteg, R. R. Kunz, V. Rao, S. M. Holl, “New Materials for 157-nm Photoresists: Characterization and Properties”,  SPIE Microlithography Conference, Santa Clara, March 2000. 
  104. M. K. Crawford, A. E. Feiring, J. Feldman, R. H. French,  D. J. Jones,  M. Periyasamy, V. A. Petrov, F. L. Schadt III, R. J. Smalley, R. C. Wheland, F. C. Zumsteg, “Materials Design of Novel Fluoropolymers for 157 nm Photoresists and Pellicles”, 1st International Symposium on 157 nm Lithography, Dana Point, California, May 2000. 
  105.  J. S. Gordon, R. H. French, “Status Report on Development of a 157 nm Pellicle”, 1st International Symposium on 157 nm Lithography, Dana Point, California, May 2000.
  106. R. H. French, A. R. Hanuska, L. E. McNeil, “Near Field Optics and Scattering by Ceramic/Polymer Particulate Dispersion”,  Fall Meeting of the Basic Science Division of the American Ceramic Society, Seattle, Washington, October 2000. 
  107. M. K. Crawford, A. E. Feiring, J. Feldman, R. H. French, M. Periyasamy, V. A. Petrov, F. L. Schadt III, R. J. Smalley, R. C. Wheland, F. C. Zumsteg, “Fluoropolymers for Semiconductor Manufacture”, Fluoropolymer 2000, sponsored by American Chemical Society, Savannah, Georgia, October 2000. 
  108.  J. R. Smith, R. H. French, D. A. Bonnell, “Cr Valence and Its Consequence on the Optical Properties of CrOCN Phase Shifting Photomasks”, Materials Research Society Meeting, Boston, December 2000. 
  109. M. K. Crawford, A. E. Feiring, J. Feldman, R. H. French, M. Periyasamy, V. A. Petrov, F. L. Schadt III, R. J. Smalley, F.C. Zumsteg,“157 nm Imaging Using Thick Single Layer Resists”, 2001 SPIE Meeting: “Advances in Resist Technology and Processing”, March 2001.  
  110. R. H. French, J. Gordon, D. J. Jones, M. F. Lemon, R. C. Wheland, E. Zhang, “Materials Design and Screening of Fluoropolymers for Use as Pellicles in 157nm Photolithography”, 2001 SPIE Meeting “Optical Microlithography XIV”, March 2001. 
  111. R. H. French, K. van Benthem, W. Sigle, C. Elsässer, “Valence Electron Energy Loss Study of Fe doped SrTiO3 and a S13 Boundary: Electronic Structure and Dispersion Forces”, American Ceramic Society Annual Meeting, Indianapolis, April 2001.
  112. M. K. Crawford, A. E. Feiring, J. Feldman, R. H. French, K. W. Leffew, V. A. Petrov, F. L. Schadt III, R. J. Smalley, F. C. Zumsteg, “Fluoropolymers For Use as Thick Single Layer Photoresists for 157 nm Photolithography”, 2nd International Symposium on 157nm Lithography”, Dana Point California, May 2001. 
  113. J. Gordon, R. H. French, R. C. Wheland, E. Zhang, D. J. Jones, M. F. Lemon, K. G. Sharp, W. Qiu, V. Liberman, “Development of Polymeric Pellicles for 157nm Photolithography”, 2nd International Symposium on 157nm Lithography”, Dana Point California, May 2001. 
  114. V. Liberman, M. Rothschild, J. H. C. Sedlacek, A. Grenville, R. H. French, “Behavior of Candidate Organic Pellicle Materials Under 157-nm Laser Irradiation”, 2002 SPIE Meeting “Optical Microlithography XV”, March 2002. 
  115. R. H. French, R. C. Wheland, W. Qiu., M. F. Lemon., E. Zhang., J. Gordon., V. Liberman., A. Grenville., R. Kunz., M. Rothschild, “157nm Pellicles: Polymer Design for Transparency and Lifetime”, 2002 SPIE Meeting “Optical Microlithography XV”, March 2002. 
  116. R. H. French, K. van Benthem, W. Sigle, C. Elsässer, “Bulk and Interfacial Electronic Structure of and London Dispersion Forces in SrTiO3”, American Ceramic Society Annual Meeting, St. Louis, April 2002. 
  117. M. K. Crawford, A. Feiring, J. Feldman, R. H. French, K. Leffew, F. Schadt, S. Petrov, W. Farnham, F. C. Zumsteg, R. Nassirpour, “Fluoropolymers for 157 nm Lithography: Performance of Single Layer Resists”, 19th Japan Conference of Photopolymer Science and Technology, International Symposium on Materials and Processes for Advanced Giga-bit scale Lithography, Chiba, Japan, June 2002. 
  118. A. E. Feiring, J. Feldman, F. L. Schadt III,  K.  W.  Leffew,  F.  C. Zumsteg,  M. K. Crawford,  R. H.  French,  R. C. Wheland, V. A. Petrov,  W. B. Farnham, “Design of Very Transparent Fluoropolymers for Semiconductor Manufacture at 157 nm”, American Chemical Society Symposium on Fluorine in Microlithography and Microchip Manufacture, Boston, August 2002.
  119. S. R. Lustig, E. D. Boyes, R. H. French, T. D. Gierke, M. A. Harmer, P. B. Hietpas, A. Jagota, G. P. Mitchell, K. D. Sams, “A Novel Process Methodology for Cutting Uniform Nanostructures”, AICHE Annual Meeting, Indianapolis, September 2002. 
  120. M. K. Crawford, W. Farnham, A. E. Feiring, J. Feldman, R. H. French, K. W. Leffew, S. Nassirpour, V. A. Petrov, F. L. Schadt III, R. J. Smalley, F. C. Zumsteg, “Fluoropolymer Resists for Single Layer 157 nm Lithography: Optimization of Their Combined Properties”, 3rd International Symposium on 157nm Lithography” Antwerp, Belgium, September 2002. 
  121. R, H. French, R, C. Wheland, M. F. Lemon, E. Zhang,  J. Gordon, “Fundamentals of Transparency in Fluoropolymers for use as 157nm Soft Pellicles”, 3rd International Symposium on 157nm Lithography” Antwerp, Belgium, September 2002. 
  122. L.-A. Chen, E. Thiele, E. P. Butler, R. H. French, “Computer Modeling of Light Scattering of Rutile Titanium Dioxide”, 2002 International Coatings Exhibition, New Orleans, October 2002. 
  123. R. H. French, L. K. Denoyer, K. van Benthem, W. Sigle, V. Adrian Parsegian, R. Podgornik, “Electronic Structure, Optical Properties, London Dispersion Forces and Full Spectral Hamaker Coefficients for Nanostructured Interfaces in Strontium Titanate”, Materials Research Society Fall Meeting, Boston MA, December 2002. 
  124. R. Getty, S. Percec, K. Sharp, P. Hietpas, G. Blackman, R. French, D. Bonnell, T. Alvarez, “Scanning Probe Microscopy of Self-Assembled Monolayers of Phenylene/Ethynylene Molecules”, Materials Research Society Fall Meeting, Boston MA, December 2002. 
  125. S. Percec, R. Getty, T. Alvarez, D. A. Bonnell, R. Shao, R. H. French, W. Marshal, “Synthesis and Surface Potential Investigations of Substituted Phenylene/Ethynylene Molecular Self-Assemblies”, 6th Engineering Foundation Conference on Molecular-Scale-Electronics, Key West Florida, December 2002. 
  126. A. E. Feiring, J. Feldman, F. L. Schadt III,  K.  W.  Leffew,  F.  C. Zumsteg,  M. K. Crawford,  R. H.  French,  R. C. Wheland, V. A. Petrov,  W. B. Farnham, “Design of Very Transparent Fluoropolymers for Semiconductor Manufacture at 157 nm”, 16th Winter Fluorine Conference, St. Petersburg Florida, January 2003. 
  127. R. Getty, S. Percec, P. Hietpas, R. H. French, D. Bonnell, T. Alvarez, R. Shao, Z. Hu, “Scanning Probe Microscopy of Self-Assembled Monolayers of Highly Conjugated Molecules”, Materials Research Society Spring 2003 Meeting, San Francisco, CA, April 2003. 
  128. M. K. Crawford, A. E. Feiring, J. Feldman, R. H. French, K. W. Leffew, V. A. Petrov, F. L. Schadt, F. C. Zumsteg, “Single layer fluoropolymer resists for 157-nm lithography”, SPIE Conference on Advances in Resist Technology and Processing XX, Santa Clara CA, February 2003. 
  129. S. R. Lustig, E. D. Boyes, R. H. French, T. D. Gierke, M. A. Harmer, P. B. Hietpas, A. Jagota, G. P. Mitchell, G. B. Onoa, K. D. Sams, “Novel Process Methodology for Uniformly Cutting Nanotubes”, Materials Research Society Spring 2003 Meeting, San Francisco, CA, April 2003. 
  130. G. Tan, M. F. Lemon, R. H. French, Y. M. Chiang, “Optical Properties, Interband Transitions and London Dispersion Forces For Surfaces and Interfaces of SiC and SiO2”, American Ceramic Society Annual Meeting.  Nashville, TN, April 2003. 
  131. S. Percec, R. R. Getty R. T. Alvarez, D. A. Bonnell, R. Shao, R. H. French, W. J. Marshall, “Self-Assembling Conjugated Oligomers for Nanoelectronic Applications”, Europolymer Congress, Royal Institute of Technology, Stockholm, Sweden, June 2003. 
  132. R. H. French, R. C. Wheland, W. Qiu, M. F. Lemon, P. Sheng, “Fluids for 157 nm Immersion Lithography”, 4th International Symposium on 157 nm Lithography, Yokohama, Japan, August 2003. 
  133. P. A. Zimmerman, D. Milller, G. Feit, A. Whittaker, D. Hill, F. Rasoul, H. Liu, I. Blakely, G. George, N. J.Turro, K. Lee, S. Jockusch,  A. Proctor, C. Garza, R. H. French, R. C. Wheland, “Understanding Degradation Mechanisms of Materials during Exposure at 157nm:  The Search for a New Soft Pellicle Solution”, 4th International Symposium on 157 nm Lithography, Yokohama, Japan, August 2003. 
  134. R. H. French, R. C. Wheland, W. Qiu, M. F. Lemon, P. Sheng, “157nm Immersion Lithography for Nanoscale Patterning:  Capabilities and Materials Needs” MRS Fall Meeting, Boston, December 2003. 
  135. G. L. Tan, L. K. Denoyer, R. H. French, A. Moro, M. Gautier-Soyer, Y. M. Chiang, “Characterization of the Electronic Structure and Optical Properties of Al2O3, ZrO2, and SrTiO3 from Analysis of Reflection Electron Energy Loss Spectroscopy in the Valence Region”, MRS Fall Meeting, Boston, December 2003. 
  136. M. Rothschild, M. Switkes, R. H. French, “Prospects for 157 nm Immersion Lithography”, International Sematech Immersion Workshop, Los Angeles, January 2004. 
  137. J. H. Burnett, S. G. Kaplan, J. Fuller, R. H French, M. F. Lemon, “Measurement of the Index Properties of Fluids for 193 nm and 157 nm Immersion Lithography”, International Sematech Immersion Workshop, Los Angeles, January 2004. 
  138. R. H. French, M. F. Lemon, R. C. Wheland, W. Qiu, S. Peng, C.-P. Chai Kao, M. P. Mawn, L. Lin, W. Farnham, M. Hung, W. O’Brien, S. Petrov, H. Shin, A. Sievert, R. R. Kunz, M. Switkes, R. Sinta, J. Curtin, 2002 SPIE Meeting “ Structure – Composition - Properties Relations for 157 nm Immersion Fluids” And R. H. French, M. K. Yang, M. F. Lemon, R. A. Synowicki, G. K. Pribil, G. Cooney, C. M. Herzinger S. E. Green, J. H. Burnett and S. Kaplan, “Immersion Fluid Refractive Index Using Prism Minimum Deviation Techniques”, SPIE Conference on Optical Microlithography XVII”, Santa Clara, February 2004. 
  139. K. Lee, S. Jockusch, N. J. Turro, R. H. French, R. C. Wheland, M. F. Lemon, A. M. Braun, T. Widerschpan, P. Zimmerman, “157 nm Pellicles for Photolithography: Mechanistic Investigation of the Deep UV Photolysis of Fluorocarbons”, SPIE Conference on Optical Microlithography XVII, Santa Clara, February 2004. 
  140. R. A. Synowicki, G. K. Pribil, G. T. Cooney, C. M. Herzinger, S. E. Green, R. H. French, M. K. Yang, J. H. Burnett, S. Kaplan, “Immersion Fluid Refractive Index Using Prism Minimum Deviation Techniques”, Electron, Ion and Photon Beam Technology and Nanofabrication (EIPBN), San Diego, June 2004. 
  141. S. Percec, R. R. Getty, G. Skidd, R. H. French, “Self-Assembled Monolayers Based on Substituted and Unsubstituted Phenylene Ethynylene Oligomers”, American Chemical Society Annual Meeting, Philadelphia, PA, August 2004. 
  142. S. Percec, R. R. Getty, G. Skidd, R. H. French, “Synthesis and Electrochemical Properties of Self-Assembling Monolayers of Substituted Oligomers of Phenylene Ethynylenes”, American Chemical Society Annual Meeting, Philadelphia, PA, August 2004. 
  143. R. R. Getty, S. Percec, G. Skidd, P. Lynch, R. H. French, S. Lustig, D. A. Bonnell, “Properties of Self-Assembled Monolayers from Oligomer Derivatives of Aromatic Ethynylenes”, American Chemical Society Annual Meeting, Philadelphia, PA, August 2004. 
  144. M. K. Crawford, W. B. Farnham, A. E. Feiring, R. H. French, K. W. Leffew, V. A. Petrov, F. L. Schadt III, H.V. Tran, , F. C. Zumsteg, “Commercially-Viable Fluoropolymer Resists for 157 nm and 193 nm Lithography”, International Symposium on Immersion and 157 nm Lithography, Vancouver, British Columbia, August 2004. 
  145. R. H. French, M. F. Lemon, M. K. Yang, S. Peng, W. Qiu, R. C. Wheland, “Structure – Composition - Property Relations Of 157 nm Immersion Lithography Fluids”  International Symposium on Immersion and 157 nm Lithography, Vancouver, British Columbia, August 2004. 
  146. R. H. French, M. F. Lemon, M. K. Yang, S. Peng, W. Qiu, R. C. Wheland, “Structure-Composition-Property Relations For Absorbance and Index of 157 nm Immersion Lithography Fluids”, MRS Fall Meeting, Boston, December 2004.
  147. A. E. Feiring, M. K. Crawford, W. B. Farnham, R. H. French, K. W. Leffew, V. A. Petrov, F. L. Schadt III and F. C. Zumsteg, “Advances in  fluoropolymer photoresists for semiconductor manufacture at 157 and 193 nm”, 17th Winter Fluorine Conference, St. Petersburg Beach, January 2005. 
  148. S. Peng, R. H. French, W. Qiu, R. C. Wheland, M. Yang, M. F. Lemon, K. Winey, “Second Generation Fluids for 193 nm Immersion Lithography”, SPIE Conference on Optical Microlithography, ML5754, San Jose, February 2005. 
  149. S. C. Fain, Jr., C. A. Polwarth, S. L. Tait, C. T. Campbell, M. K. Yang, R. H. French, “Quantitative Measurement of Adsorbed Metal Clusters by ncAFM”, 8th International Conference on Non-Contact Atomic Force Microscopy, Bad Essen (Germany) 15 to 18 August 2005. 
  150. S. Peng, R. H. French, W. Qiu, R. C. Wheland, M. K. Crawford, M. F. Lemon, M. K. Yang, “New Developments in Second Generation 193 nm Immersion Fluids for Lithography with 1.5 Numerical Aperture”, International Symposium On Immersion Lithography, Bruges, Belgium, September, 2005. 
  151. R. H. French, W. Qiu, M. K. Yang, R. C. Wheland, M. F. Lemon, M K. Crawford, H. V. Tran, J. Feldman, S. Mclain, S. Peng, “Second Generation Fluids for 193 nm Immersion Lithography” SPIE Conference On Optical Microlithography, San Jose CA, Feb. 19 to 24, 2006. 
  152. R. H. French, A. L. Shoe, R. C. Wheland, H. V. Tran, W. Qiu, J. Feldman, S. J. McLain, M. K. Yang, M. F. Lemon, D. J. Adelman, M. K. Crawford, “Second Generation Fluids for 193 nm Immersion Lithography: Optics, Imaging and Fluid Lifecycle”, IEEE Lithography Workshop, Prince Edward Island, Canada, August 2006.
  153. R. H. French, A. L. Shoe, R. C. Wheland, H. V. Tran, W. Qiu, J. Feldman, S. J. McLain, M. K. Yang, M. F. Lemon, D. J. Adelman, M. K. Crawford, “Second Generation Fluids for 193 nm Immersion Lithography: Optics, Imaging and Fluid Lifecycle”, International Symposium On Immersion Lithography, Kyoto, Japan, October 2006. 
  154. R. H. French, K. I. Winey, M. K. Yang, W. Qiu, “Fundamental Understanding of the van der Waals - London Dispersive Interactions of Polymers from Optical Properties Determined from Vacuum Ultraviolet Spectroscopy”, Materials Research Society Meeting, Boston, November / December 2006. 
  155. R. H. French, A. L. Shoe, R. C. Wheland, H. V. Tran, W. Qiu, J. Feldman, S. J. McLain, M. K. Yang, M. F. Lemon, D. J. Adelman, “High Index Immersion Lithography with Second Generation Immersion Fluids to Enable Numerical Apertures of 1.55 for Cost Effective 32 nm Half Pitches”, SPIE Conference on Optical Microlithography XX, San Jose, February 2007. 
  156. H. V. Tran, D. J. Adelman, L. W. Brubaker, J. Feldman, B. E. Fischel, B. B. Fones, R. H. French, M. Kaku, M. F. Lemon, M. Mocella, O. Nagao, W. Qiu, J. J. Schmieg, R. C. Wheland, M. K. Yang, “Evaluation of Next Generation Immersion Fluids for ArF Lithography Beyond Water”, Conference of Photopolymers Science and Technology, Chiba, Japan, June 2007. 
  157. R. H. French, H. V. Tran, D. J. Adelman, W. Qiu, J. Feldman, O. Nagao, M. Kaku, M. Mocella, R. C. Wheland, M. K. Yang, M. F. Lemon, L. Brubaker, B. Fones, B. E. Fischel, C. Y. Chen, “Cost Effective Single Exposure Immersion Lithography With Second Generation Immersion Fluids for Numerical Apertures of 1.55 and 32 nm Half Pitches”, Sematech International Symposium on Immersion Lithography, Keystone, Colorado, October 2007. 
  158. R. F. Rajter, R. H. French, “van der Waals - London Dispersion Interactions for Metallic and Semiconducting Carbon Nanotubes from ab initio Unixial Optical Properties”, Materials Research Society Fall Meeting, Boston, Nov. 2007. 
  159. R. H. French, H. V. Tran, D. J. Adelman, W. Qiu, J. Feldman, R. C. Wheland, M. Kaku, N. S. Rogado, C. Y. Chen, “High Index Immersion Fluids Enabling Cost-Effective Single-Exposure Lithography for 32 nm Half Pitches” SPIE Conference on Optical Microlithography XXI, San Jose, CA, February 2008. 
  160. R. Podgornik, R. F. Rajter, V. A. Parsegian, R. H. French, W. Y. Ching, “Single-walled Carbon Nanotubes: Interactions and Assembly”, Biophysical Society, 51st Annual Meeting, Baltimore, March 2007. 
  161. R. H. French, A. Bernfeld, H. V. Tran, D. Adelman, V. Liberman, M. Rothschild, E. Hendrickx, F. Van Roey, “High Refractive Index Fluid Evaluations: Fluid Radiation Durability Lifetimes and Fluid/Resist Interactions”, 5th International Symposium on Immersion Lithography, The Hague, Netherlands, September 2008. 
  162. R. H. French, J. M. Rodríguez-Parada, M. K. Yang, R. A. Derryberry, M. F. Lemon, M. J. Brown, C. R. Haeger, S. L. Samuels, E. C. Romano, R. E. Richardson, “Optical Properties of Materials for Concentrator Photovoltaic Systems”, 34th IEEE Photovoltaic Specialists Conference (PVSC), Philadelphia,  June 2009.
  163. R. H. French, J. M. Rodriguez-Parada, M. K. Yang, M. F. Lemon, E. C. Romano, P. Boydell, “Materials for Concentrator Photovoltaic Systems: Optical Properties and Solar Radiation Durability”, CPV6: International Conference on Concentrating Photovoltaics, Freiburg, Germany, April 2010 (submitted). 

Student Supervision
  1. Research Advisor, with Prof. R. T. Swimm, for M. E. Innocenzi, “A Study Of Room Temperature Optical Absorption In Undoped Aluminum-Oxide And Yttrium Aluminum Garnet”, Ph. D., University of Southern California. Graduated 1990. 
  2. Research Advisor, with Prof. R. L. Byer, for F. M. Schellenberg, “Linear And Nonlinear Spectroscopy In Polysilane Polymers”, Ph. D., Stanford University.  Ph. D. Granted 1991. 
  3. Ph.D. Thesis Advisor for S. Loughin, “Critical Point Analysis of the Interband Transitions of Electrons”, Department of Materials Science, University of Pennsylvania.  Graduated 1994. 
  4. Ph. D. Thesis Committee, with Prof. Y. M. Chiang, for Harold Ackler, “Thermodynamic Calculations and Model Experiments on Thin Intergranular Amorphous Films in Ceramics”, MIT.  Graduated October 1996. 
  5. Ph.D. Thesis Advisor for E. Thiele, “Scattering of Electromagnetic Radiation by Complex Microstructures in the Resonant Regime”, Department of Materials Science, University of Pennsylvania.  Graduated 1998. 
  6. Ph. D. Thesis Committee, with Prof. T. W. Coyle, for Hongmei Liao, “Stereolithography Using Compositions Containing Ceramic Powders”, University of Toronto.  Graduated February 1997. 
  7. Research Advisor, with Prof. Manfred Rühle and Harald Muellejans, for Albert Dorneich, “Spatially Resolved Electron Energy-loss Spectroscopy of Internal Interfaces in Ceramics”, Diplomarbeit, University of Stuttgart, Stuttgart, Germany, 1996. 
  8. Ph. D. Thesis Committee, with Prof. D. A. Bonnell, for Asa Frye, “Defect-induced Electrical/Optical Properties of SrTiO3-X (001) by Photo-assisted Tunneling Spectroscopy”, Department of Materials Science, University of Pennsylvania.  Graduated May 2000. 
  9. Ph. D. Thesis Co-Advisor, with Prof. D. B. Bonnell, for J. R. Smith, “The Relationship Between Bonding, Structure and Optical Properties in Reactive Sputter Deposited Chrome Oxycarbonitride”, Department of Materials Science, University of Pennsylvania.  Graduated May 2001. 
  10. Post Doctoral Research Advisor for Dr. Guolong Tan, University of Pennsylvania, 2002-2004. 
  11. Ph. D. Thesis Committee, with Prof. W. Craig Carter, for Richard F. Rajter, “Chirality-Dependent, van der Waals – London Dispersion Interactions of Carbon Nanotube Systems ”, Department of Materials Science, Massachusetts Institute of Technology. November 2008. 
  12. Ph. D. Thesis Committee, with Prof. D. A. Bonnell, for Christopher Rankin, “Atomic Polarization and Local Reactivity on Organic Ferroelectric Surfaces: Engineering Fluoropolymer Films for Ferroelectric Nanolithography”, Department of Materials Science, University of Pennsylvania.  Graduated May 2007. 
  13. Ph. D. Thesis Committee, with Prof. Shu Yang, for Yongan Xu, “Fabrication of High Fidelity, High Index 3D Photonic Crystals Using a Templating Approach”, Department of Materials Science, University of Pennsylvania, final defense October 2009.
  14. Ph. D. Thesis Committee, with Prof. Russ Composto, for Michael Hore, “Ordering and Alignment of Gold Nanorods in Thin Polymer Films: Plasmonic Optical Properties and Rod-Rod Interactions”, Department of Materials Science, University of Pennsylvania.  Anticipated in 2010. 

 

Professional Activities
  1. 1986-8, Research Affiliate at M. I. T. to conduct and oversee research with Prof. R. L. Coble and Dr. H. P. Jenssen of the Crystal Physics Laboratory.
  2. Session Chair, Symposium on Non Linear Optics, Amer. Ceram. Soc. Basic Science Fall Meeting, San Francisco, Oct. 21-23, 1988.
  3. Session Chair, Basic Science Division, American Ceramic Society Annual Meeting, Indianapolis, IN, April 1989.
  4. Session Chair, Zirconia IV meeting, International Ceramic Congress, Anaheim, CA., Nov. 1989.
  5. Program Chair, Symposium on Electronic Structure of Ceramics, sponsored by the Basic Science, Electronics, and Engineering Ceramics divisions of the American Ceramic Society, 92nd Annual Meeting of the American Ceramic Society, Dallas, TX, April 22 to 26, 1990.
  6. Associate Editor, Journal of the American Ceramic Society, Topical Issue on Electronic Structure of Ceramics, 73, 11, (1990).
  7. Session Chair, Basic Science Division, American Ceramic Society, Annual Meeting, Cincinnati, OH, 1991. 
  8. Committee Member, Intersociety Liaison, American Ceramic Society, 1991-92. 
  9. Session Chair, American Ceramic Society Basic Science Division Fall Meeting, 1991. 
  10. D. O. E. Research Assistance Task Force Member for Basic Energy Sciences and Fusion Energy Office, on "Radiation Enhanced Electrical Degradation of Ceramics", Vail, CO, May 1991.  Report published in Journal of Nuclear Materials.
  11. Program Chair, Symposium on "Bulk and Interfacial Electronic Structure of Ceramics", 94th Annual Meeting of the American Ceramic Society, Minneapolis, MN, 1992. 
  12. National Science Foundation, Materials Research Lab Program, Mail Reviewer and Site Review Panel, 1992. 
  13. Program Chair, International Workshop on the "Science of Al2O3" Schloss Ringberg, Max Planck Institut, Germany, March 15 to 19, 1993. 
  14. Associate Editor, Topical Issue on "Science of Al2O3", Journal of the American Ceramic Society, 1993. 
  15. Program Chair, International Workshop on the "Interfaces in Ionic Materials", Schloss Ringberg, Max Planck Institut, Germany, March  1994.
  16. Program Chair, International Workshop on the "Atomic Bonding and Spectroscopy of Internal Interfaces", Schloss Ringberg, Max Planck Institut, Germany, April 1995.
  17. Associate Editor, Topical Issue on "Atomic Bonding and Spectroscopy of Internal Interfaces”, Journal of Physics D, 29, July 1996. 
  18. Program Chair, Fall Basic Science Division Meeting, “Microstructure: Controlling Complexity”, American Ceramic Society, New Orleans, LA, November 1995. 
  19. Program Chair, with W. Craig Carter, Annual Meeting, Basic Science Division, American Ceramic Society, April 1996. 
  20. Associate Editor, Journal of the American Ceramic Society, since 1989. 
  21. Adjunct Professor in Materials Science and Engineering, University of Pennsylvania, since 1996. 
  22. Vice Chairman, Gordon Research Conference on Solid State Studies in Ceramics, July 1996. 
  23. Chairman, with Carol Handwerker, Gordon Research Conference on Solid State Studies in Ceramics, “New Perspectives on Interfacial Science: From Fundamentals to Practice”, August 1997. 
  24. Officer of the Basic Science Division, American Ceramic Society, 1997 to 2001. 
  25. Participant, Semiconductor Industry Association Roadmap Committee, Technology Working Group on Lithography, 1999 roadmap revision. 
  26. International Organizing Committee, International Workshop on Ceramic and Bimaterial Interfaces: Designing For Properties, Seville, Spain, September 1999. 
  27. Guest Editor, Topical Issue on Ceramic and Bimaterial Interfaces: Designing For Properties, Acta Materialia, 2000. 
  28. Member of the Board of Directors of the American Ceramic Society, May 2000 to May 2002. 
  29. Session Chair, International Symposium on Advanced Nitrides, American Ceramic Society, Annual Meeting, Indianapolis IN, 2001. 
  30. Member, American Ceramic Society Meetings Committee - Long Range Planning, 2001-2004. 
  31. International Organizing Committee, International Materials Conference on Ceramic and Metal Interfaces: Control at the Atomic Level, Oviedo, Spain, June 2002. 
  32. Member of the Board of Directors of the American Ceramic Society, May 2002 to May 2003.
  33. Member of Committee of Visitors for the Materials Sciences and Engineering Programs in the Office of Basic Energy Sciences of the U.S. Department of Energy, March 2003. 
  34. Symposium Organizer, “Ceramics and Technology Roadmaps: Opportunities in Industry, Technology and Research”, American Ceramic Society 2004 Annual Meeting, Indianapolis, 2004. 
  35. Teaching: UPenn EAS 210 (Prof. K. I. Winey) “Introduction to Nanotechnology”; 1 lecture on “Materials For Moore’s Law: Nanostructures Galore”.  February 2004. 
  36. Teaching: UPenn MSE 465/565 (Prof. D. A. Bonnell) “Fabrication and Characterization of Micro and Nanostructured Materials”; two week class segment on “Semiconductor Micro/Nanofabrication Materials For Moore’s Law”, including 1 week lab class using Prolith® computational optics software for lab class in lithographic printing.  November 2004. 
  37. Teaching: UPenn MSE 330 (Prof. S. Yang) “Soft Materials”; 1 lecture on “Soft Materials In Semiconductor Photolithography”.  December 2004. 
  38. Meeting Trustee, Wilmington Monthly Meeting Of Friends, 2004-2012. 
  39. International Organizing Committee, “6th International Workshop on Interfaces: Interfaces by Design”, Santiago de Compostela, Spain, June 2005. 
  40. Appointed to the Council on Materials Science and Engineering of the Division of Materials Science and Engineering, United States Department of Energy, 2004-2007. 
  41. Teaching: UPenn MSE 465/565 (Prof. D. A. Bonnell) “Fabrication and Characterization of Micro and Nanostructured Materials”; two week class segment on “Semiconductor Micro/Nanofabrication Materials for Moore’s Law”, including 1 week lab class using Prolith® computational optics software for lab class in lithographic printing.  November 2005. 
  42. Established DuPont’s Apex Team Leader Network to accelerate research and technology development programs across DuPont, 2006. 
  43. Teaching: UPenn MSE 495/496 (Prof. William Graham) “Senior Design”; 1 lecture on “Successful Technology Development”.  Spring 2007. 
  44. Teaching: UPenn, MSE 465/565 (Prof. D. A. Bonnell) “Fabrication and Characterization of Micro and Nanostructured Materials”; two week class segment on “Semiconductor Micro/Nanofabrication Materials For Moore’s Law”, including 1 week lab class using Prolith® computational optics software for lab class in lithographic printing.  March 2007. 
  45. Session Chair, SPIE Conference on Optical Microlithography XX, February / March 2, San Jose, 2007. 
  46. Member of Program Committee, SPIE Conference on Optical Microlithography XXI, San Jose, 2008. 
  47. Chair, with V. A. Parsegian, of U. S. Dept. of Energy, Materials Science Council Workshop on Long Range Interactions In Nanoscale Science, Annapolis Md. October 2007. 
  48. Teaching: UPenn, MSE 495/496 (Prof. William Graham) “Senior Design”; 2 lecture on “Successful Technology Development”.  Fall 2007. 
  49. Teaching: UPenn, MSE 465/565 (Prof. D. A. Bonnell) “Fabrication and Characterization of Micro and Nanostructured Materials”; 2 ½  week class segment on “Semiconductor Micro/Nanofabrication Materials for Moore’s Law”, including 1 week lab class using Prolith® computational optics software for lab class in lithographic printing.  March 2008. 
  50. Reappointed to the Council on Materials Science and Engineering of the Division of Materials Science and Engineering, United States Department Of Energy, 2007-2009. 
  51. Teaching: UPenn, EMTM 667, Executive Master's in Technology Management of Penn Engineering and Wharton School, (Prof. D. A. Bonnell) “Nanotechnology”; 1 lecture on “Successful Technology Development A Case Study Of Attenuated Phase Shift Mask Research, Development, And Commercialization”.  April 2008.
  52. International Organizing Committee, “7th International Workshop on Interfaces: R. M. Cannon Memorial Workshop, New Materials Via Interfacial Control”, Santiago de Compostela, Spain, June 2008. 
  53. Member of Program Committee, SPIE Conference on Optical Microlithography XXI, San Jose, 2009. 
  54. Kavli Institute for Theoretical Physics, University Of California at Santa Barbara, Program on “Theory and Practice of Fluctuation-Induced Interactions”, Invited participant, October 13-17, 2008. 
  55. Teaching: UPenn, EMTM 667, Executive Master's in Technology Management of Penn Engineering and Wharton School, (Prof. D. A. Bonnell) “Nanotechnology”; 1 lecture on “Successful Technology Development: A Case Study of Attenuated Phase Shift Mask Research, Development, and Commercialization”.  April 2009. 
  56. Teaching: UPenn, MSE 495/496 (Prof. William Graham) “Senior Design”; 2 lectures on “Successful Technology Development”.  Spring 2009. 
  57. Teaching: UPenn, MSE 465/565 (Prof. D. A. Bonnell) “Fabrication and Characterization of Micro and Nanostructured Materials”; three week class segment on “Semiconductor Micro/Nanofabrication Materials for Moore’s Law”, including 1 week lab class using Prolith® computational optics software for lab class in lithographic printing.  October 2008.
  58. Keynote Topic Editor, with Thomas Shaw, Annual Reviews of Materials Research, Volume on “Materials for CMOS and Beyond”,  July 2009. 
  59. Nominated for Position on U. S. Department of Energy, Basic Energy Sciences, Basic Energy Sciences Advisory Committee.  Fall 2009. 
  60. Materials and Metrology Breakout Leader for U. S. Department of Energy, Energy Efficiency and Renewable Energy, Photovoltaic Science and Technology, PV Technology Roadmap Workshop with SEMI-PV Group, San Francisco, July 2009.
   

Comment: (c) 2010 Roger H. French , frenchrh@lrsm.upenn.edu
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