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Roger Harquail FrenchAs of
Table of Contents
Award and Honors
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Patents
Refereed Publications1. R. H. French, R. Raj, "Use of the Double Torsion Method to Study
Crack Propagation in an Adhesive Layer", Journal
of Testing and Evaluation, 7, 3,
160-7 (1979).
2. R. H. French, H. P. Jenssen, and R. L. Coble, "High Temperature VUV
Spectrophotometer", Proc. of the 7th Int. Conf. on Vacuum Ultraviolet
Radiation Physics, Annals of the Israeli
Physical Society, 6, 1, 51-3
(1983).
3. R. H. French, R. L. Coble, "High Temperature Electronic Structure of
Single Crystal Sapphire", Proc. of the 7th Int. Conf. on Vacuum Ultraviolet
Radiation Physics, Annals of the Israeli
Physical Society, 6, 1, 261-63
(1983).
5. F. S. Ohuchi, R. H. French, R. V. Kasowski, "A Study of Room
Temperature Cu-Al2O3 and Cu-AlN Interfacial
Interactions", J. Vac. Sci. Technol.
A, 5, 4, 1175-7 (1987).
7. F. N. Tebbe, P. A. Morris, R. H. French, U. Chowdhry, R. L. Coble,
"Purity of Aluminum Hydroxide Derived From Triethylaluminum", Journal of The American Ceramic Society, 71, 4, C204-6 (1988).
8. R. V. Kasowski, F. S. Ohuchi and R. H. French, "Theoretical and
Experimental Studies of Cu Metallization of Al2O3", Physica
B, 150, 1-2, 44-46 (1988).
9. R. H. French, R. L. Coble, R. V. Kasowski and F. S. Ohuchi, "Vacuum
Ultraviolet, Photoemission and Theoretical Studies of the Electronic Structure
of Al2O3 up to 1000°C", Physica
B, 150, 1-2, 47-49 (1988).
10. H. Song, R. H. French, R. L. Coble, "Effect of Residual Strain on
the Electronic Structure of Alumina and Magnesia", Journal
of The American Ceramic Society, 72,
6, 990-94 (1989).
11. F. S. Ohuchi, R. H. French, "Effect of Oxygen Incorporation in AlN
Thin Films", J. Vac. Sci. Technol. A, 6, 3, 1695-6 (1988).
14. R. H. French, "Electronic Structure of a-Al2O3, with Comparison to AlON and AlN", Journal of the American Ceramic Society, 73, 3, 477-89 (1990). 15. R. H. French, "Laser-Plasma Sourced, Temperature Dependent VUV Spectrophotometer Using Dispersive Analysis" , Physica Scripta, 41, 4, 404-8 (1990). 16. M. L. Bortz, R. H. French, D. J. Jones, R. V. Kasowski, F. S. Ohuchi,
"Temperature Dependence of the Electronic Structure of Al2O3,
MgAl2O4 and MgO", Physica Scripta, 41, 4,
537-41 (1990).
17. R. H. French, R. V. Kasowski, F. S. Ohuchi, D. J. Jones, H. Song, R. L.
Coble, "Band Structure Calculations of the High-Temperature Electronic
Structure of Magnesium Oxide", Journal
of the American Ceramic Society, 73,
11, 3195-99 (1990).
21. D. J. Kraus, R. H. French, "Automatic Spectral Data Base and Archive
System for Optical Spectroscopy", Applied
Spectroscopy, 44, (7), 1221-26
(1990).
22. G. Rohrer, D. A. Bonnell, R. H. French, "Detection of Optically
Excited States in Wide Band Gap Semiconductors with Scanning Tunneling
Microscopy", Journal of the American
Ceramic Society, 73, 11, 3257-63
(1990).
23. Y. N. Xu, W. Y. Ching, R. H. French, "Self-consistent Band
Structures and Optical Calculations in Cubic Ferroelectric Perovskites", Ferroelectrics, 111,
23-32 (1990).
24. F. M. Schellenberg, R. L. Byer, R. H. French, R. D. Miller, "Vacuum-ultraviolet Spectroscopy of Dialkyl Polysilanes", Phys. Rev. B Rapid Communications, 43,
12, 10008-11 (1991).
25. D. A. Bonnell, G. S. Rohrer, R. H. French, "Tunneling Spectroscopic Analysis of Optically Active Wide Band-gap Semiconductors" , J. Vac. Sci. Technol., 9, 551-6 (1991). 26. L. E. McNeil, M. Grimsditch, R. H. French, "Vibrational Spectroscopy of Aluminum Nitride", J. Am. Ceram. Soc., 76, 1132-36 (1993). 27. R. H. French, J. S. Meth, J. R. G. Thorne, R. M. Hochstrasser, R. D.
Miller, "Vacuum Ultraviolet Spectroscopy of the Optical Properties and
Electronic Structure of Seven Poly(di-alkylsilanes)", Synthetic Metals, 50, 1-3, 499-508 (1992).
28. J. R. G. Thorne, R. M. Hochstrasser, J. M. Zeigler, A. Tilgner, H. P.
Trommsdorff, R. H. French, P. J. Fagan, R. D. Miller, "Optical Studies of
Polysilanes", Frontiers of Polymer
Research, edited by P. N. Prasad, J. K. Nigam, Plenum Press, 143-8 (1991).
29. J. R. G. Thorne, R. M. Hochstrasser, J. M. Zeigler, A. Tilgner, H. P.
Trommsdorff, R. H. French, P. J. Fagan, R. D. Miller, "Electronic and
Vibrational Excitations in Polysilanes and Oligomers", Mol.
Cryst. Liq. Cryst., 216, 13-9
(1992).
31. R. H. French, D. J. Jones, S. Loughin, "Interband Electronic
Structure of a-Al2O3 up to 2167 K", Journal of the
American Ceramic Society, 77,
412-22 (1994).
32. C. A. Handwerker, R. M. Cannon, R. H. French, "R. L. Coble: A
Retrospective", Journal of the
American Ceramic Society, 77,
293-7 (1994).
35. Y. M. Chiang, L. E. Silverman, R. H. French, R. M. Cannon, "The Thin
Glass Film between Ultrafine Conductor Particles in Thick Film Resistors", Journal
of the American Ceramic Society, 77,
1143-52 (1994).
36. S. Loughin, R. H. French, "Optical Functions of Aluminum
Nitride", Properties of Group III
Nitrides, edited by J. H. Edgar, Electronic Materials Information Service,
INSPEC, the Institution of Electrical Engineers, London, 175-89 (1994).
38. Y. Chen, F. W. Clinard, B. D. Evans, R. H. French, R. Gonzalez, J. J.
O'Dwyer, F. W. Wiffen, X. F. Zong, "Radiation Induced Electrical
Degradation of Ceramics", Journal of
Nuclear Materials, 217, 32-47
(1994).
40. S. -D. Mo, W. Y. Ching, R. H. French, “Electronic Structure of a Near S11
a-axis Tilt Grain Boundary in a-Al2O3” J. Amer. Ceram. Soc., 79,
627-33 (1996).
46. R. W. Johnson, E. S. Thiele, R. H. French, “Light Scattering Efficiency
of White Pigments: Titania-Coated Silica Relative to Rutile TiO2”, TAPPI
Journal, 80, 11, 233-39 (1997).
47. S. Loughin, R. H. French, “Aluminum Nitride (AlN)”, Handbook
of Optical Constants of Solids, Vol. III, edited by E. Palik, Academic
Press, 373-401 (1998).
53. E. S. Thiele, R. H. French, “Computation of Light Scattering by
Anisotropic Spheres of Rutile Titania”, Advanced
Materials, 10, 1271-76 (1998).
61. L. E. McNeil, A.R. Hanuska and R.H. French, “Orientation dependence in near-field scattering from TiO2 particles” Applied Optics, 40, 22, 3726-36, (2001). 62. K. van Benthem, C. Elsässer, R. H. French, “Bulk Electronic Structure of SrTiO3: Experiment and Theory”, Journal of Applied Physics, 90, 12, 6156-64, (2001). 64. M. K. Crawford, W. Farnham, A. E. Feiring, J. Feldman, R. H. French, K. Leffew, S. Nassirpour, V. A. Petrov, F. L. Schadt III, R. J. Smalley, and F. C. Zumsteg, “Fluoropolymers for 157 nm Lithography: Performance of Single Layer Resists”, Journal of Photopolymer Science and Technology, 15, 4, 677-89, (2002). 65.. A. Frye, R. H. French, D. A. Bonnell “Optical Properties and Electronic Structure of Oxidized and Reduced Single Crystal Strontium Titanate”, Zeitschrift für Metallkunde. 94, 3, (2003). 66. Roger H. French, Robert C. Wheland, Weiming Qiu, M. F. Lemon, Edward Zhang, Joseph Gordon, Viacheslav A. Petrov, Victor F. Cherstkov, Nina I.Delaygina, “Novel Hydrofluorocarbon Polymers for use as Pellicles in 157 nm Semiconductor Photolithography”, Journal of Fluorine Chemistry, 122, 63-80, 2003 67. A. E. Feiring, J. Feldman, F. L. Schadt III, K. W. Leffew, F. C. Zumsteg, M. K. Crawford, R. H. French. R. C. Wheland, V. A. Petrov, W. B. Farnham, “Design of Very Transparent Fluoropolymer Resists for Semiconductor Manufacture at 157 nm” Journal of Fluorine Chemistry, 122, 11-16, (2003). 68. Guolong Tan, Michael F. Lemon, Roger H. French, “Optical Properties and London Dispersion Forces of Amorphous Silica Determined by Vacuum Ultraviolet Spectroscopy and Spectroscopic Ellipsometry”, to be published Journal of the American Ceramics Society. 69. S. R. Lustig, E. D. Boyes, R. H. French, T. D. Gierke, M. A. Harmer, P. B. Hietpas, A. Jagota, G. P. Mitchell, G. B. Onoa, K. D. Sams, “Lithographically Cut Single-Walled Carbon Nanotubes with Controlled Length Distribution and End-Group Functionality”, to be published in Nanoletters.
Other Publications1. R. C. Koeller, R. H. French, R. Raj, "Use of Holographic
Interferometry to Study Crack Propagation in Metal-Plastic Composites",
Proc. of the Conf. on Failure Modes in Composites IV, TMS-AIME,
164-75 (1979).
2. R. H. French, R. L. Coble, "Temperature Dependence of the VUV
Optical Spectra and Band Structure of Al2O3",
Proceedings of the Topical Conference on Basic Properties of Optical Materials, National
Bureau of Standards Special Publication 697, 126-29 (1985).
3. P. A. Morris, R. H. French, R. L. Coble, F. N. Tebbe, U. Chowdhry,
"Clean-room and CO2-Laser Processing of Ultra High-Purity Al2O3",
Defect Properties and Processing of High-Technology Nonmetallic Materials, Materials
Research Society Proceedings, 60,
Pittsburgh, PA, 79-86 (1986).
4. D. P. Button, B. A. Yost, R. H. French, W. Y. Hsu, J. D. Bolt, M. A.
Subramanian, H. M. Zhang, R. E. Geidd, A. G. Whittaker, D. G. Onn,
"Ceramic-Fiber / Polymer Laminates : Thermally Conductive Composites With
Low Dielectric Constants", Ceramic Substrates and Packages for Electronic
Applications, Advances in Ceramics, published by the American Ceramic Society,
Westerville OH, 26, 353 - 73 (1989).
5. R. H. French, J. D. Bolt, "Polymer Ceramic Composites for Electronic
Packaging Applications", Advanced
Materials and Processes, 134, 1,
32-5 (1988).
6. R. H. French, J. B. Blum, "Electronic Structure and Conductivity of
Al2O3", Sintering of Advanced Ceramics, edited by C.
A. Handwerker, J. E. Blendell, W. Kaysser, Ceramic
Transactions , published by the American Ceramic Society, Westerville OH, 7. 111 -34 (1990).
7. R. H. French, "Vacuum Ultraviolet Spectroscopy of Ceramics",
Advanced Characterization Techniques for Ceramics, Ceramic
Transactions, 5, 406-19 (1989).
8. P. A. Morris, M. K. Crawford, A. Ferretti, R. H. French, M. G. Roelofs,
J. D. Bierlein, J. B. Brown, "Defects in KTiOPO4", Optical
Materials, Materials Research Society
Symposium Proceedings, 152,
95-101 (1989).
9. S. Loughin, R. H. French, G. A. Slack, J. B. Blum, "A Vacuum
Ultraviolet Investigation of the Electronic Structure of Single- and
Polycrystalline Aluminum Nitride", Extended Abstract for Symposium of the
Materials Research Society Fall 1990 Meeting on Covalent Ceramics.
10. F. M. Schellenberg, R. L. Byer, R. D. Miller, R. H. French, S. S. Kano,
Y. Takahashi, Y. Shiraki, R. Ito, "Linear and Nonlinear Optics of
Substituted Polysilanes", Inorganic and Organometallic Oligomers and Polymers, Proc. IUPAC
Symp. Macromol., edited by J. F. Harrod, R. M. Laine, Kluwer Academic
Publishers, Dordrecht and Boston, 73-95
(1991).
11. R. H. French, R. Abou-Rahme, D. J. Jones, L. E. McNeil, "Absorption
Edge and Band Gap of SiO2 Fused Silica Glass", Ceramic Transactions, Vol. 28, "Solid State Optical
Materials”, edited by Allan J. Bruce and Basavaraj V. Hiremath, American
Ceramic Society, Westerville OH, 63-80 (1992).
12. H. Muellejans, J. Bruley, R. H. French, P. A. Morris, "Quantitative
Electronic Structure Analysis of a-Al2O3 Using Spatially
Resolved Valence Energy-loss Spectra", Electron
Microscopy and Analysis Group (EMAG) of
Royal Microscopical Society Proceedings, edited by A. J. Craven, IOP
Publishing, Bristol UK, 59-62 (1993).
13. H. Mullejans, J. Bruley, R. H. French, P. A. Morris, "Quantitative
Electronic Structure Analysis of a-Al2O3 Using Spatially Resolved Valence Electron Energy-Loss Spectra", Mat.
Res. Soc. Symp. Proc., 332,
edited by M. Sarikaya, K. Wickramasighe, M. Isaacson, 169-176 (1994).
16. F. D. Kalk, R. H. French, H. U. Alpay, G. Hughes, "Chromium-Based
Attenuated Embedded Shifter Preproduction", 14th
Annual BACUS Symposium on Photomask Technology and Management, SPIE
Vol. 2322, edited by W. L. Brodsky, G. V. Shelden, 299-304 (1994).
17. R. H. French, C. Scheu, G. Duscher, H. Müllejans, M. J. Hoffmann, R. M.
Cannon, “Interfacial Electronic Structure and Full Spectral Hamaker Constants
of Si3N4 Intergranular
Films from VUV and SR-VEEL Spectroscopy”, Proceedings of the Symposium on
Structure and Properties of Interfaces in Ceramics, edited by D. Bonnell, U.
Chowdhry, M. Rühle, Materials Research Society, 243-258 (1995).
18. S. M. Gaspar Wilson, S. S. H. Naqvi, J. R. McNeil, H. M. Marchman, B.
Johs, R. H. French, F. D. Kalk, “Metrology of Etched Quartz and Chrome
Embedded Shift Gratings Using Scatterometry”, Integrated
Circuit Metrology, Inspection, and Process Control IX, SPIE
Vol. 2439, edited by M. H.
Bennett, 479-94 (1995).
20. E. S. Thiele, R. H. French, “Computational Modeling of TiO2 Particle Optics Using a Finite Element Method”, Proceedings
of the Paint Research Association, Germany (April 1997).
21. H. Müllejans, R. H. French, G. Duscher, M. Rühle, “Improved
Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and
the Local Electronic Structure”, Proceedings
of the Microscopy Society of America (August 1997).
23. P. F. Carcia, R. H. French, G. Reynolds, G. Hughes, C. C. Torardi, M. H.
Reilly, M. Lemon, C. R. Miao, D. J. Jones, L. Wilson, L. Dieu, “Optical
Superlattices as Phase-Shift Masks for Microlithography”, Engineered
Nanostructural Films and Materials, SPIE Vol. 3790, edited by A. Lakhtakia, R. F. Messier, 23-35 (1999).
27. R. M. Cannon, M. Rühle, M. J. Hoffmann, R. H. French, H. Gu, A. P.
Tomsia and E. Saiz, “Adsorption and Wetting Mechanisms at Ceramic Grain
Boundaries”, Grain Boundary Engineering
in Ceramics, ed T. Sakuma, L. Sheppard, Y. Ikuhara, Ceramic Transactions,
American Ceramics Society, Westerville Ohio 118, 427-44, (2000).
30. J. R. Smith, P. Graat, D. A. Bonnell, R. H. French, “Relation
between Local Composition, Chemical Environment and Phase Shift Behavior in
Cr-Based Oxycarbonitride Thin Films”, MRS Proceedings, January 2001.
31. Roger H. French, Robert C. Wheland, Joseph Gordon, Edward Zhang, “Optimizing Polymers to Increase Pellicle Lifetime and Transmission for 157-nm Lithography”, MICRO, Canon Communication LLC, Los Angeles CA, 79-93, (June, 2001). 32. Roger H. French, Jerald Feldman, Fredrick C. Zumsteg, Michael K. Crawford, Andrew E. Feiring, Joseph Gordon, Viacheslav A. Petrov, Frank L. Schadt III, Robert C. Wheland, Edward Zhang, “Progress in Materials Development for 157nm Photolithography: Photoresists and Pellicles”, Semiconductor Fabtech, ICG Publishing Ltd., London, Edition 14, 167-75, July 2001. 34. Roger H. French, Robert C. Wheland, Weiming Qiu, M. F. Lemon, Edward Zhang, Joseph Gordon, Vlad Liberman, Andrew Grenville, Rod Kunz, Mordechai Rothschild, “157nm Pellicles: Polymer Design for Transparency and Lifetime”, Optical Microlithography XV, SPIE 4691, 57, (2002). 35. Steven R. Lustig, Edward D. Boyes, Roger H. French, Timothy D. Gierke, Mark A. Harmer, Paula B. Hietpas, Anand Jagota, Greg P. Mitchell and Kerry D. Sams, “A Novel Process Methodology for Cutting Uniform Nanostructures”, AICHE 2002 Proceedings: Materials Processing in Nanoelectronics, (2002). 36. M. K. Crawford, W. B. Farnham, A. E. Feiring, J. Feldman, R. H.
French, K. W. Leffew, V. A. Petrov, W. Qiu, F. L. Schadt III, H.V. Tran, R. C. Wheland,
F. C. Zumsteg, “Single Layer Fluoropolymer Resists for 157 nm Lithography”, Advances
in Resist Technology and Processing XVIII , SPIE Vol. 5039,
(2003).
37. S. R. Lustig, E. D. Boyes, R. H. French, T. D. Gierke, M. A. Harmer, P.
B. Hietpas, A. Jagota, G. P. Mitchell, G. B. Onoa, K. D. Sams, “Novel Process
Methodology for Uniformly Cutting Nanotubes”, MRS Proceedings, Spring
2003 Meeting, (2003).
Invited Presentations and Seminars1. R. H. French, "Application of Vacuum Ultraviolet Absorption
Spectroscopy to Optical Materials", Crystal Physics and Opto-Electronics
Seminar Series, M. I. T., May 1986.
2. R. H. French, "Temperature Dependence of the Electronic Structure of
Al2O3 ", Solid State Division Seminar, Oak Ridge National Labs, June 1986.
3. R. H. French, "Vacuum Ultraviolet Spectroscopy of Ceramics and
Optical Materials", Institute for Physical Science and Technology Seminar,
University of Maryland, December 1986.
4. R. H. French, "VUV Spectroscopy of the Electronic Structure of
Ceramics", Department of Materials Science, University of Pennsylvania,
March 1988.
5. R. H. French, D. J. Jones, W. Y. Hsu, B. A. Yost, M. A. Subramanian,
"Percolation Effects in the Dielectric Properties of Polymer Ceramic
Composites", American Ceramic Society Annual Meeting, Cincinnati, OH, May
1988.
6. R. H. French, "Electronic Structure and Conductivity of Al2O3 ", International Forum on Sintering of Advanced Ceramics, American Ceramic
Society, Cincinnati, OH, May 1988.
7. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic
Structure of Ceramics", Univ. of S. Calif., Center for Laser Studies,
October 1988.
8. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic
Structure of Ceramics", Univ. of Calif. Berkeley, Materials Science Dept.,
October 1988.
9. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic
Structure of Ceramics", Univ. of Calif. Santa Barbara, Materials Dept.,
October 1988.
10. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic
Structure of Ceramics", Arizona State Univ., Dept. of Chemistry, October
1988.
11. R. H. French, "Optical Properties and Electronic Structure of
Ceramics". Two seminars, part
of Univ. of Pennsylvania graduate course on "Introduction to Ceramics”,
November 1988.
12. R. H. French, "Band Structure of Alumina", Case Western Reserve/NASA/DuPont Workshop on Alumina, Case Western
Reserve, January 1989.
13. R. H. French, "Optical Properties and Electronic Structure of
Ceramics". Two seminars, part
of M. I. T. graduate course on "Poly-Phase Ceramics", March 1989.
14. R. H. French, "Electronic Structure and Optical Properties of
Ceramics and Optical Materials", University of Missouri, Kansas City, April
1990.
15. R. H. French, "Temperature Dependent Electronic Structure and
Optical Properties of Ceramics", Naval
Research Lab, Complex Systems Theory Branch, Washington D. C., June 1990.
16. R. H. French, "Solid State Physics, Materials Science and
Ceramics", Wilmington Christian High School as part of Science Alliance
Summer Fellowship Program, October 1990.
17. R. H. French, "High Temperature Electronic Structure of
Ceramics", American Ceramic Society, Basic Science Division Fall Meeting on
Atomic Bonding and Properties of Ceramics, Marco Is., Florida, October 1991.
18. R. H. French, "Solid State Physics, Materials Science and
Ceramics", Wilmington Christian High School as part of Science Alliance
Summer Fellowship Program, October 1991.
19. R. H. French, "High Temperature Electronic Structure of Insulating
Oxides", University of North
Carolina, Chapel Hill, Physics and Astronomy Dept., February 1992.
20. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic
Structure and Interband Transitions of Ceramics: AlN, Al2O3,
and ZrO2", Max Planck Institute, Stuttgart, Germany, July 1992.
21. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic
Structure and Interband Transitions of Ceramics: AlN, Al2O3,
and ZrO2", Royal
Institution, London, England, July 1992.
22. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic
Structure and Interband Transitions of Ceramics: AlN, Al2O3,
and ZrO2", Cavendish
Laboratory, University of Cambridge, Cambridge, England, July 1992.
23. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic
Structure and Interband Transitions of Ceramics: AlN, Al2O3,
and ZrO2", Commissariat
a L'Energie Atomique, Saclay, France, August 1992.
24. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic
Structure and Interband Transitions of Ceramics: AlN, Al2O3,
and ZrO2", Univ. of
Virginia Physics Dept., September 1992.
25. R. H. French, "Solid State Physics, Materials Science and
Ceramics", Wilmington Christian High School as part of Science Alliance
Summer Fellowship Program, December 1992.
26. R. H. French, "Optical Spectroscopy and Electronic Structure of a-Al2O3",
International Symposium on the Science of a-Al2O3 held at Schloss
Ringberg, Germany, April 15 to 19, 1993.
27. R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic
Structure and Interband Transitions of Ceramics: AlN, Al2O3,
and ZrO2", Cornell
University, Materials Science Dept., October 1993.
28. R. H. French, "Electronic Structure and Interband Transitions of
Ceramics: Critical Point Analysis of AlN and Al2O3 , Hamaker Constants and Spatially-Resolved EELS", Materials Science Department, Massachusetts Institute of Technology,
January 1994.
29. R. H. French, "Interband Electronic Structure and Interfaces:
Bonding and Hamaker Constants", International Symposium on "Interfaces
in Ionic Materials" held at Schloss Ringberg, Germany, March 6 to 11, 1994.
30. R. H. French, "Embedded Phase Shifter Photomask Blanks: Materials
Development", International Symposium on "Interfaces in Ionic
Materials" held at Schloss Ringberg, Germany, March 6 to 11, 1994.
31. R. H. French, "Optical Properties and Electronic Structure of
Polysilanes and Other Materials", University
of Connecticut, Polymer Science Program, Institute of Materials Science, April
1994.
32. R. H. French, "Electronic Structure and Optical Properties of
Ceramics: Interatomic Bonding of AlN and a-Al2O3 and Design of Cr-OCN Compounds for Phase Shift Lithography", Two seminars
in Frontiers of Materials Science Course at University of New Mexico and Sandia
Advanced Materials Lab, September 1994.
33. R. H. French, "Spectroscopic Determination of Interfacial Electronic
Structure for Interatomic Bonding and Hamaker Constants", Symposium on
Structure and Properties of Interfaces in Ceramics, Materials Research Society
1994 Annual Fall Meeting, Boston, MA, December 1994.
34. R. H. French, “Quantitative Analysis of Spatially Resolved Valence
Electron Energy Loss Spectra for Electronic Structure and Bonding Studies of
Grain Boundaries and Thin Glass Films”, Materials
Science Department, University of California-Berkeley, January 1995.
35. R. H. French, “Quantitative Analysis of Spatially Resolved Valence
Electron Energy Loss Spectra for Electronic Structure and Bonding Studies of
Grain Boundaries and Thin Glass Films”, Physics
Department, University of Missouri-Kansas City, February 1995.
36. R. H. French, “Interfacial Electronic Structure and Bonding Studies of
Grain Boundaries and Thin Glass Films”, Materials
Science Seminar Series, Harvard University, March 1995.
37. R. H. French, “Quantitative Analysis of Spatially Resolved Valence
Electron Energy Loss Spectra for Electronic Structure and Bonding Studies of
Grain Boundaries and Thin Glass Films”, Symposium on Analytical Microscopy of
Ceramics, Microscopy Society of America, Kansas City, August 1995.
38. R. H. French, “Electronic Structure and van der Waals Dispersion Forces
for Intergranular Films in Ceramics”, Gordon Conference on Solid State Studies
in Ceramics, New Hampshire, July
23, 1995.
39. R. H. French, “Design and Development of Cr-OxCyNz Embedded Phase Shifter Photomask Blanks for I-Line Phase Shift Lithography”, Materials Department, University of California, Santa Barbara, February
1996.
40. R. H. French, “Interfacial Electronic Structure and Interband
Transitions: for Grain Boundary Bonding and Hamaker Constants of Intergranular
Films”, Materials Department,
University of California, Santa Barbara, February 1996.
41. R.
H. French, “Optical Property Based Electronic Structure Probes: Vacuum Ultra
Violet and Spatially Resolved-Valence Electron Energy Loss
Spectroscopies”, American Ceramic Society, Annual Meeting, Indianapolis, April
1996.
42. R. H. French, “Design and Development of Cr-OxCyNx,
Embedded Phase Shifter Photomask Blanks for I-line Phase Shift Lithography,
American Ceramic Society, Annual Meeting, Indianapolis, April 1996.
43. R. H. French, “Design and Development of Cr-OxCyNz Embedded Phase Shifter Photomask Blanks for I-Line Phase Shift Lithography” Metallurgy Division, National Institute for Standards and Technology,
April 1996.
44. R. H. French, “Design and Development of Cr-OxCyNz Embedded Phase Shifter Photomask Blanks for I-Line Phase Shift Lithography”, Physics Department, Johns Hopkins University, May 1996.
45. R. H. French, “Intergranular
Film Chemistry, Hamaker Constants and Dispersion Forces in Silicon Nitride”,
Third International Workshop on Interfaces: Wetting, Fracture and Chemistry of
Interfaces, University of Santiago, Santiago, Galicia, Spain, September 1996.
46. R. H. French, “Dispersion Forces, Hamaker Constants and Intergranular
Film Chemistry in Silicon Nitride”, Max
Planck Institut fur Metallforschung, Stuttgart, Germany, September 1996.
47. R. H. French, “Optical Property Based Electronic Structure Probes:
Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss
Spectroscopies”, Material Science Department, Northwestern University,
November 1996.
48. R. H. French, “Design and Development of Cr-OxCyNz Embedded Phase Shifter Photomask Blanks for I-Line Phase Shift Lithography”,
Material Science Department, Northwestern University, November 1996.
49. R. H. French, “Optical Property Based Electronic Structure Probes:
Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss
Spectroscopies”, Material Science Department, University of Washington,
February 1997.
50. R. H. French, “Optical Property Based Electronic Structure Probes:
Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss
Spectroscopies”, Material Science Department, University of Toronto, February
1997.
51. R. H. French, “Optical Property Based Electronic Structure Probes:
Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss
Spectroscopies”, Material Science Department, University of Pennsylvania,
February 1997.
52. R. H. French, “Optical Property Based Electronic Structure Probes:
Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss
Spectroscopies”, Material Science Department, Stevens Institute of Technology,
April 1997.
53. R. H. French, “VdW Dispersion Forces: An Electronic Structure and
Chemistry Perspective”, International Workshop on Interfaces in Alumina,
Schloss Ringberg, Germany, March 1998.
54. R. H. French, “Optical Property Based Electronic Structure Probes
Applied to Intergranular Films and Wetting in Silicon Nitride”, University of
Michigan, March 1998.
55. R. H. French, “Resonant Scattering of Electromagnetic Radiation by
Complex Particulate Microstructures”, International Workshop on Interfaces,
Santa Barbara, CA, April 1998.
56. R. H. French, “vdW Dispersion Forces: An Electronic Structure and
Chemistry Perspective”, Fulrath Award Presentation, American Ceramic Society
Annual Meeting, Cincinnati, OH, May 1998.
57. R. H. French, “Scattering of Electromagnetic Radiation by Complex
Microstructures in the Resonant Regime”, Max Planck Institut, Stuttgart,
Germany, December 1998.
58. R. H. French, “SiN/TiN Multilayers for 248 nm and 193 nm Phase Shift
Lithography”, Max Planck Institut, Stuttgart, Germany, December 1998.
59. R. H. French, “vdW Dispersion Forces: an Electronic Structure and
Chemistry Perspective”, Fulrath Award Seminar, Ceramic Society of Japan, Annual Meeting, Seikei
University, Kissyo-Ji, Tokyo, March 1999.
60. R. H. French, “vdW Dispersion Forces: an Electronic Structure and
Chemistry Perspective”, Kyoto University, Kyoto, Japan, March 1999.
61. R. H. French, “vdW Dispersion Forces: an Electronic Structure and
Chemistry Perspective”, Japan Fine Ceramics Center, Nagoya, Japan, March 1999.
62. R. H. French, “vdW Dispersion Forces: an Electronic Structure and
Chemistry Perspective”, Shonan Institute, Tokyo, Japan, March 1999.
63. R. H. French, “SiN/TiN Multilayers for 248nm and 193nm Phase Shift
Lithography”, Taiyo Yuden Research Center, Haruna, Gunma, Japan, March 1999.
64. R. H. French, “SiN/TiN Multilayers for 248nm and 193nm Phase Shift
Lithography”, Fujitsu VLSI Division, Mie, Japan, March 1999.
65. R. H. French, “Near Field Optics for Scattering of Electromagnetic
Radiation By Complex Particulate Microstructures”, Fujitsu VLSI Division, Mie,
Japan, March 1999.
66. R. H. French, “vdW Dispersion Forces: an Electronic Structure and
Chemistry Perspective”, NEC Corporate Research Labs, Tokyo, Japan, April 1999.
67. R. H. French, “vdW Dispersion Forces: an Electronic Structure and
Chemistry Perspective”, Waseda University and Fulrath Foundation, Tokyo,
Japan, April 1999.
68. R. H. French, “vdW Dispersion Forces: an Electronic Structure and
Chemistry Perspective”, University of Tokyo, Tokyo, Japan, April 1999.
69. R. H. French, “Near Field Optics for Scattering of Electromagnetic
Radiation By Complex Particulate Microstructures”, Gordon Research Conference
on Solid State Studies in Ceramics, August 1999.
70. R. H. French, “Near Field Optics of Resonant Scattering by Particulate
Systems”, Acta Materialia International Workshop on Ceramic and Bimaterial
Interfaces, Seville, Spain, September 1999.
71. R. H. French, “Near Field Optics and Scattering By Particulate
Dispersions”, Max Planck Institut, Stuttgart, Germany, September 1999.
72. R. H. French, “Near Field Optics and Scattering By Particulate
Dispersions”, Theoretical and Applied Physics Institute, Physics Department,
University of Stuttgart, Stuttgart, Germany, October 1999.
73. R. H. French, “Near Field Optics and Scattering By Particulate
Dispersions”, Ceramic and Materials Engineering Department, Rutgers
University, November 1999.
74. R. H. French, “vdW and London Dispersion Forces: an Electronic
Structure and Chemistry Perspective on Wetting Films”, Condensed Matter
Seminar Series, Harvard University, April 2000.
75. R. H. French, “Development of Novel Thin Films Materials and
Microstructures for Phase Shift Photomasks and Low k1 IC Lithography, American
Ceramic Society Annual Meeting, St. Louis, May 2000.
76. R. H. French, “Materials and Microstructure Design for Low k1,
Semiconductor Photolithography to Produce Sub-wavelength Features”,
Pennsylvania State University, Materials Science Departmental Seminar, December
2000.
77. R. H. French, “Materials and Microstructure Design for Low k1,
Semiconductor Photolithography to Produce Sub-wavelength Features”, Max Planck
Institut, Stuttgart, Germany, December 2000.
78. R. H. French, “vdW and London Dispersion Forces: an Electronic
Structure and Chemistry Perspective on Wetting Films”, Laboratory of Physical
and Structural Biology, National Institutes of Health, Bethesda MD, June 2001.
79. R.
H. French, “Materials For Moores Law”, Chesapeake Farms Conference on
Nanotechnology, August 2001.
80. R.
H. French, “Challenges in Metal-Ceramic Interfaces in Semiconductors for
Sub-90 nm and Sub 50nm Electronics”, CECAM Workshop on Ceramic-Metal
Interfaces: Progress and Challenges, Lyon France, October 2001.
81. R. H. French, “Optical Properties and Electronic Structure: London
Dispersion Forces and Intergranular Films in Ceramics”, Sevice de Physique et
Chimie, DSM-DRECAM-SPCSI CEA, Saclay France, October 2001.
82. R. H. French, “Optical Properties and Electronic Structure: London
Dispersion Forces and Intergranular Films in Ceramics”, Groupe Physique du
Metal, LTPCM/ENSEEG/CNRS, Grenoble France, October 2001.
83. R. H. French, “Materials For Moore’s Law: Nanostructures Galore”,
University of Washington, Materials Science Department Seminar, November 2001.
84. R. H. French, “Optical Properties and Electronic Structure of Bulk and
Interfacial Ceramics From VUV and VEELS Spectroscopy”, Lectures in MSE 590 -
Characterization of Minerals and Materials by Spectroscopic Techniques,
University of Washington, Materials Science Department, November 2001.
85. R. H. French, “Optical Properties and Electronic Structure: London Dispersion Forces and Intergranular Films in Ceramics”, University of Cambridge, Department of Materials Science and Metallurgy Seminar, January 2002. 86. R. H. French, “Materials For Moore’s Law”, Lecture in MSE 790 – Special Topics, University of Pennsylvania, Department of Materials Science, January 2002. 87. Roger H. French, Lin K. Denoyer, V.
Adrian Parsegian, Rudolf Podgornik, “London Dispersion Forces and Full
Spectral Hamaker Coefficients for Nanostructured Amorphous Films with Multilayer
or Graded Structures”, International Workshop on Ceramic and Metal Interfaces,
Oviedo Spain, June 2002.
88. Roger H. French, Lin K. Denoyer, V. Adrian
Parsegian, Rudolf Podgornik, “London Dispersion Forces and Full Spectral
Hamaker Coefficients for Nanostructured Amorphous Films with Multilayer or
Graded Structures”, Workshop on Nanostructured Amorphous Films, Massachusetts
Institute of Technology, Boston MA, August 2002.
89. R. H. French, Materials For Moore’s Law, Gordon Research Conference on
Solid State Studies in Ceramics, New Hampshire, August 2002.
90. Roger H. French, Robert C. Wheland, Weiming Qiu, M. F. Lemon, Edward Zhang, Joseph Gordon, “Novel Hydrofluorocarbon Polymers for use as Pellicles in 157 nm Semiconductor Photolithography”, American Chemical Society Symposium on Fluorine in Microlithography and Microchip Manufacture, Boston, August 2002. 91.. R. H. French, “Samuel Geijsbeek
Award Lecture: Development of Attenuating Phase Shift Materials and
Microstructures for Low k1 Semiconductor Photolithography” American
Ceramics Society Fall Meeting, Seattle, October 2002.
92. R. H. French, “Materials for Moore’s Law: Ceramic Opportunities”,
International Nanotechnology Symposium for World Young Ceramists" Kagoshima
Japan, January 23,24 2002. Kagoshima Japan.
93. R. H. French, “Electronic Structure, Optical Properties and Dispersion
Forces at Interfaces in Materials “, presented at the American Ceramics
Society Annual Meeting. Nashville
TN, April 2003.
Conference Presentations1. R. C. Koeller, R. H. French, R. Raj, "Use of Holographic
Interferometry to Study Crack Propagation in Metal-Plastic Composites", Conference of Failure Modes in Composites IV, TMS-AIME, 1979.
2. R. H. French, R. L. Coble, "High Temperature Electronic Structure of
Single Crystal Al2O3", 7th International Conference on Vacuum Ultraviolet Radiation Physics,
Jerusalem, Israel, August 1983.
3. R. H. French, H. P. Jenssen, and R. L. Coble, "High Temperature VUV
Spectrophotometer", 7th
International Conference on Vacuum Ultraviolet Radiation Physics, Jerusalem,
Israel, August 1983.
4. R. H. French, R. L. Coble, "High Temperature Electronic Structure of
Single Crystal Al2O3", 86th Annual Meeting, Amer. Ceram. Soc., Pittsburgh, Pennsylvania, May 3,
1984.
5. R. H. French, R. L. Coble, "Temperature Dependence of the VUV
Optical Spectra and Band Structure of Al2O3", Topical Conference on Basic Properties of Optical Materials, National
Bureau of Standards, May 1985.
6. R. H. French, R. L. Coble, "Measurement of the High Temperature Band
Gap of Al2O3 and Implications for High Temperature Conductivity", 87th Annual Meeting, Amer. Ceram. Soc., Cincinnati, Ohio, May 6, 1985.
7. P. A. Morris, R. H. French, R. L. Coble, F. N. Tebbe, U. Chowdhry,
"Clean-room and CO2-Laser
Processing of Ultra High-Purity Al2O3 ", Materials Research Society
Symposium on "Defect Properties and Processing of High-Technology
Nonmetallic Materials", December 1985.
8. F. A. Modine, C. Y. Allison, T. W. Haywood, R. H. French, "Optical
and Electrical Properties of Niobium Carbide", American Physical Society, Las Vegas, Nevada, April 4,
1986.
9. F. S. Ohuchi, R. H. French, R. V. Kasowski, "A Study of Room
Temperature Cu-Al2O3 and Cu-AlN Interfacial Reactions", American
Vacuum Society, Baltimore, November 1986.
10. F. S. Ohuchi, R. H. French, R. V. Kasowski, "Cu Deposition on Al2O3 and AlN Surfaces: Electronic Structure and Bonding", MRS Symposium on "Thin Film Overlayers and Surfaces", December
1986.
11. H. Song, R. L. Coble and R. H. French, "Effect of Strain on the
Electronic Structure of Alumina and MgO", American Ceramic Society Annual Meeting, April 1987.
12. R. H. French and F. S. Ohuchi, "Oxygen Incorporation in AlN Thin
Films: Optical Properties and Electronic Structure", American Ceramic Society Annual Meeting, April 1987.
13. F. A. Modine, C. Y. Allison, R. H. French, "Optical and Electrical
Properties of Niobium and Tantalum Carbide", Materials Research Society, April 1987.
14. R. H. French, F. S. Ohuchi, "Use of Valence Band XPS for Electronic
Structure Determination", Eastern Electron Spectroscopy Society, May 1987.
15. R. H. French, R. L. Coble, R. V. Kasowski and F. S. Ohuchi, "Vacuum
Ultraviolet, Photoemission and Theoretical Studies of the Electronic Structure
of Al2O3 up to 1000°C", International
Conference on Electronic Structure and Phase Stability in Advanced Ceramics,
August 1987.
16. R. V. Kasowski, F. S. Ohuchi and R. H. French, "Metallization of AlN
and Al2O3: Theoretical and Experimental Study", International Conference on Electronic Structure and Phase
Stability in Advanced Ceramics, August 1987.
17. D. P. Button, B. A. Yost, R. H. French, W. Y. Hsu, J. D. Bolt, M. A.
Subramanian, H. M. Zhang, R. E. Geidd, A. G. Whittaker, D. G. Onn,
"Thermally Conductive Composites With Low Dielectric Constants", American Ceramic Society Meeting on Electronic Packaging,
Denver, October, 1987.
18. F. S. Ohuchi, R. H. French, "Effect of Oxygen Incorporation in AlN
Thin Films", American Vacuum
Society, November 1987.
19. R. H. French, D. J. Jones, D. P. Button, W. Y. Hsu, D. G. Onn, H. M
Zhang, R. E. Geidd, O. Guerrero, “Property
Relationships in Polymer Ceramic Composites", Engineering Foundation Meeting on Advanced Materials and
Processes for High Density Packaging, Santa Barbara, CA, March 1988.
20. D. G. Onn, H. M. Zhang, R. E. Geidd, O. Guerrero, W. Y. Hsu, R. French,
"Percolation Effects in the Thermal Diffusivity of Polymer/Ceramic
Composite Systems", American
Ceramic Society, May 1988.
21. F. N. Tebbe, P. A. Morris, R. H. French, U. Chowdhry, R. L. Coble,
"The Purity of Aluminum Hydroxide Derived From Triethylaluminum", International Forum on Sintering of Advanced Ceramics, American Ceramic
Society, Cincinnati, OH, May 1988.
22. R. H. French, F. S. Ohuchi, C. T. Chen, J. W. Lin, "Electronic
Structure of b-BaB2O4 and LiB3O5 : Experiment and Theory", American Ceramic Society Basic Science Fall
Meeting, Symposium on Non-linear Optical Materials, San Francisco, October
21-23, 1988.
23. R. H. French, "Vacuum Ultraviolet Spectroscopy of Ceramics",
American Ceramic Society Electronics Division Fall Meeting, Symposium on
Advanced Characterization Techniques for Ceramics, San Francisco, October 21-23,
1988.
24. R. H. French, R. V. Kasowski, F. S. Ohuchi, D. J. Jones, H. Song, R. L.
Coble, "Temperature Dependence of the Electronic Structure of MgO", Symposium on Atomic Scale Calculations in Materials Science, Mater. Res.
Soc. Fall Meeting, Boston, Nov. 29, 1988.
25. R. H. French, D. J. Jones, H. Song, R. L. Coble, "High Temperature
Electronic Structure of MgO", Amer.
Phys. Soc. Spring Meeting, St. Louis, March 20-24, 1989.
26. J. D. Bolt, R. H. French, D. P. Button, W. Y. Hsu, D. J. Jones, B. A.
Yost, "Polymer-Ceramic Composites: Optimizing Morphology, Microstructure
and Materials Selection", Mater.
Res. Soc. Spring Meeting, San Diego, April 24-29, 1989.
27. P. A. Morris, M. K. Crawford, R. H. French, M. G. Roelofs, J. D. Bierlein,
J. B. Brown, "Defects in KTiOPO4", Mater. Res. Soc. Spring Meeting, San Diego, April 24-29, 1989.
28. V. C. Long, R. H. French, F. S. Ohuchi, R. V. Kasowski, "Electronic
Structure of ZrO2 : Phase Stabilizing Dopants",
American Ceramic Society Annual Meeting, Indianapolis, Ind., April 23-27, 1989.
29. M. L. Bortz, R. H. French, F. S. Ohuchi, "Optical Properties and
Electronic Structure of MgAl2O4 ", American Ceramic Society Annual Meeting, Indianapolis, Ind., April
23-27, 1989.
30. D. A. Bonnell, R. H. French, "Observation of Defect Mediated
Photoconduction in Ceramics Through the Tunneling Response of STM", University of Pennsylvania STM Spring Workshop, May 1989.
31. R. H. French, "Laser Plasma Sourced, Temperature Dependent, VUV
Spectrophotometer using Dispersive Analysis", Ninth International Conference on Vacuum Ultraviolet
Radiation Physics, Honolulu, Hawaii, July 1989.
32. R. H. French, M. L. Bortz, D. J. Jones, R. V. Kasowski, F. S. Ohuchi,
"Temperature Dependence of the Electronic Structure of Oxides: Al2O3 , MgAl2O4 and MgO", Ninth
International Conference on Vacuum Ultraviolet Radiation Physics, Honolulu,
Hawaii, July 1989.
33. R. H. French, D. E. Ellis, F. S. Ohuchi, V. C. Long, W. Y. Ching, D. J.
Lam, “Electronic Structure and Phase Stabilizing Dopants in ZrO2 : Experiment and Theory", International
Zirconia IV Symposium, Ceramic Science and Technology Congress, Anaheim, CA,
Oct. 31 - Nov. 3, 1989.
34. M. L. Bortz, R. H. French, D. J. Jones, R. V. Kasowski, F. S. Ohuchi,
"Temperature Dependence of the Electronic Structure of MgO and a-Al2O3", Symposium on Electronic Structure of Ceramics, American Ceramic Society,
Dallas TX, April 1990.
35. R. H. French, M. K. Crawford, M. L. Bortz, R. D. Shannon,
"Spectroscopic Determination of the Dielectric Constant of MgAl2O4 Spinel from 1011 to 1016 Hz", Symposium on Electronic Structure of Ceramics, American
Ceramic Society, Dallas TX, April 1990.
36. R. H. French, F. S. Ohuchi, M. K. Crawford, P. A. Morris, "Optical
Properties and Electronic Structure of KTiOPO4 Non-linear and Electro-optic Crystals", American Physical Society, Anaheim, CA, March 1990.
37. D. A. Bonnell, G. Rohrer, R. H. French, "Spatially Resolved Defect
Analysis of Oxides by Photoconduction Scanning Tunneling Microscopy", Symposium on Electronic Structure of Ceramics, American Ceramic Society,
Dallas TX, April 1990.
38. B. K. Flint, R. D. Fancy, R. H. French, "Development of New VUV
Optics, Instrumentation and a Laser Produced Plasma Source”, Engineering Foundation Conference on Future Prospects and Applications of
UV and VUV Lasers, Santa Barbara, CA, March 1990.
39. S. Loughin, R. H. French, G. A. Slack, J. B. Blum, "A Vacuum
Ultraviolet Investigation of the Electronic Structure of Single- and
Poly-crystalline Aluminum Nitride", Symposium on Covalent Ceramics at the Materials Research Society Fall
Meeting, December 1990.
40. F. M. Schellenberg, R. L. Byer, R. H. French, R. D. Miller, S. Kano, Y.
Takahashi, "Linear and Nonlinear Optics of Polysilanes", 33rd IUPAC International Symposium on Macromolecules, Montreal, Canada,
July 1990.
41. D. A. Bonnell, G. S. Rohrer, R. H. French, "Tunneling Spectroscopy
Analysis of Optically Active States in Wide Band Gap Semiconductors", Fifth International STM Conference of the American Vacuum Society,
Baltimore, Md., July 1990.
42. J. R. G. Thorne, R. M. Hochstrasser, R. H. French, J. S. Meth, R. D.
Miller, "High Energy Optical Reflectivity and Electronic Structure of
Polysilanes", American
Physical Society March Meeting, Cincinnati, OH, March 1991.
43. R. H. French, M. K. Crawford, R. D. Shannon, M. L. Bortz,
"Dielectric Constant, Electronic Transitions and Phonon Excitations of
Magnesium Aluminate Spinel and Its Defects", American Physical Society March Meeting, Cincinnati, OH, 1991.
44. R. H. French, R. Abou-Rahme, D. J. Jones, "Effect of OH on the
Absorption Edge and Band Gap of SiO2 Fused Silica Glass", American
Ceramic Society Annual Meeting, Cincinnati, OH, April 1991.
45. S. Loughin, R. H. French, W. Y. Ching, G. A. Slack, J. B. Blum,
"Experimental and Theoretical Determination of the Electronic Structure of
AlN", American Ceramic Society
Annual Meeting, Cincinnati, OH, April 1991.
46. R. H. French, J. S. Meth, J. R. G. Thorne, R. M. Hochstrasser, R. D.
Miller, "Vacuum Ultraviolet Spectroscopy of the Optical Properties and
Electronic Structure of 5 Poly(di-n-alkylsilanes)", Optical Probes of Conjugated Polymers, Snowbird, Utah, August 19-22,
1991.
47. R. H. French, "Role of High Temperature Electronic Structure in
Radiation Enhanced Electrical Breakdown in a-Al2O3 ", DOE Research Assistance
Task Force Meeting on "Electrical Breakdown of Insulating Ceramics in a
High Radiation Field", Vail, Colorado, May 28 - June 1 1991.
48. S. Loughin, R. H. French, W. Y. Ching, Y. N. Xu, G. A. Slack, J. B. Blum,
"The Electronic Structure of Aluminum Nitride", American Ceramic Society, Basic Science Division Fall Meeting
on Atomic Bonding and Properties of Ceramics, Marco Is., Florida, October 1991.
49. L. E. McNeil, R. H. French, S. E. Loughin, "Raman and
Photoluminescence Study of Aluminum Nitride", American Physical Society March Meeting, Indianapolis, IN, 1992.
50. S. Loughin, R. H. French, L. E. McNeil, Y. N. Xu, W. Y. Ching,
"Electronic Structure of Single Crystal and Polycrystalline Aluminum
Nitride", American Physical
Society March Meeting, Indianapolis, IN, 1992.
51. R. H. French, D. J. Jones, "High Temperature Electronic Structure of a-Al2O3 to 2173 K", American Physical
Society March Meeting, Indianapolis IN, 1992.
52. R. H. French, S. Loughin, W. Y Ching, Y. N. Xu, G. A. Slack, J. B. Blum,
"Analytical Critical Point Modeling and the Electronic Structure of AlN", American Ceramic Society Annual Meeting, Minneapolis MN, April 1992.
53. R. H. French, D. J. Jones, "High Temperature Electronic Structure of a-Al2O3 to 2173 K", American Ceramic
Society Annual Meeting, Minneapolis MN, April 1992.
54. R. H. French, S. J. Glass, F. S. Ohuchi, Y. -N. Xu, W. Y. Ching,
"Electronic Structure and Optical Properties of ZrO2 :Experiment and Theory", 10th
International Conference on Vacuum Ultraviolet Radiation Physics, Paris, July
27-31, 1992.
55. R. H. French, D. J. Jones, "Temperature Dependence of the Electronic
Structure and Interband Transitions of a-Al2O3 Up to 2173K", 10th
International Conference on Vacuum Ultraviolet Radiation Physics, Paris, July
27-31, 1992.
56. S. Loughin, R. H. French, L. N. DeNoyer, Y. -N. Xu,. W. Y. Ching, L. E.
McNeil, "Critical Point Analysis of the Optical Joint Density of States of
Aluminum Nitride: Experiment and Theory", 10th International Conference on Vacuum Ultraviolet Radiation Physics,
Paris, July 27-31, 1992.
57. P. A. Morris, M. K. Crawford, R. H. French, T. M. Baer, P. F. Bordui,
"Relative Damage Susceptibilities of KTiOPO4 Crystals",
CLEO, Anaheim, CA, May 11-15, 1992.
58. C. C. Torardi, R. H. French, M. K. Crawford, C. R. Miao, D. J. Jones, W.
Liang, M. -H. Whangbo, W. J. Zegarski, "On the Excitation and Emission
Mechanism in m' YTaO4 and
Nb-Doped YtaO4 Phosphors", Amer. Chemical Soc. Meeting, Denver, CO, Spring 1993.
59. R. H. French, S. Loughin, L. K. DeNoyer, "Analytical Critical Point
Modeling of the Electronic Structure and Interband Transitions of
Ceramics", Annual Meeting,
Amer. Ceram. Soc., Cincinnati, OH, April 1993.
60. Y. M. Chiang, L. A. Silverman, R. H. French, R. M. Cannon, "The Thin
Glass Film Separating Conductive Grains in Thick-Film Resistors", Annual Meeting, Amer. Ceram. Soc. Cincinnati, OH, April 1993.
61. H. Mullejans, J. Bruley, R. H. French, P. A. Morris, "Quantitative
Electronic Structure Analysis of a-Al2O3 Using Spatially Resolved Valence Electron Energy-Loss Spectra", Electron
Microscopy and Analysis Group (EMAG) Conference, Institute of Physics - Britain,
Liverpool, England, September 1993.
62. H. Mullejans, J. Bruley, R. H. French, P. A. Morris, "Quantitative
Electronic Structure Analysis of a-Al2O3 Using Spatially Resolved Valence Electron Energy-Loss Spectra", Materials
Research Society Symposium on Determining Nanoscale Physical Properties of
Materials by Microscopy and Spectroscopy, Boston, MA, Nov. 29 to Dec. 3, 1993.
63. Y. M. Chiang, L. A. Silverman, R. H. French, R. M. Cannon,
"Microstructure and Grain Boundary Films in Thick-Film Resistors",
International Symposium on Interfaces in Electronic Ceramics, PAC-RIM Meeting of
American Ceramic Society, Hawaii, October 1993.
64. R. H. French, L. K. DeNoyer, L. E. Silverman, Y. M. Chiang, R. M. Cannon,
"Calculation of Hamaker Constants for Intergranular Films from Vacuum
Ultraviolet Interband Transition Strengths", Poster, Solid State Studies in
Ceramics Gordon Conference, August 1993.
65. R. H. French, H. Mullejans, J. Bruley, S. L. Loughin, M. Walls, A. Howie,
"Electronic Structure of MgO and a-Al2O3 Determined from Quantitative Analysis of Valence Energy Loss Spectra from
Scanning Transmission Electron Microscopy", Poster, Solid State Studies in
Ceramics Gordon Conference, August 1993.
66. F. D. Kalk, R. H. French, H. U. Alpay, G. Hughes, “Attenuated Phase
Shifting Photomasks Fabricated from Cr-Based Embedded Shifter Blanks", SPIE
Conference on Photomasks, Japan, 1994.
67. R. H. French, S. L. Loughin, H. Muellejans, J. Bruley, P. A. Morris,
“Interband Electronic Structure Determined from Quantitative Analysis of
Spatially Resolved Valence Electron Energy Loss Spectra of a-Al2O3",
American Ceramic Society Annual Meeting, Indianapolis, IN, April 24-28, 1994.
68. H. Ackler, Y.-M. Chiang, R. H. French, "Thin Intercrystalline Glass
Films in Model Binary and Ternary Systems", American Ceramic Society Annual
Meeting, Indianapolis, IN, April 24-28, 1994.
69. Y.-M. Chiang, J.-R. Lee, H. D. Ackler, L. A. Silverman, R. H. French, R.
M. Cannon, "Microstructure and Properties of Glass-Crystal Composites:
Examples in Thick Film Resistors and ZnO Varistors”, American Ceramic Society, Electronics Division Fall Meeting, Symposium on
Science and Technology of Hybrid Microelectronics, 1994.
70. B. Johs, R. H. French, F. D. Kalk, W. A. McGahan, J. A. Woollam,
"Optical Analysis of Complex Multilayer Structures Using Multiple Data
Types", SPIE International Symposium on Optical Interference Coatings,
Grenoble, France, June 1994.
71. F. D. Kalk, R. H. French, H. U. Alpay, G. Hughes, "Cr-Based
Attenuated Embedded Shifter Pre-Production", 14th Annual BACUS Symposium on
Photomask Technology 94, Sponsored by SPIE, Santa Clara, CA, Sept. 1994.
72. F. D. Kalk, G. Wojcik, J. Mould, R. H. French, “Comparison of Modeling
and Experiment in Attenuated Phase Shifting Mask Optical Linewidth Metrology”,
Microlithography 95, Sponsored by SPIE, Santa Clara CA, Feb. 1995.
73. E. S. Thiele, R. H. French, T. M. Spitler, J. Mould, G. L. Wojcik,
“Light Scattering from High Index Spheres using Analytical and Finite Element
Methods”, American Ceramic Society Annual Meeting, Symposium on Computational
Modeling of Materials, Ohio, April 1995.
74. R. H. French, C. Scheu, G. Duscher, H. Müllejans, M. J. Hoffman, “Full
Spectral Hamaker Constants for Si3N4 Intergranular Films
From Vacuum Ultraviolet and Spatially Resolved Electron Energy Loss
Spectroscopy”, American Ceramic Society Annual Meeting, Symposium on
Interfaces, Ohio, April 1995.
75. H. Müllejans, R. H. French, “Electronic Structure of Grain Boundaries
in Al2O3 Determined by Spatially Resolved Valence Electron Energy Loss Spectroscopy”,
American Ceramic Society Annual Meeting, Symposium on Interfaces, Ohio, April
1995.
76. Y. M. Chiang, J. R. Lee, T. D. Chen, H. L. Tuller, R. H. French, R. M.
Cannon, “Controlling Solute Coverage at ZnO Grain Boundaries”, American
Ceramic Society Annual Meeting, Symposium on Interfaces, Ohio, April 1995.
77. R. Argento, R. H. French, “Force Displacement Curves for AFM Tips”,
American Ceramic Society, Basic Science Fall Meeting on Controlling Complex
Microstructures, New Orleans, Louisiana, November 7, 1995.
78. E. S. Thiele, R. H. French, B. S. Hsiao, P. K. Davies, “Computational
Modeling of Small Angle X-ray Scattering by Layered Microstructures”, American
Ceramic Society, Basic Science Fall Meeting on Controlling Complex
Microstructures, New Orleans, Louisiana, November 7, 1995.
79. H. D. Ackler, Y. M. Chiang, R. H. French, “Comparisons of Hamaker
Constants for Ceramic Systems with Intervening Vacuum or Water: From Force Laws
and Physical Properties”, American Ceramic Society, Basic Science Fall Meeting
on Controlling Complex Microstructures, New Orleans, Louisiana, November 7,
1995.
80. R. H. French, M. F. Lemon, “Design of Embedded Phase Shifter Photomask
Blanks From Depthwise Grading of Optically Inhomogeneous Thin Films of Cr-OxCyNz
Compounds”, American Ceramic Society, Basic Science Fall Meeting on
Controlling Complex Microstructures, New Orleans, Louisiana, November 7, 1995.
81. W. Y. Ching, Y.-N. Xu, R. H. French, “First-principles Calculation of
the Optical Properties of Crystalline Poly(di-n-hexylsilane)”, American Physical Society March Meeting, St. Louis, MO, March
1996.
82. R. M. Cannon, R. H. French, “Single and Dual Oscillator Models for
Dielectric Functions and Dispersion Forces Acting Across Interfaces”, American
Ceramic Society, Annual Meeting, Indianapolis, April 1996.
83. S. Loughin R. H. French A. Pfleiderer, H. Mullejans, “Critical Point
Modeling as a Tool for Extraction of Quantitative Electronic Structure
Information From Valence Electron Energy Loss Spectra”, American Ceramic
Society, Annual Meeting, Indianapolis, April 1996.
84. C. Argento, R. H. French, “Modeling AFM Probe Interactions”, American
Ceramic Society, Annual Meeting, Indianapolis, April 1996.
85. R. H. French, P. F. Carcia, K. G. Sharp, J. S. Meth, B. W. Smith, R. M.
Cannon, “New Materials Families for 193 nm and DUV Attenuating Embedded Phase
Shift Photoblanks”, Second International Conference on 193 nm Lithography,
Colorado Springs, Colorado, July 1996.
86. P. F. Carcia, R. H. French, “Optical Superlattices - A Strategy for
Designing Attenuating Embedded Phaseshift Masks for 193 nm”, Second
International Conference on 193 nm Lithography, Colorado Springs, Colorado, July
1996.
87. P. F. Carcia, R. H. French, K. G. Sharp, J. S. Meth, B. W. Smith, R. M.
Cannon, “Materials Screening for Attenuating Embedded Phase Shift Photoblanks
for DUV and 193 nm Photolithography”, 15th Annual BACUS Symposium on Photomask
Technology 96, Sponsored by SPIE, Santa Clara, CA, Sept. 1996.
88. E. S. Thiele, R. H. French, “Computational Modeling of TiO2 Particle Optics Using a Finite Element Method”, Paint Research Association, Nürnberg, Germany, April 1997.
89. R. H. French, H. Müllejans, D. J. Jones, G. Duscher, R. M. Cannon,
“Intergranular Film Chemistry, Hamaker Constants and Dispersion Forces in
Silicon Nitride”, Annual Meeting, American Ceramic Society, Cincinnati, OH,
May 1997.
90. E. S. Thiele, R. H. French, “Robust Model-Building for Finite Element
Analysis of Maxwell’s Equations”, Annual Meeting, American Ceramic Society,
Cincinnati, OH, May 1997.
91. R. H. French, P. F. Carcia, K. G. Sharp, J. S. Meth, B. W. Smith, R. M.
Cannon, “New Materials Families for 193 nm and DUV Attenuating Embedded Phase
Shifter Photomasks”, Annual Meeting, American Ceramic Society, Cincinnati, OH,
May 1997.
92. H. Müllejans, R. H. French, G. Duscher, M. Rühle, “Improved
Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and
the Local Electronic Structure”, Microscopy and Microanalysis ’97,
Cleveland, Ohio, 1997.
93. R.
H. French, J. R. Smith, D. A. Bonnell, “Control of Optical Properties Through
Composition and Compositional Gradients in Quasi-Ternary Cr-Based
Oxycarbonitride Thin Films”, American Ceramic Society Annual Meeting, May
1998.
94. P.F. Carcia, R. H. French, G. Reynolds, G. Hughes, C. C. Torardi, M. H. Reilly, M. Lemon, C. R. Miao, D. J. Jones, and L. Wilson,
“Multilayer Attenuating Phase-Shift Photomask for 193 nm Lithography”, Fourth International 193 nm Lithography Conference, Telfs,
Austria, September 1998.
95. G. A. M. Reynolds, R. H. French, P. F. Carcia, C. C. Torardi, Greg
Hughes, D. J. Jones, M. F. Lemon, M. Reilly, L. Wilson, C. R. Miao,
“TiSi-nitride attenuating phase-shift photomask for 193 nm lithography”,
1998 SPIE BACUS Conference, Santa Clara, CA, September 1998.
96. J. R. Smith, D. A. Bonnell, R. H. French, P. F. Carcia, “Local
Composition and Electronic and Optical Properties of Cr Oxide Based Thin
Films”, American Vacuum Society
International Symposium, Baltimore, MD, November 1998.
97. R. H. French, P.F. Carcia, G. Reynolds, G. Hughes, C. C. Torardi, M. H. Reilly, M. Lemon, C. R. Miao, D. J. Jones, L. Wilson, “SiN/TiN
Multilayers for 248 nm and 193 nm Phase Shift Lithography”, American Ceramic Society Annual Meeting,
Indianapolis, IN, April 1999.
98. A. R. Hanuska, R. H. French, “Computational Optics of Resonant
Anisotropic Spheroids”, American Ceramic Society Annual Meeting, Indianapolis, IN, April 1999.
99. H. Müllejans, R. H. French “Insights into the Electronic Structure of
Ceramics Through Quantitative Analysis of Valence Electron Energy-loss
Spectroscopy (VEELS)”, Microscopy Society of American Annual Meeting,
Portland, Oregon, August 1999.
100. P. F. Carcia, R. H. French,
G. Reynolds, G. Hughes, C. C. Torardi, M. H. Reilly, M. Lemon, C. F. Miao, D. J.
Jones, L. Wilson, “Optical Superlattices as Phase-Shift Masks for
Microlithography”, Engineered Nanostructural Films and Materials, SPIE
Symposium on Optical Science, Engineering and Instrumentation, Denver, Colorado,
July 18-23, 1999.
101. L. E. McNeil, A. R. Hanuska, R. H. French, “Near-field Scattering from
Red Pigment Particles: Absorption
and Spectral Dependence”, American
Physical Society March Meeting, Minneapolis, March 2000.
102. R. H. French, D. J. Jones,
J. N. Hilfiker, R. Synowicki, R. C. Wheland, J. Feldman, A. E. Feiring,
“Fluoropolymers for 157nm Lithography: Optical Properties from VUV Absorbance
and Ellipsometry Measurements”, SPIE
Microlithography Conference, Santa Clara, March 2000.
103. M. K. Crawford, A. E. Feiring, J. Feldman, R. H. French, M. Periysamy, F. L. Schadt, R. J.
Smalley, F. C. Zumsteg, R. R. Kunz, V. Rao, S. M. Holl, “New Materials for
157-nm Photoresists: Characterization and Properties”, SPIE Microlithography Conference, Santa Clara, March 2000.
104. M. K. Crawford, A. E. Feiring, J. Feldman, R. H. French, D.
J. Jones, M. Periyasamy, V. A. Petrov, F. L. Schadt III, R. J.
Smalley, R. C. Wheland, F. C. Zumsteg, “Materials Design of Novel
Fluoropolymers for 157 nm Photoresists and Pellicles”, 1st International Symposium on 157 nm Lithography, Dana Point, California, May 2000.
105. J. S. Gordon, R. H. French,
“Status Report on Development of a 157 nm Pellicle”, 1st International Symposium on 157 nm Lithography, Dana Point, California, May 2000.
106. R. H. French, A. R. Hanuska, L. E. McNeil, “Near Field Optics and
Scattering by Ceramic/Polymer Particulate Dispersion”, Fall Meeting of the Basic Science Division of the American Ceramic
Society, Seattle, Washington, October 2000.
107. M. K. Crawford, A. E. Feiring, J. Feldman, R. H. French, M. Periyasamy,
V. A. Petrov, F. L. Schadt III, R. J. Smalley, R. C. Wheland, F. C. Zumsteg,
“Fluoropolymers for Semiconductor Manufacture”, Fluoropolymer 2000,
sponsored by American Chemical Society, Savannah Georgia, October 2000.
108. J. R. Smith, R. H. French, D. A. Bonnell, “Cr Valence and Its
Consequence on the Optical Properties of CrOCN Phase Shifting Photomasks”,
Materials Research Society Meeting, Boston, December 2000.
109. Michael K. Crawford, Andrew E. Feiring, Jerald Feldman, Roger H. French,
Mookkan Periyasamy, Viacheslav A. Petrov, Frank L. Schadt III, Robert J. Smalley,
Fredrick C. Zumsteg,“157 nm Imaging Using Thick Single Layer Resists”, 2001
SPIE Meeting: “Advances in Resist Technology and Processing”, March 2001.
110. Roger H. French, Joseph Gordon, David J. Jones, M. F. Lemon, Robert C. Wheland, Edward Zhang, “Materials Design and Screening of Fluoropolymers for Use as Pellicles in 157nm Photolithography”, 2001 SPIE Meeting “Optical Microlithography”, March 2001. 111. R. H. French, K. van Benthem, W. Sigle, C. Elsässer, “Valence Electron
Energy Loss Study of Fe doped SrTiO3 and a S13 Boundary: Electronic
Structure and Dispersion Forces”, American Ceramics Society Annual Meeting,
Indianapolis, April 2001.
112. Michael K. Crawford, Andrew E. Feiring, Jerald Feldman, Roger H. French,
Kenneth W. Leffew, Viacheslav A. Petrov, Frank L. Schadt III, Robert J. Smalley,
Fredrick C. Zumsteg, “Fluoropolymers For Use as Thick Single Layer
Photoresists for 157 nm Photolithography”, 2nd International Symposium on 157nm Lithography”, Dana Point California, May
2001.
113. Joseph Gordon, Roger H. French, Robert C. Wheland, Edward Zhang, David J. Jones, M. F. Lemon, Kenneth G. Sharp, Weiming Qiu, Vladimir Liberman, “Development of Polymeric Pellicles for 157nm Photolithography”, 2nd International Symposium on 157nm Lithography”, Dana Point California, May 2001. 114. V. Liberman, M. Rothschild, J. H. C. Sedlacek, A. Grenville, R. H. French, “Behavior of Candidate Organic Pellicle Materials Under 157-nm Laser Irradiation”, 2002 SPIE Meeting “Optical Microlithography XV”, March 2002. 115. Roger H. French, Robert C. Wheland, Weiming Qiu, M. F. Lemon, Edward Zhang, Joseph Gordon, Vlad Liberman, Andrew Grenville, Rod Kunz, Mordy Rothschild, “157nm Pellicles: Polymer Design for Transparency and Lifetime”, 2002 SPIE Meeting “Optical Microlithography XV”, March 2002. 116. R. H. French, K. van Benthem, W. Sigle, C. Elsässer, “Bulk
and Interfacial Electronic Structure of and London Dispersion Forces in SrTiO3”, American Ceramics Society Annual Meeting, St. Louis, April 2002.
117. Michael K. Crawford, A.
Feiring, J. Feldman, R. H. French, K. Leffew, F. Schadt, S. Petrov, W. Farnham,
F. C. Zumsteg, R. Nassirpour, “Fluoropolymers for 157 nm Lithography:
Performance of Single Layer Resists”, 19th Japan Conference of Photopolymer
Science and Technology, International Symposium on Materials and Processes for
Advanced Giga-bit scale Lithography, Chiba Japan, June 2002.
118. A. E. Feiring, J. Feldman,
F. L. Schadt III, K. W. Leffew, F. C. Zumsteg, M. K. Crawford, R. H. French, R. C. Wheland, V. A.
Petrov, W. B. Farnham, “Design of
Very Transparent Fluoropolymers for Semiconductor Manufacture at 157 nm”,
American Chemical Society Symposium on Fluorine in Microlithography and
Microchip Manufacture, Boston, August 2002.
119. M. K. Crawford, W. Farnham, A. E. Feiring, J. Feldman, R. H. French, K. W. Leffew, S. Nassirpour, V. A. Petrov, F. L. Schadt III, R. J. Smalley, F. C. Zumsteg, “Fluoropolymer Resists for Single Layer 157 nm Lithography: Optimization of Their Combined Properties”, 3rd International Symposium on 157nm Lithography” Antwerp Belgium, September 2002. 120. Roger H. French, Robert C. Wheland, M. F. Lemon, Edward Zhang, Joseph Gordon, “Fundamentals of Transparency in Fluoropolymers for use as 157nm Soft Pellicles”, 3rd International Symposium on 157nm Lithography” Antwerp Belgium, September 2002. 121. A. E. Feiring, J. Feldman, F. L. Schadt III, K. W. Leffew, F. C. Zumsteg, M. K. Crawford, R. H. French, R. C. Wheland, V. A. Petrov, W. B. Farnham, “Design of Very Transparent Fluoropolymers for Semiconductor Manufacture at 157 nm”, 16th Winter Fluorine Conference, St. Petersburg Florida, January 2003. 122. Li Ang Chen, Erik Thiele,
Elizabeth P. Butler, Roger H. French, “Computer Modeling of Light Scattering
of Rutile Titanium Dioxide”, 2002 International Coatings Exhibition, New
Orleans, October 2002.
123. R. H. French, Lin K. Denoyer, K. van Benthem, W. Sigle, V.
Adrian Parsegian, Rudolf Podgornik, “Electronic Structure, Optical
Properties, London Dispersion Forces and Full Spectral Hamaker Coefficients for
Nanostructured Interfaces in Strontium Titanate”, Materials Research
Society Fall Meeting, Boston MA, December 2002.
124R. Getty, S. Percec, K. Sharp, P. Hietpas, G. Blackman, R. French,
D. Bonnell, T. Alvarez, “Scanning Probe Microscopy of Self-Assembled
Monolayers of Phenylene/Ethynylene Molecules”, Materials Research Society Fall
Meeting, Boston MA, December 2002.
125S. Percec, R. Getty, T.
Alvarez, D. A. Bonnell, R. Shao, R. H. French, W. Marshal, “Synthesis and
Surface Potential Investigations of Substituted Phenylene/Ethynylene Molecular
Self-Assemblies”, 6th Engineering Foundation Conference on
Molecular-Scale-Electronics, Key West Florida, December 2002.
126A. E. Feiring, J. Feldman,
F. L. Schadt III, K. W. Leffew, F. C. Zumsteg, M. K. Crawford, R. H. French, R. C. Wheland, V. A.
Petrov, W. B. Farnham, “Design of
Very Transparent Fluoropolymers for Semiconductor Manufacture at 157 nm”, 16th Winter Fluorine Conference, St. Petersburg Florida, January 2003.
127R. Getty, S. Percec, P.
Hietpas, R. H. French, D. Bonnell, T. Alvarez, R. Shao, Z. Hu, “Scanning Probe
Microscopy of Self-Assembled Monolayers of Highly Conjugated Molecules”,
Materials Research Society Spring 2003 Meeting, San Francisco, CA, April 2003.
128S. R. Lustig, E. D. Boyes, R. H. French, T. D. Gierke, M. A.
Harmer, P. B. Hietpas, A. Jagota, G. P. Mitchell, G. B. Onoa, K. D. Sams,
“Novel Process Methodology for Uniformly Cutting Nanotubes”, Materials Research Society Spring 2003 Meeting, San Francisco, CA, April
2003.
129M. K. Crawford, A. E. Feiring, J. Feldman, R. H. French, K. W.
Leffew, V. A. Petrov, F. L. Schadt, F. C. Zumsteg, “Single layer fluoropolymer
resists for 157-nm lithography”, SPIE Conference on Advances in Resist
Technology and Processing XX, Santa Clara CA, February 2002.
130. G. L.Tan1*,
M. F. Lemon2, R. H. French1,2, Y. M. Chiang, “Optical
Properties, Interband Transitions and London Dispersion Forces For Surfaces and
Interfaces of SiC and SiO2”, to be presented at the American
Ceramics Society Annual Meeting. Nashville TN, April 2003.
131. S. Percec, R. R. Getty R. T. Alvarez, D. A. Bonnell, R. Shao, R.
H. French, W. J. Marshall, “Self-Assembling Conjugated Oligomers for
Nanoelectronic Applications”, Europolymer Congress, Royal Institute of
Technology, Stockholm, Sweeded, June 2003.
Student Supervision1. Research Advisor, with Prof. R. T. Swimm, for M. E. Innocenzi, “A Study Of Room Temperature Optical Absorption In Undoped Aluminum-Oxide And Yttrium Aluminum Garnet”, Ph. D., University of Southern California. Graduated 1990. 2. Research Advisor, with Prof. R. L. Byer, for F. M. Schellenberg, “Linear And Nonlinear Spectroscopy In Polysilane Polymers”, Ph. D., Stanford University. Ph. D. Granted 1991. 3. Ph.D. Thesis Advisor for S. Loughin, “Critical Point Analysis of the Interband Transitions of Electrons”, Department of Materials Science, University of Pennsylvania. Graduated 1994. 4. Ph. D. Thesis Committee, with Prof. Y. M. Chiang, for Harold Ackler, “Thermodynamic Calculations and Model Experiments on Thin Intergranular Amorphous Films in Ceramics”, MIT. Graduated October 1996. 6. Ph. D. Thesis Committee, with Prof. T. W. Coyle, for Hongmei Liao, “Stereolithography Using Compositions Containing Ceramic Powders”, University of Toronto. Graduated February 1997. 7. Research Advisor, with Prof. Manfred Rühle and Harald Muellejans, for Albert Dorneich, “Spatially Resolved Electron Energy-loss Spectroscopy of Internal Interfaces in Ceramics”, Diplomarbeit, University of Stuttgart, Stuttgart, Germany, 1996. 9. Ph. D. Thesis Co-Advisor, with Prof. D. B. Bonnell, for J. R. Smith, “The Relationship Between Bonding, Structure and Optical Properties in Reactive Sputter Deposited Chrome Oxycarbonitride”, Department of Materials Science, University of Pennsylvania. Graduated May 2001.
Professional Activities1. 1986-8, Research Affiliate at M. I. T. to conduct and oversee research
with Prof. R. L. Coble and Dr. H. P. Jenssen of the Crystal Physics Laboratory.
2. Session Chair, Symposium on Non Linear Optics, Amer. Ceram. Soc. Basic
Science Fall Meeting, San Francisco, Oct. 21-23, 1988.
3. Session Chair, Basic Science Division, American Ceramic Society Annual
Meeting, Indianapolis, IN, April 1989.
4. Session Chair, Zirconia IV meeting, International Ceramic Congress,
Anaheim, CA., Nov. 1989.
5. Program Chair, Symposium on Electronic Structure of Ceramics, sponsored
by the Basic Science, Electronics, and Engineering Ceramics divisions of the
American Ceramic Society, 92nd Annual Meeting of the American Ceramic Society,
Dallas, TX, April 22 to 26, 1990.
6. Associate Editor, Journal of the American Ceramic Society, Topical Issue
on Electronic Structure of Ceramics, 73, 11, (1990).
7. Session Chair, Basic Science Division, American Ceramic Society, Annual
Meeting, Cincinnati, OH, 1991.
8. Committee Member, Intersociety Liaison, American Ceramic Society,
1991-92.
9. Session Chair, American Ceramic Society Basic Science Division Fall
Meeting, 1991.
10. D. O. E. Research Assistance Task Force Member for Basic Energy Sciences
and Fusion Energy Office, on "Radiation Enhanced Electrical Degradation of
Ceramics", Vail, CO, May 1991. Report
published in Journal of Nuclear Materials.
11. Program Chair, Symposium on "Bulk and Interfacial Electronic
Structure of Ceramics", 94th Annual Meeting of the American Ceramic
Society, Minneapolis, MN, 1992.
12. National Science Foundation, Materials Research Lab Program, Mail
Reviewer and Site Review Panel.
13. Program Chair, International Workshop on the "Science of Al2O3" held at
Schloss Ringberg, Max Planck Institut, Germany, March 15 to 19, 1993.
14. Associate Editor, Topical Issue on "Science of Al2O3",
Journal of the American Ceramic Society, 1993.
15. Program Chair, International Workshop on the "Interfaces in Ionic
Materials", Schloss Ringberg, Max Planck Institut, Germany, March 6 to 11,
1994.
16. Program Chair, International Workshop on the "Atomic Bonding and
Spectroscopy of Internal Interfaces", Schloss Ringberg, Max Planck
Institut, Germany, April 23 to 28, 1995.
17. Associate Editor, Topical Issue on "Atomic Bonding and Spectroscopy
of Internal Interfaces”, Journal of
Physics D, 29, July 1996.
18. Program Chair, Fall Basic Science Division Meeting, “Microstructure:
Controlling Complexity”, American Ceramic Society, New Orleans, LA, November
1995.
19. Program Chair, with W. Craig Carter, Annual Meeting, Basic Science
Division, American Ceramic Society, April 1996.
20. Associate Editor, Journal of the American Ceramic Society, since 1989.
21. Adjunct Professor in Materials Science and Engineering, University of
Pennsylvania, since 1996.
22. Vice Chairman, Gordon Research Conference on Solid State Studies in
Ceramics, July 1996.
23. Chairman, with Carol Handwerker, Gordon Research Conference on Solid
State Studies in Ceramics, “New Perspectives on Interfacial Science: From
Fundamentals to Practice”, August 1997.
24. Officer of the Basic Science Division, American Ceramic Society, 1997 to
2001.
25. Participant, Semiconductor Industry Association Roadmap Committee,
Technology Working Group on Lithography, 1999 roadmap revision.
26. International Organizing Committee, International Workshop on Ceramic and
Bimaterial Interfaces: Designing For Properties, Seville, Spain, September 1999.
27. Guest Editor, Topical Issue on Ceramic and Bimaterial Interfaces:
Designing For Properties, Acta Materialia,
2000.
28. Member of the Board of Directors of the American Ceramic Society, May
2000 to May 2002.
29. Session Chair, International Symposium on Advanced Nitrides, American
Ceramic Society, Annual Meeting, Indianapolis IN, 2001.
30. Member, American Ceramics Society Meetings Committee - Long Range Planning, 2001-2004. 31. International Organizing Committee, International Materials Conference on Ceramic and Metal Interfaces: Control at the Atomic Level, Oviedo Spain, June 2002. 32. Member of the Board of Directors of the American Ceramic Society, May 2002 to May 2003.
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Comment: (c) 2009 Roger H. French , frenchrh@lrsm.upenn.edu |
