Roger Harquail French

    As of 08/06/2003

Table of Contents

1. R&D 100 Award, 1989, received for Dispersive Vacuum Ultraviolet Spectrophotometer using a Samarium Laser Plasma Light Source for energy, temperature and time resolved studies of the electronic structure of ceramic and optical materials.

2. Associate Editor, Journal of the American Ceramic Society, since 1989. 

3. 1995/96 Nominated as Associate of the DuPont Fellows Forum. 

4. 1998/99 International Fulrath Awardee of the American and Japanese Ceramic's Societies, to recognize outstanding academic and industrial ceramic engineers/scientists, for research on Dispersion Forces and Electronic Structure of Materials.

5. 1999 Fellow of the American Ceramic Society.  

6. 2002 Nominated to Attend National Academy of Engineering’s Frontiers of Engineering Symposium. 

7. 2002 Samuel Giejsbeek Award of the American Ceramics Society, Pacific Coast Region, for a development of attenuated phase shift photomasks, recognized to have major significance to the ceramic industry based upon established and current usefulness importance uniqueness and economic significance. 
   

Please Check Here For Appropriate Use.

1.  L. Drozdyk, R. H. French, K. W. Hang, A. Halliyal, "Light Absorbing Dielectric Compositions", U. S. Patent 5,393,465, Issued Feb. 28, 1995.  

2. U. Alpay, R. H. French, F. Kalk,  “Photomask Blanks”,  U. S. Patent 5,459,002, Issued October 17, 1995. 8 claims.    

3. U. Alpay, R. H. French, F. Kalk, “Photomask Blanks Comprising Transmissive Embedded Phase Shifter”,  U. S Patent 5,415,953, Issued May 16, 1995. 15 claims. 

4.  P. Carcia, R. H. French, “Attenuating Embedded Phase Shift Photomask Blanks”, U. S. Patent 5,897,976, Issued April 27, 1999. 16 claims. 

5.  P. Carcia, R. H. French, “Attenuating Embedded Phase Shift Photomask Blanks”, U. S. Patent 5,897,977, Issued April 27, 1999. 18 claims. 

6.  R. H. French, K. G. Sharp, “Attenuating Phase Shift Photomasks”, U. S. Patent 6,096,460, Issued August 1, 2000. 5 claims.  

7. R. H. French, K. G. Sharp, “Attenuating Phase Shift Photomasks”, U. S. Patent 6,174,631, Issued Jan 16, 2001, 8 claims. 

   

Refereed Publications

1.     R. H. French, R. Raj, "Use of the Double Torsion Method to Study Crack Propagation in an Adhesive Layer", Journal of Testing and Evaluation, 7, 3, 160-7 (1979). 

2.     R. H. French, H. P. Jenssen, and R. L. Coble, "High Temperature VUV Spectrophotometer", Proc. of the 7th Int. Conf. on Vacuum Ultraviolet Radiation Physics, Annals of the Israeli Physical Society, 6, 1, 51-3 (1983). 

3.     R. H. French, R. L. Coble, "High Temperature Electronic Structure of Single Crystal Sapphire", Proc. of the 7th Int. Conf. on Vacuum Ultraviolet Radiation Physics, Annals of the Israeli Physical Society, 6, 1, 261-63 (1983). 

4.     F. A. Modine, C. Y. Allison, R. H. French, "Optical and Electrical Properties of Niobium Carbide", Phys. Rev. B, 35, 6, 2573-82 (1987).  

5.     F. S. Ohuchi, R. H. French, R. V. Kasowski, "A Study of Room Temperature Cu-Al₂O₃ and Cu-AlN Interfacial Interactions", J. Vac. Sci. Technol. A, 5, 4, 1175-7 (1987). 

6.     F. S. Ohuchi, R. H. French, R. V. Kasowski, "Cu Deposition on Alumina and Aluminum Nitride Surfaces: Electronic Structure and Bonding", Journal of Applied Physics, 62, 6, 2286-89 (1987). 

7.     F. N. Tebbe, P. A. Morris, R. H. French, U. Chowdhry, R. L. Coble, "Purity of Aluminum Hydroxide Derived From Triethylaluminum", Journal of The American Ceramic Society, 71, 4, C204-6 (1988). 

8.     R. V. Kasowski, F. S. Ohuchi and R. H. French, "Theoretical and Experimental Studies of Cu Metallization of Al₂O₃", Physica B, 150, 1-2, 44-46 (1988). 

9.     R. H. French, R. L. Coble, R. V. Kasowski and F. S. Ohuchi, "Vacuum Ultraviolet, Photoemission and Theoretical Studies of the Electronic Structure of Al₂O₃ up to 1000°C", Physica B, 150, 1-2, 47-49 (1988). 

10.  H. Song, R. H. French, R. L. Coble, "Effect of Residual Strain on the Electronic Structure of Alumina and Magnesia", Journal of The American Ceramic Society, 72, 6, 990-94 (1989). 

11.  F. S. Ohuchi, R. H. French, "Effect of Oxygen Incorporation in AlN Thin Films", J. Vac. Sci. Technol. A, 6, 3, 1695-6 (1988). 

12.  M. L. Bortz, R. H. French, "Optical Reflectivity Measurements Using a Laser Plasma Light Source" Applied Physics Letters, 55, 19, 1955-7 (Nov. 8, 1989). 

13.  M. L. Bortz, R. H. French, "Quantitative, FFT-Based, Kramers Kronig Analysis for Reflectance Data", Applied Spectroscopy, 43, 8, 1498-1501 (1989). 

14.  R. H. French, "Electronic Structure of a-Al₂O₃, with Comparison to AlON and AlN", Journal of the American Ceramic Society, 73, 3, 477-89 (1990). 

15.  R. H. French, "Laser-Plasma Sourced, Temperature Dependent VUV Spectrophotometer Using Dispersive Analysis" , Physica Scripta, 41, 4, 404-8 (1990). 

16.  M. L. Bortz, R. H. French, D. J. Jones, R. V. Kasowski, F. S. Ohuchi, "Temperature Dependence of the Electronic Structure of Al₂O₃, MgAl₂O₄ and MgO", Physica Scripta, 41, 4, 537-41 (1990). 

17.  R. H. French, R. V. Kasowski, F. S. Ohuchi, D. J. Jones, H. Song, R. L. Coble, "Band Structure Calculations of the High-Temperature Electronic Structure of Magnesium Oxide", Journal of the American Ceramic Society, 73, 11, 3195-99 (1990). 

18.  M. E. Innocenzi, R. T. Swimm, M. Bass, R. H. French, A. B. Villaverde, M. R. Kokta, "Room Temperature Optical Absorption in Undoped a-Al₂O₃",  Journal of Applied Physics, 67, 12,7542-46 (1990). 

19.  R. H. French, J. W. Lin, F. S. Ohuchi, C. T. Chen, "Electronic Structure of b-BaB₂O₄ and LiB₃O₅  Nonlinear Optical Crystals”, Phys. Rev. B., 44, 16, 8496-502 (1991).  

20.  M. E. Innocenzi, R. T. Swimm, M. Bass, R. H. French, M. R. Kokta, "Optical Absorption in Undoped Yttrium Aluminum Garnet", Journal of Applied Physics, 68, 3, 1200-4 (1990). 

21.  D. J. Kraus, R. H. French, "Automatic Spectral Data Base and Archive System for Optical Spectroscopy", Applied Spectroscopy, 44, (7), 1221-26 (1990). 

22.  G. Rohrer, D. A. Bonnell, R. H. French, "Detection of Optically Excited States in Wide Band Gap Semiconductors with Scanning Tunneling Microscopy", Journal of the American Ceramic Society, 73, 11, 3257-63 (1990). 

23.  Y. N. Xu, W. Y. Ching, R. H. French, "Self-consistent Band Structures and Optical Calculations in Cubic Ferroelectric Perovskites", Ferroelectrics, 111, 23-32 (1990). 

24.  F. M. Schellenberg, R. L. Byer, R. H. French, R. D. Miller,  "Vacuum-ultraviolet Spectroscopy of Dialkyl Polysilanes", Phys. Rev. B Rapid Communications, 43, 12, 10008-11 (1991). 

25.  D. A. Bonnell, G. S. Rohrer, R. H. French, "Tunneling Spectroscopic Analysis of Optically Active Wide Band-gap Semiconductors" , J. Vac. Sci. Technol., 9, 551-6 (1991). 

26.  L. E. McNeil, M. Grimsditch, R. H. French, "Vibrational Spectroscopy of Aluminum Nitride", J. Am. Ceram. Soc., 76, 1132-36 (1993). 

27.  R. H. French, J. S. Meth, J. R. G. Thorne, R. M. Hochstrasser, R. D. Miller, "Vacuum Ultraviolet Spectroscopy of the Optical Properties and Electronic Structure of Seven Poly(di-alkylsilanes)", Synthetic Metals, 50, 1-3, 499-508 (1992). 

28.  J. R. G. Thorne, R. M. Hochstrasser, J. M. Zeigler, A. Tilgner, H. P. Trommsdorff, R. H. French, P. J. Fagan, R. D. Miller, "Optical Studies of Polysilanes", Frontiers of Polymer Research, edited by P. N. Prasad, J. K. Nigam, Plenum Press, 143-8 (1991). 

29.  J. R. G. Thorne, R. M. Hochstrasser, J. M. Zeigler, A. Tilgner, H. P. Trommsdorff, R. H. French, P. J. Fagan, R. D. Miller, "Electronic and Vibrational Excitations in Polysilanes and Oligomers", Mol. Cryst. Liq. Cryst., 216, 13-9 (1992). 

30.  S. Loughin, R. H. French, W. Y. Ching, Y. N. Xu, G. A. Slack, "Electronic Structure of Aluminum Nitride: Theory and Experiment", Applied Physics Letters, 63, 9, 1182-4 (1993).  

31.  R. H. French, D. J. Jones, S. Loughin, "Interband Electronic Structure of a-Al₂O₃ up to 2167 K", Journal of the American Ceramic Society, 77, 412-22 (1994). 

32.  C. A. Handwerker, R. M. Cannon, R. H. French, "R. L. Coble: A Retrospective", Journal of the American Ceramic Society, 77, 293-7 (1994). 

33.  R. H. French, S. J. Glass, F. S. Ohuchi, Y.-N Xu, F. Zandiehnadem, W. Y. Ching, "Experimental and Theoretical Studies on the Electronic Structure and Optical Properties of Three Phases of ZrO₂", Physical Review B, 49, 5133-42 (1994).  

34.  Y. N. Xu, W. Y. Ching, R. H. French, "Electronic Structure and Interatomic Bonding of b-BaB2O4 Crystal with Comparison to LiB₃O₅", Physical Review B., 48, 17695-702 (1993).  

35.  Y. M. Chiang, L. E. Silverman, R. H. French, R. M. Cannon, "The Thin Glass Film between Ultrafine Conductor Particles in Thick Film Resistors", Journal of the American Ceramic Society, 77, 1143-52 (1994). 

36.  S. Loughin, R. H. French, "Optical Functions of Aluminum Nitride", Properties of Group III Nitrides, edited by J. H. Edgar, Electronic Materials Information Service, INSPEC, the Institution of Electrical Engineers, London, 175-89 (1994). 

37.  R. H. French, R.. M. Cannon, L. K. DeNoyer, Y.-M. Chiang, "Full Spectral Calculation of Non-Retarded Hamaker Constants for Ceramic Systems from Interband Transition Strengths", Solid State Ionics, 75, 13-33 (1995).  

38.  Y. Chen, F. W. Clinard, B. D. Evans, R. H. French, R. Gonzalez, J. J. O'Dwyer, F. W. Wiffen, X. F. Zong, "Radiation Induced Electrical Degradation of Ceramics", Journal of Nuclear Materials, 217, 32-47 (1994). 

39.  H. D. Ackler, R. H. French, Y. M. Chiang, “Comparison of Hamaker Constants for Ceramic Systems with Intervening Vacuum or Water: From Force Laws and Physical Properties”, Journal of Colloid and Interface Science, 179, 460-69 (1996).

40.  S. -D. Mo, W. Y. Ching, R. H. French, “Electronic Structure of a Near S11 a-axis Tilt Grain Boundary in a-Al₂O₃” J. Amer. Ceram. Soc., 79, 627-33 (1996). 

41.  S. -D. Mo, W. Y. Ching, R. H. French, “Optical Properties of a Near S11 a-axis Tilt Grain Boundary in a-Al₂O₃ ” Journal of Physics D, 29, 1761-66 (1996).  

42.  H. Müllejans, R. H. French, "Interband Electronic Structure of a Near S11 Grain Boundary in µ Alumina Determined by Spatially Resolved Valence Electron Energy-Loss Spectroscopy”, Journal of Physics D, 29, 1751-60 (1996).  

43.  S. Loughin, R. H. French, L. K. DeNoyer, W. -Y. Ching, Y. -N. Xu, "Critical Point Analysis of the Interband Transition Strength of Electrons", Journal of Physics D, 29 1740-50 (1996).  

44.  W. Y. Ching, Y.-N. Xu, R. H. French, “First-Principles Investigation of the Optical Properties of Poly(di-n-hexylsilane)”, Physical Review B, 54, 19, 13546-50 (1996).  

45.  C. Argento, R. H. French, “Parametric Tip Model and Force-Distance Relation for Hamaker Constant Determination from AFM”, Journal of Applied Physics, 80, 6081-90 (1996). 

46.  R. W. Johnson, E. S. Thiele, R. H. French, “Light Scattering Efficiency of White Pigments: Titania-Coated Silica Relative to Rutile TiO₂”, TAPPI Journal, 80, 11, 233-39 (1997). 

47.  S. Loughin, R. H. French, “Aluminum Nitride (AlN)”, Handbook of Optical Constants of Solids, Vol. III, edited by E. Palik, Academic Press, 373-401 (1998). 

48.  P. F. Carcia, R. H. French, M. H. Reilly, M. F. Lemon, D. J. Jones, “Optical Superlattices --- A Strategy for Designing Phase-shift Masks for Photolithography at 248 nm and 193 nm: Application to AlN/CrN”, Applied Physics Letters, 70, 2371-3 (1997).  

49.  R. H. French, H. Müllejans, D. J. Jones, “Optical Properties of Aluminum Oxide: Determined from Vacuum Ultraviolet and Electron Energy Loss Spectroscopies”, Journal of the American Ceramic Society, 81, 10, 2549-57 (1998).

50.  R. H. French, H. Müllejans, D. J. Jones, G. Duscher, R. M. Cannon, M. Rühle, “Dispersion Forces and Hamaker Constants for Intergranular Film in Silicon Nitride from Spatially Resvolved-Valence Electron Energy Loss Spectrum Imaging”, Acta Materialia, 46, 7, 2271-87 (1998).  

51.  A. D. Dorneich, R. H. French, H. Müllejans, S. Loughin, M. Rühle, “Quantitative Analysis of Valence Electron Energy-Loss Spectra of Aluminum Nitride”, Journal of Microscopy, 191, 3, 286-96 (1998). 

52.  E. S. Thiele, R. H. French, “Light-Scattering Properties of Representative, Morphological Rutile Titania Particles Using a Finite-Element Method”, Journal of the American Ceramic Society, 81, 3, 469-79 (1998).  

53.  E. S. Thiele, R. H. French, “Computation of Light Scattering by Anisotropic Spheres of Rutile Titania”, Advanced Materials, 10, 1271-76 (1998). 

54.  R. H. French, D. J. Jones, H. Müllejans, S. Loughin, A. D. Dorneich, P. F. Carcia, “Optical Properties of Aluminum Nitride: Determined from Vacuum Ultraviolet Spectroscopy and Spectroscopic Ellipsometry”, Journal of Materials Research, 14, 4337-44 (1999).  

55.   H. Müllejans, R. H. French, “Insights Into the Electronic Structure of Ceramics Through Quantitative Analysis of Valence Electron Energy-loss Spectroscopy (VEELS)”, Microscopy and Microanalysis, 6 (4), 297-306, (2000). 

56.  L. E. McNeil, R. H. French, “Multiple scattering from Rutile TiO₂ Particles”, Acta Materialia, 48, 4571-6, (2000). 

57.  R. H. French, “Origins and Applications of London Dispersion Forces and Hamaker Constants in Ceramics”, Centennial Feature Article, Journal of the American Ceramic Society, 83, 9, 2117-46 (2000).  

58. L.E. McNeil, A.R. Hanuska, R. H. French, “Near-field scattering from red pigment particles:  absorption and spectral dependence”,Journal of Applied Physics, 89, 1, 283-93, (2001). 

59.  L.E. McNeil, R.H. French, “Light Scattering From Red Pigment Particles:  Multiple Scattering in a Strongly Absorbing System”, Journal of Applied Physics, 89, 1, 283-93, (2001). 

60.  K. van Benthem, R. H. French, W. Sigle C. Elsasser, M. Rühle, “Valence Electron Energy Loss Study of Fe Doped SrTiO₃ and a S13 Boundary: Electronic Structure and Dispersion Forces”, Ultramicroscopy, 86, 3-4, 303-18, (2001). 

61.  L. E. McNeil, A.R. Hanuska and R.H. French, “Orientation dependence in near-field scattering from TiO2 particles” Applied Optics, 40, 22, 3726-36, (2001).  

62.  K. van Benthem, C. Elsässer, R. H. French, “Bulk Electronic Structure of SrTiO₃: Experiment and Theory”, Journal of Applied Physics, 90, 12, 6156-64, (2001).

63.  J. R. Smith, R. H. French, G. Duscher, D. A. Bonnell, “Consequence of Composition/Property Variations at Multiple Length Scales to Macroscopic Properties of CrOCN Thin Films”, Journal of the American Ceramic Society, 84, 12, 2873-81, (2001). 

64.  M. K. Crawford, W. Farnham, A. E. Feiring, J. Feldman, R. H. French, K. Leffew, S. Nassirpour, V. A. Petrov, F. L. Schadt III, R. J. Smalley, and F. C. Zumsteg, “Fluoropolymers for 157 nm Lithography: Performance of Single Layer Resists”, Journal of Photopolymer Science and Technology, 15, 4, 677-89, (2002).  

65..      A. Frye, R. H. French, D. A. Bonnell “Optical Properties and Electronic Structure of Oxidized and Reduced Single Crystal Strontium Titanate”, Zeitschrift für Metallkunde.  94, 3, (2003). 

66.      Roger H. French, Robert C. Wheland, Weiming Qiu, M. F. Lemon, Edward Zhang, Joseph Gordon, Viacheslav A. Petrov, Victor F. Cherstkov, Nina I.Delaygina, “Novel Hydrofluorocarbon Polymers for use as Pellicles in 157 nm Semiconductor Photolithography”, Journal of Fluorine Chemistry, 122, 63-80, 2003 

67.      A. E. Feiring, J. Feldman, F. L. Schadt III, K. W. Leffew, F. C. Zumsteg, M. K. Crawford, R. H. French. R. C. Wheland, V. A. Petrov, W. B. Farnham, “Design of Very Transparent Fluoropolymer Resists for Semiconductor Manufacture at 157 nm” Journal of Fluorine Chemistry, 122, 11-16, (2003).  

68.      Guolong Tan, Michael F. Lemon, Roger H. French, “Optical Properties and London Dispersion Forces of Amorphous Silica Determined by Vacuum Ultraviolet Spectroscopy and Spectroscopic Ellipsometry”, to be published Journal of the American Ceramics Society. 

69.      S. R. Lustig, E. D. Boyes, R. H. French, T. D. Gierke, M. A. Harmer, P. B. Hietpas, A. Jagota, G. P. Mitchell, G. B. Onoa, K. D. Sams, “Lithographically Cut Single-Walled Carbon Nanotubes with Controlled Length Distribution and End-Group Functionality”, to be published in Nanoletters. 

Other Publications

1.     R. C. Koeller, R. H. French, R. Raj, "Use of Holographic Interferometry to Study Crack Propagation in Metal-Plastic Composites", Proc. of the Conf. on Failure Modes in Composites IV, TMS-AIME, 164-75 (1979). 

2.     R. H. French, R. L. Coble, "Temperature Dependence of the VUV Optical Spectra and Band Structure of Al₂O₃", Proceedings of the Topical Conference on Basic Properties of Optical Materials, National Bureau of Standards Special Publication 697, 126-29 (1985). 

3.     P. A. Morris, R. H. French, R. L. Coble, F. N. Tebbe, U. Chowdhry, "Clean-room and CO₂-Laser Processing of Ultra High-Purity Al₂O₃", Defect Properties and Processing of High-Technology Nonmetallic Materials, Materials Research Society Proceedings, 60, Pittsburgh, PA, 79-86 (1986). 

4.     D. P. Button, B. A. Yost, R. H. French, W. Y. Hsu, J. D. Bolt, M. A. Subramanian, H. M. Zhang, R. E. Geidd, A. G. Whittaker, D. G. Onn, "Ceramic-Fiber / Polymer Laminates : Thermally Conductive Composites With Low Dielectric Constants", Ceramic Substrates and Packages for Electronic Applications,  Advances in Ceramics, published by the American Ceramic Society, Westerville OH, 26, 353 - 73 (1989). 

5.     R. H. French, J. D. Bolt, "Polymer Ceramic Composites for Electronic Packaging Applications", Advanced Materials and Processes, 134, 1, 32-5 (1988). 

6.     R. H. French, J. B. Blum, "Electronic Structure and Conductivity of Al₂O₃", Sintering of Advanced Ceramics, edited by C. A. Handwerker, J. E. Blendell, W. Kaysser, Ceramic Transactions , published by the American Ceramic Society, Westerville OH, 7. 111 -34 (1990). 

7.     R. H. French, "Vacuum Ultraviolet Spectroscopy of Ceramics", Advanced Characterization Techniques for Ceramics, Ceramic Transactions, 5, 406-19 (1989). 

8.     P. A. Morris, M. K. Crawford, A. Ferretti, R. H. French, M. G. Roelofs, J. D. Bierlein, J. B. Brown, "Defects in KTiOPO₄", Optical Materials, Materials Research Society Symposium Proceedings, 152, 95-101 (1989). 

9.     S. Loughin, R. H. French, G. A. Slack, J. B. Blum, "A Vacuum Ultraviolet Investigation of the Electronic Structure of Single- and Polycrystalline Aluminum Nitride", Extended Abstract for Symposium of the Materials Research Society Fall 1990 Meeting on Covalent Ceramics. 

10.  F. M. Schellenberg, R. L. Byer, R. D. Miller, R. H. French, S. S. Kano, Y. Takahashi, Y. Shiraki, R. Ito, "Linear and Nonlinear Optics of Substituted Polysilanes",  Inorganic and Organometallic Oligomers and Polymers, Proc. IUPAC Symp. Macromol., edited by J. F. Harrod, R. M. Laine, Kluwer Academic Publishers, Dordrecht and Boston,  73-95 (1991). 

11.  R. H. French, R. Abou-Rahme, D. J. Jones, L. E. McNeil, "Absorption Edge and Band Gap of SiO₂ Fused Silica Glass", Ceramic Transactions, Vol. 28, "Solid State Optical Materials”, edited by Allan J. Bruce and Basavaraj V. Hiremath, American Ceramic Society, Westerville OH, 63-80 (1992). 

12.  H. Muellejans, J. Bruley, R. H. French, P. A. Morris, "Quantitative Electronic Structure Analysis of a-Al₂O₃ Using Spatially Resolved Valence Energy-loss Spectra", Electron Microscopy and Analysis Group (EMAG)  of Royal Microscopical Society Proceedings, edited by A. J. Craven, IOP Publishing, Bristol UK, 59-62 (1993). 

13.  H. Mullejans, J. Bruley, R. H. French, P. A. Morris, "Quantitative Electronic Structure Analysis of a-Al₂O₃ Using Spatially Resolved Valence Electron Energy-Loss Spectra", Mat. Res. Soc. Symp. Proc., 332, edited by M. Sarikaya, K. Wickramasighe, M. Isaacson, 169-176 (1994).  

14.   F. D. Kalk, R. H. French, H. U. Alpay, G. Hughes, "Attenuated Phase Shifting Photomasks Fabricated from Cr-Based Embedded Shifter Blanks", Photomask and X-Ray Mask Technology, SPIE Vol. 2254, edited by H. Yoshihara, 64-70 (1994).  

15.  B. Johs, R. H. French, F. D. Kalk, W. A. McGahan, J. A. Woollam, "Optical Analysis of Complex Multilayer Structures Using Multiple Data Types", Optical Interference Coatings, SPIE Vol. 2253, edited by F. Abeles, 1098-1106 (1994).  

16.  F. D. Kalk, R. H. French, H. U. Alpay, G. Hughes, "Chromium-Based Attenuated Embedded Shifter Preproduction", 14th Annual BACUS Symposium on Photomask Technology and Management, SPIE Vol. 2322, edited by W. L. Brodsky, G. V. Shelden, 299-304 (1994). 

17.  R. H. French, C. Scheu, G. Duscher, H. Müllejans, M. J. Hoffmann, R. M. Cannon, “Interfacial Electronic Structure and Full Spectral Hamaker Constants of Si₃N₄  Intergranular Films from VUV and SR-VEEL Spectroscopy”, Proceedings of the Symposium on Structure and Properties of Interfaces in Ceramics, edited by D. Bonnell, U. Chowdhry, M. Rühle, Materials Research Society, 243-258 (1995). 

18.  S. M. Gaspar Wilson, S. S. H. Naqvi, J. R. McNeil, H. M. Marchman, B. Johs, R. H. French, F. D. Kalk, “Metrology of Etched Quartz and Chrome Embedded Shift Gratings Using Scatterometry”, Integrated Circuit Metrology, Inspection, and Process Control IX,  SPIE Vol. 2439, edited by M. H. Bennett, 479-94 (1995). 

19.  P. F. Carcia, R. H. French, K. Sharp, J. S. Meth, B. W. Smith, “Materials Screening for Attenuating Embedded Phase-Shift Photoblanks for DUV and 193 nm Photolithography”, 16th Annual BACUS Symposium on Photomask Technology and Management, SPIE Vol. 2884, edited by G. V. Shelden, J. A. Reynolds, 255-63 (1996).  

20.  E. S. Thiele, R. H. French, “Computational Modeling of TiO₂ Particle Optics Using a Finite Element Method”, Proceedings of the Paint Research Association, Germany (April 1997). 

21.  H. Müllejans, R. H. French, G. Duscher, M. Rühle, “Improved Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and the Local Electronic Structure”, Proceedings of the Microscopy Society of America (August 1997). 

22.  G. A. M. Reynolds, R. H. French, P. F. Carcia, C. C. Torardi, G. Hughes, D. J. Jones, M. F. Lemon, M. Reilly, L. Wilson, C. R. Miao, “TiSi-nitride attenuating phase-shift photomask for 193 nm lithography”, 18th Annual BACUS Symposium on Photomask Technology and Management,  SPIE Vol. 3546, edited by B. J. Grenon, F. E. Abboud, 514-23 (1998).  

23.  P. F. Carcia, R. H. French, G. Reynolds, G. Hughes, C. C. Torardi, M. H. Reilly, M. Lemon, C. R. Miao, D. J. Jones, L. Wilson, L. Dieu, “Optical Superlattices as Phase-Shift Masks for Microlithography”, Engineered Nanostructural Films and Materials, SPIE Vol. 3790, edited by A. Lakhtakia, R. F. Messier, 23-35 (1999). 

24.  P. F. Carcia, G. Hughes, R. H. French, C. Torardi, G. Reynolds, L. Dieu, “Thin Films for Phase-shift Masks”, Vacuum and Thin Film, IHS Publishing Group, 14-21, September (1999). 

25.  M. K. Crawford, A. E. Feiring, J. Feldman, R. H. French, M. Periyasamy, F. L. Schadt III, R. J. Smalley, F. C. Zumsteg, R. R. Kunz, V. Rao, L. Liao, S. M. Holl, “New Materials for 157 nm Photoresists: Characterization and Properties”, Advances in Resist Technology and Processing XVII, SPIE Vol. 3999, edited by F. M. Houlihan (2000).  

26.  R. H. French, R. C. Wheland, D. J. Jones, J. N. Hilfiker, R. A. Synowicki, F. C. Zumsteg, J. Feldman, A. E. Feiring, “Fluoropolymers for 157nm Lithography: Optical Properties from VUV Absorbance and Ellipsometry Measurements”, Optical Microlithography XIII, SPIE Vol. 4000, edited by C. J. Progler, 1491-1502 (2000). 

27.  R. M. Cannon, M. Rühle, M. J. Hoffmann, R. H. French, H. Gu, A. P. Tomsia and E. Saiz, “Adsorption and Wetting Mechanisms at Ceramic Grain Boundaries”, Grain Boundary Engineering in Ceramics, ed T. Sakuma, L. Sheppard, Y. Ikuhara, Ceramic Transactions, American Ceramics Society, Westerville Ohio 118, 427-44, (2000). 

28.  Michael K. Crawford, Andrew E. Feiring, Jerald Feldman, Roger H. French, Viacheslav A. Petrov, Frank L. Schadt III, Robert J. Smalley, Fredrick C. Zumsteg, “157 nm Imaging Using Thick Single Layer Resists”, Advances in Resist Technology and Processing XVIII , SPIE Vol. 4345, (2001).  

29.  Roger H. French, Joseph Gordon, David J. Jones, M. F. Lemon, Robert C. Wheland, Edward Zhang, Fredrick C. Zumsteg, Kenneth G. Sharp, Weiming Qiu, “Materials Design and Development of Fluoropolymers for Use as Pellicles in 157nm Photolithography”, Optical Microlithography XIV, SPIE Vol. 4346, (2001). 

30.  J. R. Smith, P. Graat, D. A. Bonnell, R. H. French, “Relation between Local Composition, Chemical Environment and Phase Shift Behavior in Cr-Based Oxycarbonitride Thin Films”, MRS Proceedings, January 2001. 

31.  Roger H. French, Robert C. Wheland, Joseph Gordon, Edward Zhang, “Optimizing Polymers to Increase Pellicle Lifetime and Transmission for 157-nm Lithography”, MICRO, Canon Communication LLC, Los Angeles CA, 79-93, (June, 2001). 

32. Roger H. French, Jerald Feldman, Fredrick C. Zumsteg, Michael K. Crawford, Andrew E. Feiring, Joseph Gordon, Viacheslav A. Petrov, Frank L. Schadt III, Robert C. Wheland, Edward Zhang, “Progress in Materials Development for 157nm Photolithography: Photoresists and Pellicles”, Semiconductor Fabtech,  ICG Publishing Ltd., London, Edition 14, 167-75, July 2001. 

33.  V. Liberman, M. Rothschild, J. H. C. Sedlacek, A. Grenville, R. H. French, “Behavior of Candidate Organic Pellicle Materials Under 157-nm Laser Irradiation”, Optical Microlithography XV, SPIE 4691, 56, (2002). 

34. Roger H. French, Robert C. Wheland, Weiming Qiu, M. F. Lemon, Edward Zhang, Joseph Gordon, Vlad Liberman, Andrew Grenville, Rod Kunz, Mordechai Rothschild, “157nm Pellicles: Polymer Design for Transparency and Lifetime”, Optical Microlithography XV, SPIE 4691, 57, (2002).  

35. Steven R. Lustig, Edward D. Boyes, Roger H. French, Timothy D. Gierke, Mark A. Harmer, Paula B. Hietpas, Anand Jagota, Greg P. Mitchell and Kerry D. Sams, “A Novel Process Methodology for Cutting Uniform Nanostructures”, AICHE 2002 Proceedings: Materials Processing in Nanoelectronics, (2002). 

36.      M. K. Crawford, W. B. Farnham, A. E. Feiring, J. Feldman, R. H. French, K. W. Leffew, V. A. Petrov, W. Qiu, F. L. Schadt III, H.V. Tran, R. C. Wheland, F. C. Zumsteg, “Single Layer Fluoropolymer Resists for 157 nm Lithography”, Advances in Resist Technology and Processing XVIII , SPIE Vol. 5039, (2003).  

37.      S. R. Lustig, E. D. Boyes, R. H. French, T. D. Gierke, M. A. Harmer, P. B. Hietpas, A. Jagota, G. P. Mitchell, G. B. Onoa, K. D. Sams, “Novel Process Methodology for Uniformly Cutting Nanotubes”, MRS Proceedings, Spring 2003 Meeting, (2003). 

Invited Presentations and Seminars

1.     R. H. French, "Application of Vacuum Ultraviolet Absorption Spectroscopy to Optical Materials", Crystal Physics and Opto-Electronics Seminar Series, M. I. T., May 1986.

2.     R. H. French, "Temperature Dependence of the Electronic Structure of Al2O3 ", Solid State Division Seminar, Oak Ridge National Labs, June 1986.

3.     R. H. French, "Vacuum Ultraviolet Spectroscopy of Ceramics and Optical Materials", Institute for Physical Science and Technology Seminar, University of Maryland, December 1986.

4.     R. H. French, "VUV Spectroscopy of the Electronic Structure of Ceramics", Department of Materials Science, University of Pennsylvania, March 1988.

5.     R. H. French, D. J. Jones, W. Y. Hsu, B. A. Yost, M. A. Subramanian, "Percolation Effects in the Dielectric Properties of Polymer Ceramic Composites", American Ceramic Society Annual Meeting, Cincinnati, OH, May 1988. 

6.     R. H. French, "Electronic Structure and Conductivity of Al2O3 ", International Forum on Sintering of Advanced Ceramics, American Ceramic Society, Cincinnati, OH, May 1988. 

7.     R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure of Ceramics", Univ. of S. Calif., Center for Laser Studies, October 1988.

8.     R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure of Ceramics", Univ. of Calif. Berkeley, Materials Science Dept., October 1988.

9.     R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure of Ceramics", Univ. of Calif. Santa Barbara, Materials Dept., October 1988.

10.  R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure of Ceramics", Arizona State Univ., Dept. of Chemistry, October 1988.

11.  R. H. French, "Optical Properties and Electronic Structure of Ceramics".  Two seminars, part of Univ. of Pennsylvania graduate course on "Introduction to Ceramics”, November 1988.

12.  R. H. French, "Band Structure of Alumina",  Case Western Reserve/NASA/DuPont Workshop on Alumina, Case Western Reserve, January 1989.

13.  R. H. French, "Optical Properties and Electronic Structure of Ceramics".  Two seminars, part of M. I. T. graduate course on "Poly-Phase Ceramics", March 1989.

14.  R. H. French, "Electronic Structure and Optical Properties of Ceramics and Optical Materials", University of Missouri, Kansas City, April 1990.

15.  R. H. French, "Temperature Dependent Electronic Structure and Optical Properties of Ceramics",  Naval Research Lab, Complex Systems Theory Branch, Washington D. C., June 1990. 

16.  R. H. French, "Solid State Physics, Materials Science and Ceramics", Wilmington Christian High School as part of Science Alliance Summer Fellowship Program, October 1990. 

17.  R. H. French, "High Temperature Electronic Structure of Ceramics", American Ceramic Society, Basic Science Division Fall Meeting on Atomic Bonding and Properties of Ceramics, Marco Is., Florida, October 1991.   

18.  R. H. French, "Solid State Physics, Materials Science and Ceramics", Wilmington Christian High School as part of Science Alliance Summer Fellowship Program, October 1991. 

19.  R. H. French, "High Temperature Electronic Structure of Insulating Oxides",  University of North Carolina, Chapel Hill, Physics and Astronomy Dept.,  February 1992. 

20.  R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure and Interband Transitions of Ceramics: AlN, Al2O3, and ZrO2", Max Planck Institute, Stuttgart, Germany, July 1992.

21.  R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure and Interband Transitions of Ceramics: AlN, Al2O3, and ZrO2",  Royal Institution, London, England, July 1992. 

22.  R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure and Interband Transitions of Ceramics: AlN, Al2O3, and ZrO2",  Cavendish Laboratory, University of Cambridge, Cambridge, England, July 1992. 

23.  R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure and Interband Transitions of Ceramics: AlN, Al2O3, and ZrO2",  Commissariat a L'Energie Atomique, Saclay, France, August 1992. 

24.  R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure and Interband Transitions of Ceramics: AlN, Al2O3, and ZrO2",  Univ. of Virginia Physics Dept., September 1992. 

25.  R. H. French, "Solid State Physics, Materials Science and Ceramics", Wilmington Christian High School as part of Science Alliance Summer Fellowship Program, December 1992. 

26.  R. H. French, "Optical Spectroscopy and Electronic Structure of a-Al₂O₃", International Symposium on the Science of a-Al₂O₃ held at Schloss Ringberg, Germany, April 15 to 19, 1993.   

27.  R. H. French, "Vacuum Ultraviolet Spectroscopy of the Electronic Structure and Interband Transitions of Ceramics: AlN, Al2O3, and ZrO2",  Cornell University, Materials Science Dept., October 1993. 

28.  R. H. French, "Electronic Structure and Interband Transitions of Ceramics: Critical Point Analysis of AlN and Al2O3 , Hamaker Constants and Spatially-Resolved EELS",  Materials Science Department, Massachusetts Institute of Technology, January 1994. 

29.  R. H. French, "Interband Electronic Structure and Interfaces: Bonding and Hamaker Constants", International Symposium on "Interfaces in Ionic Materials" held at Schloss Ringberg, Germany, March 6 to 11, 1994.   

30.  R. H. French, "Embedded Phase Shifter Photomask Blanks: Materials Development", International Symposium on "Interfaces in Ionic Materials" held at Schloss Ringberg, Germany, March 6 to 11, 1994.   

31.  R. H. French, "Optical Properties and Electronic Structure of Polysilanes and Other Materials",  University of Connecticut, Polymer Science Program, Institute of Materials Science, April 1994. 

32.  R. H. French, "Electronic Structure and Optical Properties of Ceramics: Interatomic Bonding of AlN and a-Al2O3 and Design of Cr-OCN Compounds for Phase Shift Lithography", Two seminars in Frontiers of Materials Science Course at University of New Mexico and Sandia Advanced Materials Lab, September 1994. 

33.  R. H. French, "Spectroscopic Determination of Interfacial Electronic Structure for Interatomic Bonding and Hamaker Constants", Symposium on Structure and Properties of Interfaces in Ceramics, Materials Research Society 1994 Annual Fall Meeting, Boston, MA, December 1994.   

34.  R. H. French, “Quantitative Analysis of Spatially Resolved Valence Electron Energy Loss Spectra for Electronic Structure and Bonding Studies of Grain Boundaries and Thin Glass Films”,  Materials Science Department, University of California-Berkeley, January 1995. 

35.  R. H. French, “Quantitative Analysis of Spatially Resolved Valence Electron Energy Loss Spectra for Electronic Structure and Bonding Studies of Grain Boundaries and Thin Glass Films”,  Physics Department, University of Missouri-Kansas City, February 1995. 

36.  R. H. French, “Interfacial Electronic Structure and Bonding Studies of Grain Boundaries and Thin Glass Films”,  Materials Science Seminar Series, Harvard University, March 1995. 

37.  R. H. French, “Quantitative Analysis of Spatially Resolved Valence Electron Energy Loss Spectra for Electronic Structure and Bonding Studies of Grain Boundaries and Thin Glass Films”, Symposium on Analytical Microscopy of Ceramics, Microscopy Society of America, Kansas City, August 1995.   

38.  R. H. French, “Electronic Structure and van der Waals Dispersion Forces for Intergranular Films in Ceramics”, Gordon Conference on Solid State Studies in Ceramics, New Hampshire,  July 23, 1995.   

39.  R. H. French, “Design and Development of Cr-O_xC_yN_z Embedded Phase Shifter Photomask Blanks for I-Line Phase Shift Lithography”,  Materials Department, University of California, Santa Barbara, February 1996. 

40.  R. H. French, “Interfacial Electronic Structure and Interband Transitions: for Grain Boundary Bonding and Hamaker Constants of Intergranular Films”,  Materials Department, University of California, Santa Barbara, February 1996. 

41. R. H. French, “Optical Property Based Electronic Structure Probes: Vacuum Ultra Violet  and Spatially Resolved-Valence Electron Energy Loss Spectroscopies”, American Ceramic Society, Annual Meeting, Indianapolis, April 1996.   

42.  R. H. French, “Design and Development of Cr-O_xC_yN_x, Embedded Phase Shifter Photomask Blanks for I-line Phase Shift Lithography, American Ceramic Society, Annual Meeting, Indianapolis, April 1996. 

43.  R. H. French, “Design and Development of Cr-O_xC_yN_z Embedded Phase Shifter Photomask Blanks for I-Line Phase Shift Lithography”  Metallurgy Division, National Institute for Standards and Technology, April 1996. 

44.  R. H. French, “Design and Development of Cr-O_xC_yN_z Embedded Phase Shifter Photomask Blanks for I-Line Phase Shift Lithography”,  Physics Department, Johns Hopkins University, May 1996. 

45.  R. H. French,  “Intergranular Film Chemistry, Hamaker Constants and Dispersion Forces in Silicon Nitride”, Third International Workshop on Interfaces: Wetting, Fracture and Chemistry of Interfaces, University of Santiago, Santiago, Galicia, Spain, September 1996.   

46.  R. H. French, “Dispersion Forces, Hamaker Constants and Intergranular Film Chemistry in Silicon Nitride”, Max Planck Institut fur Metallforschung, Stuttgart, Germany, September 1996. 

47.  R. H. French, “Optical Property Based Electronic Structure Probes: Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss Spectroscopies”, Material Science Department, Northwestern University, November 1996. 

48.  R. H. French, “Design and Development of Cr-O_xC_yN_z Embedded Phase Shifter Photomask Blanks for I-Line Phase Shift Lithography”, Material Science Department, Northwestern University, November 1996. 

49.  R. H. French, “Optical Property Based Electronic Structure Probes: Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss Spectroscopies”, Material Science Department, University of Washington, February 1997. 

50.  R. H. French, “Optical Property Based Electronic Structure Probes: Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss Spectroscopies”, Material Science Department, University of Toronto, February 1997. 

51.  R. H. French, “Optical Property Based Electronic Structure Probes: Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss Spectroscopies”, Material Science Department, University of Pennsylvania, February 1997. 

52.  R. H. French, “Optical Property Based Electronic Structure Probes: Vacuum Ultra Violet and Spatially Resolved-Valence Electron Energy Loss Spectroscopies”, Material Science Department, Stevens Institute of Technology, April 1997. 

53.  R. H. French, “VdW Dispersion Forces: An Electronic Structure and Chemistry Perspective”, International Workshop on Interfaces in Alumina, Schloss Ringberg, Germany, March 1998.