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S. Loughin, R. H. French, L. K. DeNoyer, W. -Y. Ching, Y. -N. Xu,
"Critical Point Analysis of the Interband Transition Strength of
Electrons", Journal of Physics D., July 1996. |
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R. H. French, "Laser-Plasma Sourced, Temperature Dependent VUV
Spectrophotometer Using Dispersive Analysis" , Physica Scripta, 41, 4,
404-8, (1990). |
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M. L. Bortz, R. H. French, "Quantitative, FFT-Based, Kramers Kronig
Analysis for Reflectance Data", Applied Spectroscopy, 43, 8, 1498-1501,
(1989). |
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M.
L. Bortz, R. H. French, "Optical Reflectivity Measurements Using a
Laser Plasma Light Source" Applied
Physics Letters, 55, 19, 1955-7
(Nov. 8, 1989). |
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D. J. Kraus, R. H. French, "Automatic Spectral Data Base and Archive
System for Optical Spectroscopy", Applied Spectroscopy, 44, (7),
1221-26, (1990).
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Figure Caption. Spatially resolved valence electron energy loss spectroscopy (Sr-Veels) in the scanning transmission electron microscope is a localized (~1
nm probe) electronic structure tool for interfacial electronic structure studies. Here the Sr-Veels spectra versus energy (0 to 80 eV) and distance (0 to 10
nm) across and intergranular film in silicon nitride is shown. The data is multiplexed for zero loss optimized / plasmon optimized spectral acquisition to
maximize the signal to noise ratio.
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H. Müllejans, R. H. French, "Interband Electronic Structure of a Near Sigma 11 Grain Boundary in µ Alumina Determined by Spatially Resolved
Valence Electron Energy-Loss Spectroscopy", Journal of Physics D, 29, 1751-60 (1996).
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H.
Müllejans, R. H. French, “Insights Into the Electronic Structure of
Ceramics Through Quantitative Analysis of Valence Electron Energy-loss
Spectroscopy (VEELS)”, Microscopy and
Microanalysis, 6 (4), 297-306, (2000).
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