posted: 08/24/2026
At the end of August, Penn MRSEC welcomed Xenocs for a two‑day workshop dedicated to advanced Small‑Angle X‑ray Scattering (SAXS) data analysis using the XSACT software. The program combined morning lectures with afternoon hands‑on sessions, giving participants practical experience in processing and interpreting real datasets.
The workshop featured five presentations from current DEXS users, showcasing the wide range of research supported by the facility. These talks highlighted temperature‑controlled studies, nanoparticle characterization, and GISAXS measurements, demonstrating how DEXS capabilities are being applied to real‑world scientific questions. A new attachment, the Reflection-geometry with Environment X-ray Scattering (REXS) chamber, designed by recent graduate and former DEXS user Ben Ferko, was also introduced. Now integrated into the DEXS system, the REXS is already supporting ongoing user projects.
The event drew strong interest from graduate students, postdoctoral researchers, faculty, and industry professionals. Participants gained both foundational knowledge and practical analytical tools for extracting meaningful insights from SAXS data. Through real‑world examples and structured analysis workflows, attendees learned how to interpret scattering results to advance research in polymer science, nanoparticle systems, and biomolecular assemblies.