Ultra-Small-Angle to Wide-Angle Dual Source X-ray Scattering Instrument for SEF

posted: 08/22/2017

The X-ray scattering shared experimental facility (SEF) within the LRSM is about to undergo a dramatic transformation via purchase of a Xeuss 2.0 from Xenocs.  Briefly, the new instrument provides structural information at both high and low spatial resolution across a wide range of length scales (0.09 to 600 nm) and thus facilitates study of hierarchical structures in a wide range of hard and soft materials. Further, by incorporating dual sources (Cu and Mo), two solid-state detectors, a stage for grazing incidence, and various sample environments for in situ and operando studies, we anticipate that the impact of this new instrumentation on local materials research and education will be immense. The instrument will advance research on the synthesis, fabrication, processing, and assembly of a wide range of materials systems, and will provide crucial insight about structure relevant to their chemical, electrical, magnetic, mechanical, optical, thermal, and transport properties. The facility will also be integrated into courses at Penn, the outreach activities of the LRSM, and workshops and online training materials are planned to promote its broad use by beginners and to fully develop expert-users. 

This major investment was made possible by a recent NSF – MRI grant award (PI:  Yodh, co-PIs:  Detsi, Fakhraai, Heiney and Winey), with matching funds from the LRSM and Penn Engineering.  In addition, the detector will be further improved by resources derived from an ARO-DURIP grant (PI:  Winey)

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